On Tue 21-02-17 18:09:45, Jan Kara wrote:
> Hello,
>
> this is a second revision of the patch set to fix several different races and
> issues I've found when testing device shutdown and reuse. The first three
> patches are fixes to problems in my previous series fixing BDI lifetime
> issues.
> Patch 4 fixes issues with reuse of BDI name with scsi devices. With it I
> cannot
> reproduce the BDI name reuse issues using Omar's stress test using scsi_debug
> so it can be used as a replacement of Dan's patches. Patches 5-11 fix oops
> that
> is triggered by __blkdev_put() calling inode_detach_wb() too early (the
> problem
> reported by Thiago). Patches 12 and 13 fix oops due to a bug in gendisk code
> where get_gendisk() can return already freed gendisk structure (again
> triggered
> by Omar's stress test).
>
> People, please have a look at patches. They are mostly simple however the
> interactions are rather complex so I may have missed something. Also I'm
> happy for any additional testing these patches can get - I've stressed them
> with Omar's script, tested memcg writeback, tested static (not udev managed)
> device inodes.
>
> Jens, I think at least patches 1-3 should go in together with my fixes you
> already have in your tree (or shortly after them). It is up to you whether
> you decide to delay my first fixes or pick these up quickly. Patch 4 is
> (IMHO a cleaner) replacement of Dan's patches so consider whether you want
> to use it instead of those patches.
I forgot to add that the patches are also available from my git tree:
git://git.kernel.org/pub/scm/linux/kernel/git/jack/linux-fs.git bdi
Honza
--
Jan Kara <[email protected]>
SUSE Labs, CR
