<6bd67ffb937fd411a04f00d0b74fe878026ee...@xrose06.rose.hp.com>, HALL,KEN (HP-Roseville,ex1) <ken_h...@hp.com> inimitably wrote: >We believe that the probability of identifying an ESD susceptible product is >increased dramatically when subjecting the product to continuous discharges.
What you mean is that the result depends on the repetition rate, which is not specified in the standard, so that the test results are not repeatable? -- Regards, John Woodgate, OOO - Own Opinions Only. http://www.jmwa.demon.co.uk This message and its contents are not confidential, privileged or protected by law. Access is only authorised by the intended recipient - this means YOU! The contents may be disclosed to, or used by, anyone and stored or copied in any medium. If you are not the intended recipient, please advise the sender yesterday at the latest. ------------------------------------------- This message is from the IEEE EMC Society Product Safety Technical Committee emc-pstc discussion list. Visit our web site at: http://www.ewh.ieee.org/soc/emcs/pstc/ To cancel your subscription, send mail to: majord...@ieee.org with the single line: unsubscribe emc-pstc For help, send mail to the list administrators: Michael Garretson: pstc_ad...@garretson.org Dave Heald davehe...@mediaone.net For policy questions, send mail to: Richard Nute: ri...@ieee.org Jim Bacher: j.bac...@ieee.org All emc-pstc postings are archived and searchable on the web at: http://www.rcic.com/ click on "Virtual Conference Hall,"
