Dear Matthew,
I scanned our SRM α 656 using CoKα Dynamic Beam Optimation machine from 2 to
150 °2θ.
https://www.dropbox.com/s/rar6sjepl9g2x2d/ROW.pro?dl=0
Using the same sample model, the derived relative wt% ratio between α and β
phases are very similar to that from your CuKα data.
Cheer
4:20 PM
To: Holger Kletti
mailto:holger.kle...@uni-weimar.de>>
Cc: RIETVELD_L Distribution List mailto:rietveld_l@ill.fr>>
Subject: Re: NIST SRM656 Analysis
Hi Holger
There is a good paper by Ian Madsen, Nikki Scarlett, and Arnt Kern about the
quantification of amorphous materi
Hi Tony
I can't reproduce the certificate values. This is the entire point of my
question.
Matthew
On Fri, 29 Apr 2022, 08:31 iangie, wrote:
> Dear Mathew,
>
> Understood these values are from the SRM certificate.
> My .pro of the data suggests ~92% alpha, 3% beta, and ~5% Amorphous:
> https:/
Yep.
The sample is supposed to contain 87.4 wt% alpha-Si3N4, 3.0 wt% beta-Si3N4
and 9.6 wt% amorphous.
Matthew
On Tue, 26 Apr 2022 at 20:06, Martin Vickers wrote:
> Just a point of interest you seem to have a few impurity peaks
> possibly from Si6N8 (COD entry 96-210-2554 seems to match well).
Hi Ed
The beam is smaller than the sample over all angles. - 0.25° divergence at
250 mm radius. I also collected in constant divergence mode, so the
diffracting volume is a constant.
Matthew
On Fri, 15 Apr 2022 at 01:20, Edward Laitila wrote:
> Just curious, is the sample as prepared in the ho
gt; *From:* rietveld_l-requ...@ill.fr
> *On Behalf Of *Matthew Rowles
> *Sent:* torsdag 14. april 2022 09:03
> *To:* Jonathan WRIGHT
> *Cc:* RIETVELD_L Distribution List
> *Subject:* Re: NIST SRM656 Analysis
>
>
>
> Hi Jon
>
>
>
> The data is put on
Just curious, is the sample as prepared in the holder wider than the beam
width at 10 degrees where you start the scan? This is a common issue that
not many realize that for quantitative analysis the diffracting volume is
constant provided the sample is larger than the beam in the tube and
detector
*To:* Jonathan WRIGHT
*Cc:* RIETVELD_L Distribution List
*Subject:* Re: NIST SRM656 Analysis
Hi Jon
The data is put on an absolute scale through the external standard
approach. The calculations assume that the QPA for corundum in NIST
SRSM676a is 99.02 wt%. This scaling factor is then
Hi Jon
The data is put on an absolute scale through the external standard
approach. The calculations assume that the QPA for corundum in NIST
SRSM676a is 99.02 wt%. This scaling factor is then applied to the silicon
nitride pattern.
re surface roughness: The samples were backpacked against a glas
Maybe a silly question: are you assuming you have the data on an absolute scale
in order to do these calculations? Do things like surface roughness somehow not
matter?
Best
Jon
On 13/04/2022 11:56, Matthew Rowles wrote:
Thanks Tony
When I add the absorption edge correction to the silicon
Thanks Tony
When I add the absorption edge correction to the silicon nitride model (and
add beta-silicon nitride), it becomes -2.8 wt% amorphous; up a little due
to the added correction and down a little due to the extra phase.
If I change your al-SN thermals from 1 to those given in ICSD 77811,
Thanks Mathew, for the summary of the replies you received off-list.
Just a remark to those who reply off-list. The purpose of the Rietveld list
is to facilitate discussion. That can't happen if the conversation is
off-list.
Alan
Dr Alan Hewat, NeutronOptics
Greno
Hi all
Thanks to those that have replied off-list.
I've managed to jiggle things around and get various answers. If you want
an answer between -14 and +6 wt% amorphous, I can make it happen. I can
either use charged atoms or not, or use thermal parameters or not.
Combining those between the corun
Hi all
I've collected some more data, and am still getting spurious results, and
by spurious, I mean -5 wt% amorphous in SRM-alpha-656 when quantified by
the external method against SRM 676a.
We had some SRM-656alpha (couldn't find any of the beta) stored in a drying
oven, and some SRM676a stored
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