Ghery,
I was hoping my response would get a discussion going and am pleased that you
responded.  Please be aware, however that the basic message I wanted to get
across is that while there are clear passes (#1) and clear failures (#9);
there are also gray areas.  In these gray areas, whether the EUT is found
compliant or not depends on a number of factors and is subject to
interpretation.  If the manufacturer wishes to use a permissible loss of
performance, it is best to have this information submitted before the test is
performed to avoid the appearance of changing the rules after the game has
started in order to come out a winner!  There are also subtle differences in
the criteria B definition from standard to standard, and even in the same
standard, depending on the equipment type.
 
Our products are certified both to 55024 & EN 300 386 V 1.3.1.  I was not
familiar with the 61000-6-2 standard that Ralph inquired about but I reviewed
the definition of criteria B in that standard before I responded.  In each
standard criteria B is applicable for transient phenomena such as ESD and
allows for some degradation.  However, the wording differs in each standard,
which can affect compliance for “gray area” type test results.  Even in
CISPR 24, if you are required to use specific criteria for TTE included in
Annex. A, the criteria is different and may possibly affect compliance.
 
61000-6-2 Criteria B: “The apparatus shall continue to operate as intended
after the test.  No degradation of performance or loss of function is allowed
below a performance level specified by the manufacturer, when the product is
used as intended.  The performance level may be replaced by a permissible loss
of performance.  During the test, degradation of performance is however
allowed.  No change of actual operating state or stored data is allowed.  If
the minimum performance level or permissible performance loss is not specified
by the manufacturer, either of these may be derived from what the user may
reasonably expect from the apparatus if used as intended.”
 
Note that the above wording does not allow changes in operating state or
stored data either during or after the test.  In this regard the 61000-6-2
criteria is more severe than the general CISPR 24 criteria.  Thus, I stand by
my initial e-mail’s #5.  Under 61000-6-2 Criteria B, if the EUTs stored data
or operating state changes as a result of the transient test, the EUT is
non-compliant.  
 
For telecommunication network (switching) equipment under 300 386 v 1.3.1
paragraph 11.3.1.2; it is permissible for data errors to occur as a result of
transient phenomena, however except for a specific exception for surge
testing, established connections must be maintained throughout the testing. 
Thus the result Ralph described is:
 
1.       Compliant under the general CISPR 24 criteria B
2.       Non-compliant under CISPR 24 Annex A criteria B (TTE w/digital
interface, TTE w/analog interfaces, FAX)
3.       Compliant under CISPR 24 Annex B criteria B (data processing
equipment)
4.       In a gray area under 61000-6-2
5.       Non-compliant under 300 386 V 1.3.1 for telecom. switching equipment
 
The above list is partial, but I think my point is clear.  Note that CISPR 24
has 7 Annexes for specific categories of ITE with operating criteria for
immunity testing specifically tailored for each equipment type.   Thanks to
Ralph for presenting such an interesting test result example! 
 
Douglas G. Frazee
Regulatory Compliance Manager
Lucent Technologies
PSAX Division
[email protected]
 

From: Pettit, Ghery [mailto:[email protected]]
Sent: Thursday, April 24, 2003 4:51 PM
To: 'Frazee, Douglas (Douglas)'; Pettit, Ghery; 'Ralph McDiarmid'; 'EMC-PSTC'
Subject: RE: Performance Criterion
 
I'm going to contest this, but only slightly.
 
CISPR 24 defines Performance criterion B as:
 
"After the test, the equipment shall continue to operate as intended without
operator intervention.  No degradation of performance or loss of function is
allowed, after the application of the phenomena below a performance level
specified by the manufacturer, when the equipment is used as intended.  The
performance level may be replaced by a permissible loss of performance.
 
During the test, degradation of performance is allowed.  However, no change of
operating state or stored data is allowed to persist after the test.
 
If the minimum performance level (or the permissible performance loss) is not
specified by the manufacturer, then either of these may be derived from the
product description and documentation, and by what the end user may reasonably
expect from the equipment if used as intended."
 
Note that the change in operating state or stored data is a bit different than
quoted by Doug.  Obviously communications will be disrupted while the product
re-boots, but re-sends should be possible and self-recovery would progress. 
Unless the recovery period was too long for the manufacturer to tolerate I
would not call this a failure.
 
In any case, what is and is not a failure is not clear cut.  If the
manufacturer is willing to allow the product to take a minute to recover, and
the product does so without operator intervention, then a PASS is appropriate.
 If the manufacturer specifies that the product should recover more rapidly,
then a FAIL is appropriate.  I say nothing in the original message that
indicated that there were any problems caused by the test, other than a crash
that self recovered.  Based on that limited information, I would call this
product compliant and go on to the next test.  Remember that the original
message was suggesting that any loss of functionality was a failure, even
though the product self recovered.  If this is a manufacturer's expectation,
then call it a failure.  If this was a misunderstanding of criterion B, then
we have this discussion.
 
Doug, your point 9 would be a failure under criterion C, not just B.  ;-)
 
Ghery S. Pettit
Intel Corporation
 
 

From: Frazee, Douglas (Douglas) [mailto:[email protected]] 
Sent: Thursday, April 24, 2003 1:32 PM
To: 'Pettit, Ghery'; 'Ralph McDiarmid'; 'EMC-PSTC'
Subject: RE: Performance Criterion
 
Ralph, Ghery's response is somewhat correct, however I'd like to add several
points.
 
The definition of criterion B in 61000-6-2 allows degradation during the
immunity test.  It also states that, "No change of operating state or stored
data is allowed."  Thus, if communications are interrupted as a result of the
ESD forcing a reboot, corrupting stored data, etc.; the EUT is non-compliant.  
 
Further, if the manufacturer has not specified a permissible performance loss
(test plan is helpful here); it is appropriate to consult the user manual,
product specifications and/or derive the minimum performance level" from what
the user may reasonably expect from the apparatus when used as intended." 
This opens it up to interpretation!
 
What is the impact of a 1-minute loss of communications, is it no impact, a
minor annoyance or is it likely to set off an unpleasant chain reaction or
cause a hazardous condition?  I'm afraid that under the condition you
describe, compliance may not be clear cut.  Here's a summary of my
interpretations:
 
1)       EUT completely unaffected by ESD - compliant.
2)       EUT shows degradation as a direct result of ESD, self-recovers
immediately, operating state and stored data is unaffected - compliant.
3)       EUT shows degradation as a direct result of ESD, operating state and
stored data are unaffected, EUT self-recovers but not immediately. 
Manufacturer has defined a permissible performance level either in general or
as a result of ESD or transient electromagnetic phenomena.  Observed
degradation is acceptable within the manufacturer defined parameters -
compliant.
4)       EUT shows degradation as a direct result of ESD, operating state and
stored data are unaffected, EUT self-recovers but not immediately. 
Manufacturer has defined a permissible performance level either in general or
as a result of ESD or transient electromagnetic phenomena.  Observed 
degradation is not acceptable within the manufacturer
defined parameters - non-compliant.
5)       EUT shows degradation as a direct result of ESD, operating state
and/or stored data are affected. - non-compliant.
6)       EUT shows degradation as a direct result of ESD, operating state and
stored data are unaffected, EUT does not self-recover. - non-compliant.
7)       EUT shows degradation as a direct result of ESD, operating state and
stored data are unaffected, EUT self-recovers but not immediately. 
Manufacturer has not defined a permissible performance level either in general
or as a result of ESD or transient electromagnetic phenomena.  Minimum
performance level is determined from EUT documentation and/or from what the
user may reasonably expect from the apparatus when used as intended.  Observed
degradation is not acceptable within the parameters of minimum acceptable
performance - non-compliant.
8)       EUT shows degradation as a direct result of ESD, operating state and
stored data are unaffected, EUT self-recovers but not immediately. 
Manufacturer has not defined a permissible performance level either in general
or as a result of ESD or transient electromagnetic phenomena.  Minimum
performance level is determined from EUT documentation and/or from what the
user may reasonably expect from the apparatus when used as intended.  Observed
degradation is acceptable within the parameters of minimum acceptable
performance -compliant.
9)       EUT releases smoke as a result of ESD infusion, shows no signs of
life after test - non-compliant.
10)   EUT shows degradation as a direct result of ESD, operating state and
stored data are unaffected, EUT self-recovers but not immediately. 
Manufacturer has not defined a permissible performance level either in general
or as a result of ESD or transient electromagnetic phenomena.  Minimum
performance level is determined from EUT documentation and/or from what the
user may reasonably expect from the apparatus when used as intended.  Observed
degradation is acceptable within the parameters of minimum acceptable
performance however tester is having a lousy day - non-compliant.
 
Douglas G. Frazee
Regulatory Compliance Manager
Lucent Technologies
PSAX Division
[email protected]
 

From: Pettit, Ghery [mailto:[email protected]]
Sent: Thursday, April 24, 2003 11:13 AM
To: 'Ralph McDiarmid'; 'EMC-PSTC'
Subject: RE: Performance Criterion
 
Ralph,
 
If a product self-recovers without operator intervention, then you can say it
meets criterion B.  The manufacturer has the ability within these criteria to
define the acceptable loss of function, as well.  If 1 minute is an acceptable
time for the self-recovery, the product passes.  If operator intervention was
required, then a clear failure of criterion B would exist.
 
Ghery Pettit
 
 

From: Ralph McDiarmid [mailto:[email protected]] 
Sent: Wednesday, April 23, 2003 5:01 PM
To: 'EMC-PSTC'
Subject: Performance Criterion
 
I have a question about Performance Criterion B as described in EN61000-6-2.
 
Scenario:
A product temporary looses communication over a network connection during an
EMC disturbance like an ESD event.  It self-recovers and resumes communication
after about a minute.
 
Question:
Is the above event considered an acceptable loss of performance or a loss of
functionality?  
 
If it is a loss of functionality, even a temporary one, then I would say that
is fails Criterion B, but meets Criterion C.  I don't think it a question of
loss of performance in this example.
 
Is this a correct interpretation?
 
Thanks,
 
Ralph McDiarmid, AScT 
Compliance Engineering Group
Xantrex Technology Inc.
 
 

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