Julf wrote: > I'll give you a hint: Most standard methods involve one or more test > signals that are then removed from the output signal - what remains is > noise/distortion. Yes, now we are getting down to it - a notch filter on the output - good boy :) Now, a simple test signal, like a sine wave will not cause the dynamic situation necessary to invoke the fluctuating noise floor in the device - what do you suggest?
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