Tony Fredriksson wrote: >Often times, ESD related failures can't be traced to the event because >they can stress semiconductor junctions without causing an immediate >failure. Then a short time later--days, weeks, even months-the stressed >component fails prematurely for no apparent reason. So even if a >specific case can't be named, it doesn't mean that I/O pin discharges >in real life don't cause failures.
I can add to this. I have encountered an example whereby testing of an RS 232 connector caused a latent failure in the driver circuit. This failure was interesting in that the circuit still worked properly (albeit with reduced output voltage) but the driver was now oscillating at a couple of hundred MHz causing the apparatus to now fail radiated emissions. James Cunningham Radio Frequency Investigation Ltd Ewhurst Park, Ramsdell Basingstoke Hampshire RG26 5RQ England Tel: (+44) 01256 851193, [email protected]
