Commit 35c204d8a9d0 (nand: reinstate lazy bad block scanning)
broke NAND_BBT_USE_FLASH feature.
Its git-log claimed that it reinstated the change as by commit
fb49454b1b6c ("nand: reinstate lazy bad block scanning"), but it moved
"chip->options |= NAND_BBT_SCANNED" below "chip->scan_bbt(mtd);".
It causes recursion if scan_bbt does not find a flash based BBT
and tries to write one, and the attempt to erase the BBT area
causes a bad block check.
Reinstate commit ff49ea8977b5 (NAND: Mark the BBT as scanned prior to
calling scan_bbt.).
Signed-off-by: Masahiro Yamada <[email protected]>
Cc: Rostislav Lisovy <[email protected]>
Cc: Heiko Schocher <[email protected]>
Cc: Scott Wood <[email protected]>
---
drivers/mtd/nand/nand_base.c | 2 +-
1 file changed, 1 insertion(+), 1 deletion(-)
diff --git a/drivers/mtd/nand/nand_base.c b/drivers/mtd/nand/nand_base.c
index d04c7ea..eaa4be1 100644
--- a/drivers/mtd/nand/nand_base.c
+++ b/drivers/mtd/nand/nand_base.c
@@ -635,8 +635,8 @@ static int nand_block_checkbad(struct mtd_info *mtd, loff_t
ofs, int getchip,
struct nand_chip *chip = mtd->priv;
if (!(chip->options & NAND_BBT_SCANNED)) {
- chip->scan_bbt(mtd);
chip->options |= NAND_BBT_SCANNED;
+ chip->scan_bbt(mtd);
}
if (!chip->bbt)
--
1.9.1
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