On 16 Jun 2008 at 8:48, Price, Edward wrote:

> 
> I'm curious about the effect of using a gold (or silver) loaded epoxy 
> to bond a connector shell to a chassis box. If I measured a bond 
> resistance of about 1 Ohm from the connector shell to the chassis, how

> could I estimate the degradation in shielding effectiveness (frequency

> range of interest is about 10 kHz to 5 MHz)?
> 
> Maybe this has been thoroughly covered in some past Symposium papers. 
> Can anyone give me a hint about where to look? Of course, absolutely 
> definitive answers, which allow me to remain lazy, are also quite 
> acceptable.
> 
> Thanks in advance! 
> 
> 
> Ed Price


Ed,

My first question is the degradation in shielding effectiveness compared
to what? If you are comparing the conductive epoxy to a screw-fastened
connection you need to know the exact resistance of both shield paths. I
think if you took a good four-wire resistance measurement box-to-box for
a typical cable length you could get a good comparison of relative
resistance. If one construction had 5% higher total resistance the
degradation would be at least 5% at the lower frequencies.


Scott B. Lacey


Scott:

For a standard of comparison, maybe I could use the definition of a good
conductive joint as one being less than 0.0025 Ohms. If I assume that
the radiated leakage is proportional to the joint resistance, then a 1
Ohm value is 400 times higher than a "good" joint. That would imply that
the leakage would be 52 dB greater than the "good" joint cable.

Naahh, can't be that simple!


Ed Price
[email protected]     WB6WSN
NARTE Certified EMC Engineer & Technician
Electromagnetic Compatibility Lab
Cubic Defense Applications
San Diego, CA  USA
858-505-2780 (Voice)
858-505-1583 (FAX)
Military & Avionics EMC Is Our Specialty

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