On Wed, 03 Jul 2013 13:42:22 +0100 Stefan Schmidt <s.schm...@samsung.com> said:

> Hello.
> 
> On 07/03/2013 11:48 AM, Stefan Schmidt wrote:
> >
> > If you want to have a look and help us fixing bugs or marking things as
> > false positive please register at scan.coverity.com and request access
> > to these projects. Daniel or myself can then approve your access and you
> > can have a look.
> >
> > efl: http://scan.coverity.com/projects/552
> > elm: http://scan.coverity.com/projects/553
> > e:   http://scan.coverity.com/projects/554
> 
> Some numbers:
> 
> EFL: 521,687 lines of code and an initial set of 559 defects results in 
> a defect density of 1.07. 1.0 is what they rate as industry standard and 
> means 1 defect in thousand lines of code.
> 
> Elm has 210,048 but only 77 initial defects resulting in a way lower 
> defect density of 0.37.
> 
> E is a middleground with 273,355 lines of code and 205 initial defects 
> resulting in a defect density of 0.75.
> 
> All in all that looks quite ok to me. I suspect some false positives in 
> efl especially in the way we use eina_list and hash and take care about 
> resource free'ing.
> 
> regards
> Stefan Schmidt

i'd say that pretty damned good... considering. i think we may be a bit harsh
on ourselves at times...

BUT WE SHOULD BE! industry average is not good enough! :) m(elm is surprising
btw! - same with e. i would have expected efl is better).

i am sure we can knock off a lot of the defects found and come out smelling
like roses. 0 defects... here we come. :)

-- 
------------- Codito, ergo sum - "I code, therefore I am" --------------
The Rasterman (Carsten Haitzler)    ras...@rasterman.com


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