Thank you Doug! Does Bellcore TR-332 include a method of estimating the FIT/MTBF of inductive devices (transformers, inductors, etc.)?
Thank You, Mel ---------- From: Doug McKean[SMTP:[email protected]] Sent: Thursday, May 01, 1997 9:33 AM To: [email protected] Subject: Re: Reliability Mel Pedersen wrote: > > Dear TREG'ers: > > I have been doing some component reliability (failures per million power on > hours) estimates using the method outlined in MIL-HDBK-217E. My questions > are: > > a) how accepted (or, for that matter, accurate) is this method? > > b) Are there any other methods that are more accepted? > > c) Is there any reference in any Bellcore documents about this or any other > method for estimating reliability of a component? Or is testing the only > accepted method? > > Thank You! > > Mel Pedersen Midcom, Inc. > Homologations Engineer Phone: (605) 882-8535 > [email protected] Fax: (605) 886-6752 Hi Mel, Yes, you might want to try Bellcore TR-332, Issue 5, December 1995. Try - Bellcore Customer Service 60 New England Avenue DSC 1B-252 Piscataway, NJ 08854-4196 Tel: 1-800-521-2673 Or their website http://www.bellcore.com/ As to FITs. A FIT = 1 is 1 failure in 1 billion hours. Obviously a higher FIT number means a less reliable part. MTBF and FITs are related by MTBF = [1/FIT]*10^9 Bellcore 322 gives a standard set of FITs for all sorts of components. The semiconductor stuff you'll have to try to dig out of the mfrs by way of gate count or the FIT itself. If you're using accelerated temp testing to confirm this, don't pick a particular activation energy for a semiconductor to use in the Arrenhius relation. You'll have to come up with that emprically. Regards, Doug ************************************************************ ------------------------------------------------------- The comments and opinions stated herein are mine alone, and do not reflect those of my employer. ------------------------------------------------------- ************************************************************
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