Hi, I am attempting to refine diffractograms of the NIST SRM 640c Si standard that I acquired on an Inel CPS120 diffractometer. I was able to successfully get out the instrument parameters using peakfit, and the results are quite good (Rwp ~ 5%).
However, I have no success when I try a refinement on the data. The phase data comes from a CIF file, and the calculated reflection positions match fairly well with the peaks in the data. However, the "refined" pattern does not follow the data at all (Rwp > 54%) and the background is much larger than it should be. I have tried several background functions and have varied the sample displacement parameters and the lattice parameter, but nothing helps. Has anyone experienced a similar situation? Any advice is appreciated. Thanks, -- Nick Weadock PhD Candidate, Materials Science California Institute of Technology 1200 E California Blvd, Pasadena, CA 91125 MC 138-78 x2520
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