Hi Alex

On 3 June 2012 07:00, aaleshin <[email protected]> wrote:
> I was also taught that under "normal conditions" this would occur when the 
> data are collected up to the shell, in which Rmerge = 0.5.

Do you have a reference for that?  I have not seen a demonstration of
such an exact relationship between Rmerge and resolution, even for
'normal' data, and I don't think everyone uses 0.5 as the cut-off
anyway (e.g. some people use 0.4, some 0.8 etc - though I agree with
Phil that we shouldn't get too hung up about the exact number!).
Certainly having used the other suggested criteria for resolution
cut-off (I/sigma(I) & CC(1/2)), the corresponding Rmerge (and Rpim
etc) seems to vary a lot (or maybe my data weren't 'normal').

> One can collect more data (up to Rmerge=1.0 or even 100) but the resolution 
> of the electron density map will not change significantly.

I think we are all at least agreed that beyond some resolution
cut-off, adding further higher resolution 'data' will not result in
any further improvement in the map (because the weights will become
negligible).  So it would appear prudent at least to err on the high
resolution side!

> I solved several structures of my own, and this simple rule worked every time.

In what sense do you mean it 'worked'?  Do you mean you tried
different cut-offs in Rmerge (e.g. 0.25, 0.50, 0.75, 1.00 ...) and
then used some metric to judge when there was no further significant
change in the map and you noted that the optimal value of your chosen
metric always occurs around Rmerge 0.5?; and if so how did you judge a
'significant change'?  Personally I go along with Dale's suggestion to
use the optical resolution of the map to judge when no further
improvement occurs.  This would need to be done with the completely
refined structure because presumably optical resolution will be
reduced by phase errors.  Note that it wouldn't be necessary to
actually quote the optical resolution in place of the X-ray resolution
(that would confuse everyone!), you just need to know the value of the
X-ray resolution cut-off where the optical resolution no longer
changes (it should be clear from a plot of X-ray vs. optical
resolution).

> I is measured as a number of detector counts in the reflection minus 
> background counts.
> sigI is measured as sq. root of I plus standard deviation (SD) for the 
> background plus various deviations from ideal experiment (like noise from 
> satellite crystals).

The most important contribution to the sigma(I)'s, except maybe for
the weak reflections, actually comes from differences between the
intensities of equivalent reflections, due to variations in absorption
and illuminated volume, and other errors in image scale factors
(though these are all highly correlated).  These are of course exactly
the same differences that contribute to Rmerge.  E.g. in Scala the
SDFAC & SDADD parameters are automatically adjusted to fit the
observed QQ plot to the expected one, in order to account for such
differences.

> Obviously, sigI cannot be measured accurately. Moreover, the 'resolution' is 
> related to errors in the structural factors, which are  average from several 
> measurements.
> Errors in their scaling would affect the 'resolution', and <I/sigI> does not 
> detect them, but Rmerge does!

Sorry you've lost me here, I don't see why <I/sigI> should not detect
scaling errors: as indicated above if there are errors in the scale
factors this will inflate the sigma(I) values via increased SDFAC
and/or SDADD, which will increase the sigma(I) values which will in
turn reduce the <I/sigma(I)> values exactly as expected.  I see no
difference in the behaviour of Rmerge and <I/sigma(I)> (or indeed in
CC(1/2)) in this respect, since they all depend on the differences
between equivalents.

> Rmerge, it means that the symmetry related reflections did not merge well. 
> Under those conditions, Rmerge becomes a much better criterion for estimation 
> of the 'resolution'  than <sigi/I>.

As indicated above, if the symmetry equivalents don't merge well it
will increase the sigma(I)'s and reduce <I/sigma(I)>, so in this
respect I don't see why Rmerge should be any better than <I/sigma(I)>.
 My biggest objection to Rmerge (and this applies also to CC(1/2)) is
that it involves throwing away valuable information, namely the
measured sigma(I) values from counting stats.  This is not usually a
good idea (in statistical parlance it reduces the 'power' of the test)
- and it's not as though one can argue the sigma's are so small that
they can be neglected (at least not for the weak reflections).  Even
though as you say the estimates of sigma(I) may not be very accurate,
it seems to me that any estimate is better than no estimate.  In any
case the estimates of sigma(I) are probably quite accurate for the
weak reflections, it's just for the strong ones that the assumptions
tend to break down.  However if we're estimating resolution from
<I/sigma(I)> it's only the weak reflections in the outer shell that
are relevant, so I don't think accuracy of sigma(I) is an issue.

> If someone decides to use <I/sigI> instead of Rmerge, fine, let it be 2.0.

As I indicated previously I think 2 is too high, it should be much
closer to 1 (and again it would appear prudent to err on the side of
the lower value), because in the outer shell the majority of
I/sigma(I) values will be < 1 (just from the normal distribution of
errors).  This means that in order to get an average value of
I/sigma(I) = 2 you need a lot of very significant intensities >> 3.
The fallacy here lies in comparing the average I/sigma(I) with the
standard '3 sigma' criterion which is actually appropriate only for a
single intensity.  Of course data anisotropy may well "throw a spanner
in the works".

> Alternatively, the resolution could be estimated from the electron density 
> maps.

I agree, using the optical resolution in the manner indicated above,
but still quoting the corresponding X-ray resolution for backwards
compatibility!

> I hope everyone agrees that the resolution should not be dead..

I completely agree: I say "Long live the resolution!" (sorry I
couldn't resist it).

-- Ian

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