I have been asked on several occasions to test some particular IC on the
card, whenever there have been instances of IC failures during product
manufacturing/testing.  Most ICs are built to withstand an ESD event of 2
kV, and I have found this to be true in my tests.  If IC happens to be OK
then I try to improve the card design to reduce/eliminate the product
failures.

Regards, Ravinder
PCB Development and Design Department
IBM Corporation
Email: [email protected]
***************************************************************************
Always do right.  This will gratify some people and astonish the rest.
..... Mark Twain


                                                                                
                                   
                    [email protected]                                            
                                   
                    (Patrick Lawler)              To:     EMC-PSTC 
<[email protected]>                             
                    Sent by:                      cc:                           
                                   
                    owner-emc-pstc@majordom       Subject:     Re: Component  
ESD Immunity Testing                 
                    o.ieee.org                                                  
                                   
                                                                                
                                   
                                                                                
                                   
                    10/01/2001 08:27 AM                                         
                                   
                    Please respond to                                           
                                   
                    plawler                                                     
                                   
                                                                                
                                   
                                                                                
                                   




We have an engineer who did ESD testing once on the pins of ICs buried in a
power supply assembly.  The unit passed, and he thought it was a great way
to
show product robustness.
However, when I asked him if he would redesign power supplies that failed
his
special test, he replied he wouldn't.

Would _you_ redesign your system if it failed?

----
Patrick Lawler
[email protected]

On Mon, 1 Oct 2001 08:02:10 -0600 , "Aschenberg, Mat"
<[email protected]> wrote:
>Since all of you have your ESD hats on.....
>
>Are there standards for testing of components on a pwb? There is some
>concern here that we should be testing individual components on the pwb.
>
>Thanks for your help.
>Mat Aschenberg

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