Chris,

do they really need the gas tubes and MOV's or are these components someone's
"insurance" or empirical engineering?

   Dave Cuthbert
   Micron Technology


From: Chris Maxwell [mailto:[email protected]]
Sent: Thursday, August 28, 2003 1:38 PM
To: Rich Nute
Cc: [email protected]
Subject: RE: Hi-Pot testing



Thanks for the response.

It's hard to say.  I wasn't there for the hipot test.  I just saw the
aftermath.  

A little background:  

The unit under test had a power supply which we designed from off the shelf
building blocks.  The first building block is a rectifier/doubler, which takes
the AC input and rectifies it.  The rectifier also has some "smarts" which
kick in a doubler for input voltages under 180VAC.  

The output of the rectifier is always about 320VDC.  This 320VDC is split into
two rails of 160VDC each so that 200V, low profile capacitors can be used. 
Each of these split rails is protected by a 230V gas tube.

The 320VDC is then used by high voltage DC/DC converters (purchased modules)
which make 5V and 12V.

The hipot test burned out the rectifier.

My guess is that the gas tubes on the output fired.  Since they have such a
high instantaneous current draw, the recitifier could be momentarily
overloaded.  Even the fuse in front of the rectifier (it did blow) could not
protect the rectifier from the hard blow characteristic of the gas tubes.



We could populate the circuitboard without the gas tubes, assemble the unit,
hipot test it and then install the gas tubes.

However, to me, this would seem to make the hipot test superfluous.  The
amount of re-assembly required to re-install the gas tubes would make the
initial hipot test a waste of time.   There would be all sorts of chances for
somebody to drop a screw into the unit, or leave one out.

Is there a way that the subassemblies could be hipot tested, then the main
assembly could have a low voltage hipot just to check for the ubiquitous
"dropped screw"?

Chris Maxwell | Design Engineer - Instruments Group
email [email protected] | dir +1 315 266 5128 | fax +1 315 797 8024

NetTest | 6 Rhoads Drive, Utica, NY 13502 | USA
web www.nettest.com | tel +1 315 797 4449 | 






> -----Original Message-----
> From: Rich Nute [SMTP:[email protected]]
> Sent: Thursday, August 28, 2003 1:31 PM
> To:   Chris Maxwell
> Cc:   [email protected]
> Subject:      Re: Hi-Pot testing
> 
> 
> 
> 
> Hi Chris:
> 
> 
> >   During safety testing at the lab, the unit passes HiPot 
> >   testing.  However, the unit is broken by the testing.  
> >   
> >   Rigorously, the unit "passes" its type testing because 
> >   it doesn't become unsafe by the Hipot.  However, it isn't 
> >   functional after the test; and it requires repair.  
> 
> I have two questions:
> 
> 1.  Is the functional failure due to over-voltage
>     of a component?
> 
> Or
> 
> 2.  Is the functional failure due to the hi-pot 
>     "leakage" current between primary and secondary?
> 
> If 1, then you should be able to disconnect that 
> component during the test.  Or, you could use the
> solution for 2.
> 
> If 2, then the problem becomes much more complex.
> We test the board before it goes into the product
> using a "bed of nails" that equalizes the potential
> on throughout the primary and throughout the 
> secondary.  This prevents current through the 
> components, yet tests the isolation between primary 
> and secondary.
> 
> Of course, such a test does not test the board in
> the end-product, which is a problem if the enclosure
> is metal.
> 
> Without more details of your circuit and the parts
> which are broken, I cannot give you further advice.
> 
> 
> Best regards,
> Rich
> 
> 
> 



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