In message <[email protected]>, dated Mon, 4 Sep 2006, Doug Smith <[email protected]> writes >There is a LOT of work to apply that standard to devices, much more >than the filtering I wrote about. There is no guidance in the standard >as to how to apply the discharge and how it is applied will almost >completely determine the results (other pins grounded or ungrounded, if >grounded how, and much more). If someone says their device passes this >test, the statement is meaningless at this point unless the test method >is documented.
ESD immunity of semiconductors is a matter for the subcommittees of IEC TC47. A search on the public part of the IEC web site would perhaps indicate what is being done in this field already. -- OOO - Own Opinions Only. Try www.jmwa.demon.co.uk and www.isce.org.uk 2006 is YMMVI- Your mileage may vary immensely. John Woodgate, J M Woodgate and Associates, Rayleigh, Essex UK - This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. Website: http://www.ieee-pses.org/ To post a message to the list, send your e-mail to [email protected] Instructions: http://listserv.ieee.org/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas [email protected] Mike Cantwell [email protected] For policy questions, send mail to: Jim Bacher: [email protected] David Heald: [email protected] All emc-pstc postings are archived and searchable on the web at: http://www.ieeecommunities.org/emc-pstc ______________________________________________________________________ This email has been scanned by the MessageLabs Email Security System. For more information please visit http://www.messagelabs.com/email ______________________________________________________________________
