Can we add this model to the database?
Samsung 830 64gb SSD
smartctl 5.42 2011-10-20 r3458 [x86_64-linux-2.6.38-gentoo-r6] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG SSD 830 Series
Serial Number: S0VTNYABC00918
LU WWN Device Id: 5 002538 043584d30
Firmware Version: CXM01B1Q
User Capacity: 64,023,257,088 bytes [64.0 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4c
Local Time is: Thu Jan 12 22:09:06 2012 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 300) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 5) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always
- 0
9 Power_On_Hours 0x0032 099 099 000 Old_age Always
- 1
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always
- 3
177 Wear_Leveling_Count 0x0013 100 100 000 Pre-fail Always
- 0
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always
- 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always
- 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always
- 0
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always
- 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always
- 0
190 Airflow_Temperature_Cel 0x0032 071 071 000 Old_age Always
- 29
195 Hardware_ECC_Recovered 0x001a 200 200 000 Old_age Always
- 0
199 UDMA_CRC_Error_Count 0x003e 253 253 000 Old_age Always
- 0
235 Unknown_Attribute 0x0012 099 099 000 Old_age Always
- 3
241 Total_LBAs_Written 0x0032 100 100 000 Old_age Always
- 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 1 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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