Hello all, first off I would like to thank all who responded to my inquiry about the EMC program offered by UMR, I am looking into enrolling further now.
I am now looking for any pointers from those more experienced than I. I have a product that is giving me some grief when indirect ESD events applied to the HCP are applied at 4kV and above. I would like to be able to view the disturbances that are present on the PCB during the event so I can try to trace down where they are coming from and judge what attempts at fixing the problem actually provide any difference. Can any of you give me some pointers or rules of thumb on how to keep the interference from the event form coupling onto a set of scope leads? I can see lots of noise but cannot definitely say that it is present on the PCB or if it is just coupling into the leads. There is noise present visible when the scope probes are left unconnected but the trace is quite different from that seen with them connected to the PCB. (but of course there is no solid reference with the probes unconnected) I need to isolate the scope leads from the test so I can actually see what is getting on to the PCB, is this actually possible??? Thanks for any comments or help. Best Regards and best wishes for the holiday season to everyone!! :-) Jeff Bailey EMC Technologist SST - A Division of Woodhead Canada Ltd. Phone: (519) 725 5136 ext. 363 Fax: (519) 725 1515 Email: [email protected] Web: www.sstech.on.ca All comments contained in the message are my own and do not necessarily express the views of SST/Woodhead Canada Limited. --------- This message is coming from the emc-pstc discussion list. To cancel your subscription, send mail to [email protected] with the single line: "unsubscribe emc-pstc" (without the quotes). For help, send mail to [email protected], [email protected], [email protected], or [email protected] (the list administrators).
