On Thu, Jun 4, 2020 at 10:19 AM Gerhard Sittig <gerhard.sit...@gmx.net> wrote: > > > If you want to help, review and extend the test sequence for the > > > endianess conversion. Getting more coverage is highly desirable.
Current tests look very comprehensive. Only one thing came to mind, maybe the "test_endian_write_inc" test should also test the write_u16le_inc/write_u32le_inc functions? > And I like how you keep improving that device's driver from the > feedback that you get. Will be a nice one when integrated into > mainline, which no doubt is going to happen AFAICS. :) I cleaned up the driver bit more (no more sending struct to device) and added support for the device "address" (that likely is almost always unused, but someone might have multiple loads and have use for it...). I can't think of anything to add to it at this point. I opened pull request via github: https://github.com/sigrokproject/libsigrok/pull/69 -- Timo <t...@iki.fi> _______________________________________________ sigrok-devel mailing list sigrok-devel@lists.sourceforge.net https://lists.sourceforge.net/lists/listinfo/sigrok-devel
