Ahhh, our old friend: "Margin".
Margin is one of those timeless EMC topics.

IMHO- there is simply no evidence that margin is helpful.

In a practical sense we all know that a "single-measurement-plus-margin" is
not a confidence builder.
As an example, think about the last time you worked on your home wiring.
How many times did you read that multi-meter before you touched the wires?
Did you read it just once?  Then add some margin?

Nope- I'll bet you did like me:  I read that meter, and double-read it.
Then I read it again.
One measurement is simply not enough to build confidence.

Next time someone asks you for "reasonable margin" ask them about their
last wiring project....

-Patrick
OOO.


On Mon, Oct 12, 2015 at 2:54 PM, Douglas Powell <doug...@gmail.com> wrote:

> Ted,
>
> Very good points. If minimum passing margins are a result of ‎edge rates
> on transistors, diodes or ICs, then a second source or "upgrade" to a
> faster device can be counterproductive with regard to the emissions
> profile.
>
> If such engineering changes or supplier changes have occurred, then a
> retest is often the best policy. I was also aware that several cumulative
> engineering changes over time can result in a non-compliance.    ‎Each
> change, when evaluated by itself was inconsequential. But in aggregate,
> result was a failure. This is often the reason I would require a retest
> after some number of engineering changes had been applied to a product.  Of
> course, keeping full data test reports on each passing result is really the
> only way to do this well.
>
> Doug
>
> Douglas E Powell
>
> doug...@gmail.com
> http://www.linkedin.com/in/dougp01
>
> *From: *Ted Eckert
> *Sent: *Monday, October 12, 2015 2:44 PM
> *To: *EMC-PSTC@LISTSERV.IEEE.ORG
> *Reply To: *Ted Eckert
> *Subject: *Re: [PSES] Stricter limits than legal (CISPR11, IEC, etc,)
> Where?
>
> In addition to the responses from Doug, Ghery and Brian, I will note that
> margin protects you from unexpected or unknown changes from component
> suppliers. To some extent, this falls under the manufacturing variance Doug
> mentioned, but component changes is just another area that can be hard to
> control.
>
>
>
> I’ve had IC vendors do a die shrink on a part resulting in sharper edge
> rates on the outputs. At a previous employer, I was running emissions
> testing on a number of samples where Motorola did a die shrink on the
> microcontroller we were using. Some of my test samples had the old part and
> some had the new. It took a long time to figure out why some samples were
> significantly worse than others after controlling for all other variables.
> Having 6 dB margin to begin with provides some protection against this type
> of change.
>
>
>
> Ted Eckert
>
> Compliance Engineer
>
> Microsoft Corporation
>
> ted.eck...@microsoft.com
>
>
>
> The opinions expressed are my own and do not necessarily reflect those of
> my employer.
>
>
>
> *From:* Itzenheiser, Jerry (GE Healthcare) [mailto:
> gerald.itzenhei...@med.ge.com]
> *Sent:* Monday, October 12, 2015 12:26 PM
> *To:* EMC-PSTC@LISTSERV.IEEE.ORG
> *Subject:* [PSES] Stricter limits than legal (CISPR11, IEC, etc,) Where?
>
>
>
>
>
> Hello EMCers,
>
> I would like to ask…
>
> Is there anyone out there that tests to stricter limits than the legal
> (CISPR, IEC, etc.) limits? If so, what was the rationale behind selecting
> the stricter limits? Our engineering teams are curious as to where the
> stricter recommended limits come from, such as the 6dB margin for emissions
> testing.
>
>
>
> *Thanks,*
>
>
>
> *Jerry Itzenheiser Jr*
>
> EMC Technician - Waukesha
>
> GE Healthcare
>
> Global Engineering Technologies
>
> EMC Laboratory Waukesha
>
>
>
> T  + 262-548-2217
>
> M + 262-720-8846
>
> *gerald.itzenhei...@med.ge.com <gerald.itzenhei...@med.ge.com>*
>
> www.ge.com
> <https://na01.safelinks.protection.outlook.com/?url=http%3a%2f%2fwww.ge.com%2f&data=01%7c01%7cted.eckert%40MICROSOFT.COM%7c1f785e71fc11409e76c408d2d33bbe0a%7c72f988bf86f141af91ab2d7cd011db47%7c1&sdata=WGwl3c%2bUU7WAC%2bg6Bk9SLRF9h6fEB5snjR84zIbqoVY%3d>
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>
>
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>
>
> -
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-- 
//
Patrick

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