Can you please add the Transcend TS128GPSD320 SSD to the database.

smartctl -t short /dev/sda

smartctl 5.42 2011-10-20 r3458 [i686-w64-mingw32-xp-sp3] (sf-win32-5.42-1)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION ===
Warning: device does not support Self-Test functions.

Sending command: "Execute SMART Short self-test routine immediately in 
off-line mode".
Drive command "Execute SMART Short self-test routine immediately in 
off-line mode" successful.
Testing has begun.


smartctl -a /dev/sda

smartctl 5.42 2011-10-20 r3458 [i686-w64-mingw32-xp-sp3] (sf-win32-5.42-1)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model: TS128GPSD320
Serial Number: A06688411083AB000018
Firmware Version: 20120309
User Capacity: 128 036 372 480 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon May 21 17:53:34 2012 SE
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x00) Offline data collection not supp
orted.
SMART capabilities: (0x0000) Automatic saving of SMART data
is not implemented.
Error logging capability: (0x00) Error logging supported.
No General Purpose Logging support.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_ FAILED 
RAW_VALUE
199 UDMA_CRC_Error_Count 0x0000 100 100 000 Old_age Offline - 0
5 Reallocated_Sector_Ct 0x0000 100 100 000 Old_age Offline - 0
12 Power_Cycle_Count 0x0000 100 100 000 Old_age Offline - 74
161 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 308
162 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 182
163 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 9
165 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 71
166 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 3
167 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 44

SMART Error Log Version: 1
No Errors Logged

SMART Self-test Log not supported
Device does not support Selective Self Tests/Logging


Some additional info:

Running smartctl -a under Ubuntu 11.04 makes the drive read only.

Informations from the Transcend datasheet.

SMART Feature Set
Transcend IDE SSD supports the SMART command set and define some 
vendor-specific data to report spare/bad block
numbers in each memory management unit. Individual SMART commands are 
identified by the value placed in the Feature
register. Table shows these Feature register values.

D0h Read Data D5h Reserved
D1h Read Attribute Threshold D6h Reserved
D2h Enable/Disable Autosave D8h Enable SMART Operations
D3h Save Attribute Values D9h Disable SMART Operations
D4h Execute OFF-LINE Immediate DAh Return Status

SMART DISABLE OPERATIONS
B0h with a Feature register value of D9h.Disables the SMART function. 
Upon receiving the command, the drive
disables all SMART operations. This setting is maintained when the power 
is turned off and then back on.
Once this command has been received, all SMART commands other than SMART 
ENABLE OPERATIONS are aborted with the Aborted Command error.
This command disables all SMART capabilities including any and all timer 
and event count functions related
exclusively to this feature. After command acceptance, this controller 
will disable all SMART operations. SMART data in no
longer be monitored or saved. The state of SMART is preserved across 
power cycles.

SMART ENABLE/DISABLE ATTRIBUTE AUTOSAVE
B0h with a Feature register value of D2h.Enables or disables the 
attribute value autosave function. This command
specifies whether the current attribute values are automatically saved 
to the drive when it changes the mode. This setting is
maintained when the power is turned on and off.

SMART ENABL OPERATIONS
B0h with a Feature register value of D8h.Enables the SMART function. 
This setting is maintained when the power is
turned off and then back on. Once the SMART function is enabled, 
subsequent SMART ENABLE OPERATIONS
commands do not affect any parameters

SMART EXECUTE OFF-LINE IMMEDIATE
B0h with the content of the Features register equal to D4h. This command 
causes the device to immediately initiate the
optional set of activities that collect SMART data in an off-line mode 
and then save this data to the device's non-volatile
memory, or execute a self-diagnostic test routine in either captive or 
off-line mode.

SMART RETURN STATUS
B0h with a Feature register value of DAh. This command causes the device 
to communicate the reliability status of the
device to the host. If a threshold exceeded condition is not detected by 
the device, the device shall set the LBA Mid register
to 4Fh and the LBA High register to C2h. If a threshold exceeded 
condition is detected by the device, the device shall set
the LBA Mid register to F4h and the LBA High register to 2Ch.

SMART Read Data
B0h with the content of the Features register equal to D0h. This command 
returns the Device SMART data structure to
the host.

SMART DATA Structure
The following 512 bytes make up the device SMART data structure. Users 
can obtain the data by SMART command.

BYTE F / V Description
0-1 X Revision code
2-361 X Vendor specific
362 V Off-line data collection status
363 X Self-test execution status byte
364-365 V Total time in seconds to complete off-line data collection 
activity
366 X Vendor specific
367 F Off-line data collection capability
368-369 F SMART capability
370 F Error logging capability, 7-1 Reserved, 0 1=Device error logging 
supported
371 X Vendor specific
372 F Short self-test routine recommended polling time (in minutes)
373 F Extended self-test routine recommended polling time (in minutes)
374 F Conveyance self-test routine recommended polling time (in minutes)
375-385 R Reserved
386-395 F Firmware Version/Date Code
396-399 R Reserved
400-406 F ‘SMI2236’
407-511 R Reserved

F=the content of the byte is fixed and does not change.
V=the content of the byte is variable and may change depending on the 
state of the device or the commands executed
by the device.
X=the content of the byte is vendor specific and may be fixed or variable.
R=the content of the byte is reserved and shall be zero.
* 4 Byte value : [MSB] [2] [1] [LSB]


SMART Attributes
The following table defines the vendor specific data in byte 2 to 361 of 
the 512-byte SMART data.

Attribute ID(hex) Raw Attribute Value Attribute Name
05 MSB 00 00 00 00 00 New bad block
0C LSB MSB 00 00 00 00 Power Cycle Count
C7 LSB MSB 00 00 Ultra DMA CRC error
A1 LSB MSB 00 00 00 00 Number of Valid Spare Block
A2 LSB MSB 00 00 00 00 Number of child block used
A3 LSB MSB 00 00 00 00 Number of initial invalid Block
A5 LSB MSB 00 00 Maximum Erase Count
A6 LSB MSB 00 00 Minimum Erase Count
A7 LSB MSB 00 00 Average Erase Count


Let me know if you need any additional informations.

Thank You

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