Having read all these messages about the merits and advantages of neutron TOF and synchrotron X-ray powder diffractometers for structure determination & refinement, I'm a little reminded of the Mac vs PC arguments that sometimes rage around. Each of these machines have particular applications that they excel in, some which are "even" and some they are particularly poor in. Quoting one number for "resolution" is particularly invidious because it's like comparing apples & oranges (yeah, I know they are both fruit that grows on trees but viva la difference). Bob Von Dreele
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