On Tue, Feb 21, 2017 at 9:19 AM, Jan Kara <j...@suse.cz> wrote: > On Tue 21-02-17 18:09:45, Jan Kara wrote: >> Hello, >> >> this is a second revision of the patch set to fix several different races and >> issues I've found when testing device shutdown and reuse. The first three >> patches are fixes to problems in my previous series fixing BDI lifetime >> issues. >> Patch 4 fixes issues with reuse of BDI name with scsi devices. With it I >> cannot >> reproduce the BDI name reuse issues using Omar's stress test using scsi_debug >> so it can be used as a replacement of Dan's patches. Patches 5-11 fix oops >> that >> is triggered by __blkdev_put() calling inode_detach_wb() too early (the >> problem >> reported by Thiago). Patches 12 and 13 fix oops due to a bug in gendisk code >> where get_gendisk() can return already freed gendisk structure (again >> triggered >> by Omar's stress test). >> >> People, please have a look at patches. They are mostly simple however the >> interactions are rather complex so I may have missed something. Also I'm >> happy for any additional testing these patches can get - I've stressed them >> with Omar's script, tested memcg writeback, tested static (not udev managed) >> device inodes. >> >> Jens, I think at least patches 1-3 should go in together with my fixes you >> already have in your tree (or shortly after them). It is up to you whether >> you decide to delay my first fixes or pick these up quickly. Patch 4 is >> (IMHO a cleaner) replacement of Dan's patches so consider whether you want >> to use it instead of those patches.
FWIW, I wholeheartedly agree with replacing my band-aid with this deeper fix.
