Broadcom in Irvine has an opening for a Senior Engineering Technician in the
EMC lab:
http://jobs.broadcom.com/job/Irvine-Senior-Engineering-Technician-EMC-EMI-Test-CA-92602/37641900/
Please do NOT reply to this email, use the link above or send me a mail to
From: Neven Pischl [mailto:neve...@comcast.net]
Sent: Tuesday, November 19, 2013 7:07 PM
To: EMC-PSTC@LISTSERV.IEEE.ORG
Subject: [PSES] Equipment rack for GR1089 testing - does it have to be metal?
Hello All,
Is there a formal requirement, by either Telcordia/NEBS or by the major
Hello All,
Is there a formal requirement, by either Telcordia/NEBS or by the major telecom
carriers that the equipment rack (i.e. not the cable rack) be metal, when
testing radiated immunity per the GR1089? I understand it is the usual practice
- I have only seen such tests with a metal
document
http://www.verizonnebs.com/TPRs/VZ-TPR-9305.pdf
Regards,
Mike
From: Neven Pischl [mailto:neve...@comcast.net]
Sent: Tuesday, November 19, 2013 7:07 PM
To: EMC-PSTC@LISTSERV.IEEE.ORG
Subject: [PSES] Equipment rack for GR1089 testing - does it have to be metal
Gbit ethernet is requir ed to work over CAT5e so for formal EMC compliance you
generally have to test with CAT5e. CAT6 are better cables, if you care for per
formance and if you have a special use, but not for compliance testing Ethernet
products (unless for some reaosn you limit a produ ct
A common-mode voltage probe is an invaluable tool I have used for years to fix
emission coming out of telecom-type ports, especially ethernet. I published an
article in the Trans. of the IEEE EMC Symp. in Seattle, 1999 . I have mofdified
it since (the old one was for 10/100 ethernet and
I would like to thank sincerely to all who responded, I appreciate it. I am not
going to react to any discussions on whether it is cheating or not :), it was
not anywhere in my mind when I posted the question and I hope this topic does
not degrade :).
But, I'd like to summarize a
Hello,
I wonder if anyone can help with a question I have on spread spectrum clock
(SSC).
I am trying to validate the effectiveness of a SSC chip to reduce emission. I
measure with the peak detector. With the SSC enabled (up to 2.5% down-spread) I
expect the level measured with a
I thank all off you who answered my question.
Neven
-Original Message-
From: Neven Pischl [mailto:npis...@cisco.com]
Sent: Tuesday, June 05, 2001 12:16 PM
To: emc-p...@majordomo.ieee.org; si-l...@silab.eng.sun.com
Subject: Shielding Effectivness Question
I would appreciate
,
Neven Pischl
I bought my book from IEEE, about five years ago.
Neven
Original Message -
From: Aschenberg, Mat matt.aschenb...@echostar.com
To: 'Neven Pischl' npis...@cisco.com; emc-p...@ieee.org
Sent: Wednesday, May 09, 2001 6:31 AM
Subject: RE: Good book for SMPS EMC ???
Where is a good place
ELECTROMAGNETIC COMPATIBILITY IN POWER ELECTRONICS
By Laszlo Tihany
IEEE Press
ISBN 0-7506-2379-9
Regards,
Neven
At 10:51 PM 5/8/01 +, Paul Slavens wrote:
Greetings All,
Could anyone recommend a good book on EMC design for Switch Mode Power
Supplies ?
Thanks in Advance
Paul
at SGI in
Mountain View, 1600 Amphitheatre Pkwy., building 40, in the Presentation Center
above the lobby. The social gathering will start at 5:30 PM, and food and
drinks will be available. The technical presentation will start at 7:00 PM.
You can visit us at:
www.scvemc.org
Regards,
Neven Pischl
. The social gathering will start at 5:30 PM, and food and
drinks will be available. The technical presentation will start at 7:00 PM.
The Chapter's newsletter is attached.
You can download a copy of Spectral Lines with meeting details from:
www.scvemc.org
Regards,
Neven Pischl
Allen,
the main problem you will have is not whether to use signal generator or a
comb generator, but the difference in the radiation characteristic of your
source for correlation and the DUTs that you will later put in the chamber.
You will measure a lots of near-field in you 3m or smaller
how to use charge elements to better understand the fields of full-size
currents, and the physical origins of those fields.
Regards,
Neven Pischl
://www.scvemc.org/
Neven Pischl
---
This message is from the IEEE EMC Society Product Safety
Technical Committee emc-pstc discussion list.
To cancel your subscription, send mail to:
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For help
Invitation to:
SCV EMC Society Meeting
BLUETOOTH - A Viking King
Tuesday, October 10, 2000
The October Santa Clara Valley EMC Society meeting will be held at SGI in
Mountain View, 1600 Amphitheatre Pkwy., building 40, in the Presentation Center
above the lobby. Dinner will start at 5:30, and
You may try NIST at Boulder, CO.
Neven Pischl
- Original Message -
From: wo...@sensormatic.com
To: emc-p...@majordomo.ieee.org
Sent: Thursday, September 07, 2000 10:15 AM
Subject: Near field measurements
We need to make human exposure measurements for our FCC Part 15 submission
.
If you are interested, please contact me at
npis...@cisco.com
(408) 527 7874
Or you can contact
Tom Lindeland (hiring manager)
tlind...@cisco.com
(408) 526 4976
Neven Pischl
To unsubscribe from si-list or si-list-digest: send e-mail to
majord...@silab.eng.sun.com. In the BODY of message
cause
ionization, but only at very high intensities, and not as its prime effect.
UV, RF, MW, ELF.. is hence non-ionizing radiation
Neven Pischl
- Original Message -
From: Tony Firth tony.fi...@quester.com
To: emc-p...@majordomo.ieee.org
Sent: Thursday, January 13, 2000 4:12 PM
Subject: re
).
Neven Pischl
- Original Message -
From: Ken Javor ken.ja...@emccompliance.com
To: Grasso, Charles (Chaz) gra...@louisville.stortek.com; 'Pettit, Ghery'
ghery.pet...@intel.com; mkel...@es.com; emc-p...@majordomo.ieee.org
Sent: Thursday, December 09, 1999 6:38 PM
Subject: Re: Cell Phone
Antonio,
I've seen problems the other way around, i.e. the probes that have been
calibrated in far-field conditions, with the probe, the leads, and the
readout unit exposed to far field measuring erroneously in near-field.
Measurements obtained by a probe calibrated in far-field conditions or in
Some time ago, in a far-away land, I saw a product that was on the lab
bench for some initial functionality testing (1-st rev. of the device). A
radio was close by, plugged to the same power circuit. The test engineer
could not listen to the radio due to the interference with the noise coming
from
Some time ago, in a far-away land, I saw a product that was on the lab
bench for some initial functionality testing (1-st rev. of the device). A
radio was close by, plugged to the same power circuit. The test engineer
could not listen to the radio due to the interference with the noise coming
from
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