Thanks for the code review! Responses inline.
On 2013/11/07 08:43:23, vincent.belliard.fr wrote:
https://codereview.chromium.org/62293002/diff/1/src/arm/lithium-codegen-arm.cc
File src/arm/lithium-codegen-arm.cc (right):
https://codereview.chromium.org/62293002/diff/1/src/arm/lithium-codegen-arm.cc#newcode773
src/arm/lithium-codegen-arm.cc:773: Register scratch = scratch0();
May be you can leave the case FLAG_deopt_every_n_times == 1. It really
generates
less code for this special case.
I was considering this, but if you want to deoptimize every time, then a few
extra instructions should not matter much. Moreover, I am told this is only
used
in fuzzing tests, so performance is not really important here. Or is there
a use
case I am not aware of?
https://codereview.chromium.org/62293002/diff/1/src/arm/lithium-codegen-arm.cc#newcode778
src/arm/lithium-codegen-arm.cc:778: __ mov(scratch, Operand::Zero());
You can also make this mov conditional (you must negate the condition).
I am wondering if it would make any difference in performance. If yes, which
way? (Not that it matters, the code is for correctness testing).
https://codereview.chromium.org/62293002/diff/1/src/arm/lithium-codegen-arm.cc#newcode799
src/arm/lithium-codegen-arm.cc:799: // to use 'msr' and 'mrs' instructions
here,
but they are not supported by
mrs and msr are available (assembler-arm.h line 1029).
Yes, they are available in the assembler, but our ARM simulator
(simulator-arm.cc) does not know them, Simulator::DecodeType01() fails at
simulator-arm.cc:2247.
https://codereview.chromium.org/62293002/
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