Thanks.

  The test is being done at a remote lab, so I can't witness it.  In spite of
that, I think their setup is OK.

  What I don't understand is why this test standard would specify such tight
measurement variation.  The measured values are far below the limit, and if I
calculate their standard deviation*3, it's still far below the limit.
  In my original example, the 13mA signal could vary no more than
13mA * 5% = 650uA before it would be considered a failure.
In fact, it might be easier to meet the 5% repeatability test if my emissions
were higher.  A measured value of 285mA (just under the limit) would allow
285mA*5%=14mA of variation without exceeding the spec.

  To contrast, the EN 61000-3-3 voltage fluctuation/flicker standard has a
procedure involving manually-switched equipment.  This procedure requires 24
test measurements, with the high and low values discarded.
  The CISPR 22 emissions standard also has a detailed statistical procedure
(the
80%/80% rule?) to determine whether emissions should be considered 'out of
spec'.


Pat Lawler
pat dot lawler at verizon dot net

On Mon, 19 Apr 2004 19:42:53 -0700, "Kurt Fischer"
<[email protected]> wrote:
>You should use the same EUT (which must be stable and repeatable). If you
>are obtaining drastically different results then you do not know if it is
>the EUT or the test setup/instrumentation that is effecting the results.
>
>I would suggest using something like an incandescent light bulb to run the
>test and check the repeatability of the instrumentation and test setup.
>
>Just my 2 cents.
>
>Good Luck,
>
>Kurt
>
>-----Original Message-----
>From: [email protected]
>[mailto:[email protected]]On Behalf Of Pat Lawler
>Sent: Monday, April 19, 2004 5:36 PM
>To: [email protected]
>Subject: EN61000-3-2 repeatability test
>
>When the 'Repeatability' clause in EN61000-3-2:2000 (clause 6.3.2.1) is
>applied, is the comparison value (reference value) the result from another
>test run, or is it the test limit?
>
>For example, the harmonic test limit is 300mA, and the values from two test
>runs are 7.4mA and 13mA.
>
>1) If the comparision value is from the other test run:
>13mA-7.49mA
>-----------*100=42.4%  (failing the test)
>  13mA
>
>2) If the comparison value is the test limit:
>13mA-7.49mA
>-----------*100=1.8%  (passing the test)
>   300mA
>
>Method 1 seems overly stringent, but I can't find anything in the standard
>covering the method. Is this detail covered in another standard (like
>61000-4-7?)
>---
>Pat Lawler
>pat dot lawler at verizon dot net





This message is from the IEEE EMC Society Product Safety
Technical Committee emc-pstc discussion list.

Visit our web site at:  http://www.ieee-pses.org/

To cancel your subscription, send mail to:
     [email protected]
with the single line:
     unsubscribe emc-pstc

For help, send mail to the list administrators:
     Ron Pickard:              [email protected]
     Dave Heald:               [email protected]

For policy questions, send mail to:
     Richard Nute:           [email protected]
     Jim Bacher:             [email protected]

All emc-pstc postings are archived and searchable on the web at:
    http://www.ieeecommunities.org/emc-pstc

Reply via email to