Nuts,
I have been unable to explain to some of the upside down experts out there, in 
a way that they can understand, why the PLL Tester method works good enough for 
many.
Maybe now that they can see that the simple PLL tester gives nearly the exact 
same answers as the TSC 5120A over the whole range of taus, 
They will be able to set aside their prejudices long enough to see why it works 
as good as it does when using over sampling,
and why I say "It can work as good or better than Anything else out there".  
(with the performance limited by it's reference oscillator)

When everything is set up correctly,
IF you feed an ADEV program like PLOTTER an over sampled raw ADC frequency data 
set, 
The program will calculate the correct ADEV values from about 1/10 the raw data 
rate out to about 1/3 of the length of the data run.

setup correctly means:
PLL_Bandwidth > ADC_sample_rate > ADC_LP_Filter > Tau0.  
Using a factor of 3 to 5 for each ">" works OK, (more is generally better).

an extreme example: using a factor of 10 for every  ">"
PLL_Bandwidth = 10 KHz
ADC_sample_Rate = 1 KHz
ADC_LPF = 100 Hz
Valid Tau data = 10 Hz and below (with 100 Hz BW noise)

If one wants to reduce the long 1KHz rate frequency data log that the tester 
produces in this example to say a more normal 0.1 sec tau0 data set, then down 
converting the longer freq data set using a simple averaging program that does 
(sum of n_samples / n)  does not change any of the remaining ADEV answers and 
reduces the length of the data set by n.

PS) If one wants to reference some obscure write up that they think says why 
this should not work, if they will also include an example of a data set that 
it does not work on, I'll try to show what they did wrong.

ws

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