On 02/21/2017 10:09 AM, Jan Kara wrote: > Hello, > > this is a second revision of the patch set to fix several different races and > issues I've found when testing device shutdown and reuse. The first three > patches are fixes to problems in my previous series fixing BDI lifetime > issues. > Patch 4 fixes issues with reuse of BDI name with scsi devices. With it I > cannot > reproduce the BDI name reuse issues using Omar's stress test using scsi_debug > so it can be used as a replacement of Dan's patches. Patches 5-11 fix oops > that > is triggered by __blkdev_put() calling inode_detach_wb() too early (the > problem > reported by Thiago). Patches 12 and 13 fix oops due to a bug in gendisk code > where get_gendisk() can return already freed gendisk structure (again > triggered > by Omar's stress test). > > People, please have a look at patches. They are mostly simple however the > interactions are rather complex so I may have missed something. Also I'm > happy for any additional testing these patches can get - I've stressed them > with Omar's script, tested memcg writeback, tested static (not udev managed) > device inodes. > > Jens, I think at least patches 1-3 should go in together with my fixes you > already have in your tree (or shortly after them). It is up to you whether > you decide to delay my first fixes or pick these up quickly. Patch 4 is > (IMHO a cleaner) replacement of Dan's patches so consider whether you want > to use it instead of those patches.
I have applied 1-3 to my for-linus branch, which will go in after the initial pull request has been pulled by Linus. Consider fixing up #4 so it applies, I like it. I'll review the rest later this week. -- Jens Axboe
