Chuck Harris wrote: > Ah yes! You gotta love it when the test instrument fixes > the problem ;-) > > I recall hearing of a few instruments that had scope probes > built in to fix strange parasitic problems... > > -Chuck Harris
When I designed and debugged VMEbus cards, I would joke about doing that sometimes when I found that the scope fixed the problem. The joke got more involved, however, when the board only worked properly with 100 channels of logic analyzer probes connected. Shipping a board with that much stuff stuck to it might make the customer nervous. So my boss always made me find the source of the trouble. We did ship some boards with rows of 150pF SMT capacitors on register select inputs of an IDT bit-slice ALU due to a die shrink that made the internal registers get corrupted with fast incoming edges. Talk about analog solutions to digital problems! --David Forbes _______________________________________________ time-nuts mailing list -- [email protected] To unsubscribe, go to https://www.febo.com/cgi-bin/mailman/listinfo/time-nuts and follow the instructions there.
