RE: Negative Uiso in GSAS

2010-03-03 Thread Michael Glazer
Negative U's in Rietveld can arise from several causes, so that there is not one single answer. Some of the reasons are 1. The structural model is simply incorrect. 2. High absorption means that the low-angle data are weaker than they should be, or conversely that the high-angle data appear

RE: Comparison of powder patterns recorded at different wavelengths

2010-01-15 Thread Michael Glazer
Kurt The standard method is to use a wavelength made from the weighted (2:1) average of the two components. So for CuKa the standard value is 1.5418 angstroms Mike Glazer -Original Message- From: Kurt Leinenweber [mailto:ku...@asu.edu] Sent: 15 January 2010 16:46 To: Franz Werner;

RE: UVW - how to avoid negative widths?

2009-03-20 Thread Michael Glazer
As I have said before countless time, one should not lose sight of the objective of Rietveld refinement, that it is to refine a sensible crystallographic structure. One can reduce R factors in all sorts of ways by playing with the peak shape functions (even by using lower symmetry and increasing

RE: PDF refinement pros and cons

2008-06-13 Thread Michael Glazer
Alan I think you are misunderstanding what the PDF method is used for. The idea is to fourier transform directly the whole range of scattering including peaks and background (after removing artifacts in the background due to the diffractometer, air scattering etc). In a highly ordered crystal

RE: % Crystallinity

2008-02-27 Thread Michael Glazer
Determination of crystallinity can be a fraught subject, because it is usually assumed in such measurements that the background is from amorphous material while the sharp peaks are from crystalline material. So the standard way to do this would be to have a method for extracting the background and

RE: advice on new powder diffractometer

2008-02-19 Thread Michael Glazer
As I have said in reply to Leonid, I don't know why we have such a large difference in our experimental setup. It may be that our 0.02 slits are misaligned -- I will have to check this. The question of what is meant by signal to noise ratio in connection with powder diffraction is one which I

RE: advice on new powder diffractometer

2008-02-19 Thread Michael Glazer
Leonid I don't know why we have such a large difference, but for some reason we do. I will send you privately the two diagrams. Mike -Original Message- From: Leonid Solovyov [mailto:[EMAIL PROTECTED] Sent: 19 February 2008 03:56 To: rietveld_l@ill.fr Subject: RE: advice on new powder

RE: advice on new powder diffractometer

2008-02-19 Thread Michael Glazer
Alan I absolutely agree with you regarding Rietveld refinement. The same argument is true for adjusting peak shapes to get the best fit, playing around with different peak formulae. Often such tweaking, while it makes the observed and calculated fit look nicer, has little effect on the atomic

RE: advice on new powder diffractometer

2008-02-18 Thread Michael Glazer
How do you define signal to noise in powder diffraction? I have seen this term used several times, but I have not found a definition so far with regard to powder diffraction per se. I have just done two runs on a Panalytical one with 0.04 soller slits and one with 0.02 (both with a CuKa1

Topas

2007-12-10 Thread Michael Glazer
Yes it does. One way is to add the command adps at the end of the line site E.g. site Pb1x 0.23y 0.15 z 0.28 occ Pb 1 adps Mike Glazer -Original Message- From: Peter Tzvetkov [mailto:[EMAIL PROTECTED] Sent: 10 December 2007 18:28 To: rietveld_l@ill.fr Subject: Topas Dear

RE: Kapton capillaries

2007-11-17 Thread Michael Glazer
There is an old method that I used to use for capillaries that you may useful. Take a metal wire of appropriate diameter and dip it into collodion (nitrocellulose dissolved in acetone), allow it to dry. Then stretch the wire with pliers and slip off the cellulose capillary. This is cheap, quick,