On 29 Dez., 00:50, Rogier Wolff <[email protected]> wrote:

> What I meant is that from a preliminary optimization, the overlapping
> areas of two images is aproximated. Next cpfind would be asked to find
> key/control points in JUST this overlapping area. The sieve1*
> parameters would ensure that we get a uniform blanket of control
> points over the overlapping area of these two images.

Rogier, are you aware of the feature to 'remove control points in
masks'? It is in the menu, but there's no button on any of the tabs,
so I consistently overlooked it until I was pointed to it by another
post. This allows you to quickly mask a part of your image just for
the purpose, throw out the CPs in that mask and then remove the mask
again.

Kay

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