Didn't expect that USB flash to have SMART, but it did ;-)
Good read speed of 154MiB/s
Kalin.
smartctl 6.3 2014-07-26 r3976 [x86_64-linux-3.18.3-r6] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SanDisk pSSD
Serial Number: 044fcd0cd
LU WWN Device Id: 5 001b44 0fc44cdd0
Firmware Version: 3
User Capacity: 62,742,792,192 bytes [62.7 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 1.8 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS T13/1699-D revision 2d
SATA Version is: SATA 2.6, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Tue Apr 28 19:59:32 2015 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Disabled
Write cache is: Disabled
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x51) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 11) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct -O---- 100 100 000 - 0
9 Power_On_Hours -O---- 100 100 000 - 0
12 Power_Cycle_Count -O---- 100 100 000 - 8
171 Unknown_Attribute -O---- 100 100 000 - 0
172 Unknown_Attribute -O---- 100 100 000 - 0
173 Unknown_Attribute -O---- 100 100 000 - 0
174 Unknown_Attribute -O---- 100 100 000 - 2
187 Reported_Uncorrect -O---- 100 100 000 - 0
230 Unknown_SSD_Attribute -O---- 100 100 000 - 0
232 Available_Reservd_Space PO---- 100 100 005 - 0
234 Unknown_Attribute -O---- 100 100 000 - 0
241 Total_LBAs_Written -O---- 100 100 000 - 54078
242 Total_LBAs_Read -O---- 100 100 000 - 57950
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x03 GPL,SL R/O 16 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 GPL,SL R/O 1 SMART self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 1 Device vendor specific log
0xa2 GPL,SL VS 2 Device vendor specific log
0xa3 GPL,SL VS 1 Device vendor specific log
0xa7 GPL,SL VS 255 Device vendor specific log
Warning! SMART Extended Comprehensive Error Log Structure (16/16) error:
invalid SMART checksum.
SMART Extended Comprehensive Error Log Version: 1 (16 sectors)
No Errors Logged
SMART Extended Self-test Log (GP Log 0x07) not supported
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Description
5 ===== = = == Temperature Statistics (rev 1) ==
5 0x008 1 52 Current Temperature
5 0x010 1 - Average Short Term Temperature
5 0x018 1 - Average Long Term Temperature
5 0x020 1 51 Highest Temperature
5 0x028 1 49 Lowest Temperature
5 0x030 1 - Highest Average Short Term Temperature
5 0x038 1 - Lowest Average Short Term Temperature
5 0x040 1 - Highest Average Long Term Temperature
5 0x048 1 - Lowest Average Long Term Temperature
5 0x050 4 0 Time in Over-Temperature
5 0x058 1 95 Specified Maximum Operating Temperature
5 0x060 4 0 Time in Under-Temperature
5 0x068 1 0 Specified Minimum Operating Temperature
7 ===== = = == Solid State Device Statistics (rev 1) ==
7 0x008 1 0~ Percentage Used Endurance Indicator
|_ ~ normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 0 Device-to-host register FISes sent due to a COMRESET
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0001 2 0 Command failed due to ICRC error
------------------------------------------------------------------------------
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