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Archive of Rietveld messages
Alan Hewat
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[real_recipes] rietveld_l,中国EI核心检索中心 EI&ISTP双检索,包写包发包翻译!
大学
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5th Reynolds Cup OPEN
Stephen Hillier
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any good up to date review paper for Rietveld methods?
Francois Berenger
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chi^2 smaller one
Christina Drathen
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DDM-GUI beta version
Leonid Solovyov
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GSAS/EXPGUI use on Mac and Linux
Brian H. Toby
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Did anybody ever use the Terra's Field Portable XRD
ji zhang
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Re: EPM
Łukasz Kruszewski
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[no subject]
Djerdj Igor
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Réf. : Topas
Habib Boughzala
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Topas prm keyword
Habib Boughzala
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*.cif files for RMnO3 (R= Sm,Eu,Gd,Dy,Ho,Yb)
sisir ray
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Re: *.cif files for RMnO3 (R= Sm,Eu,Gd,Dy,Ho,Yb)
Holger Putz (Crystal Impact)
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Re: *.cif files for RMnO3 (R= Sm,Eu,Gd,Dy,Ho,Yb)
sisir ray
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Re: *.cif files for RMnO3 (R= Sm,Eu,Gd,Dy,Ho,Yb)
Alan Hewat
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TOPAS Academic v 4.1 refining problem
sisir ray
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Powder diffraction and Fuji image plate
Natale Perchiazzi
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Platon TMA analysis
adam calver
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oil capacitor information
jahenao
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Microstructural analysis by fullprof
Alice Courleux
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Re: give me suggestion
Łukasz Kruszewski
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Explaining for broadening of peaks due to a shift of theta in theta-two theta scanning?
Huy LE-QUOC
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Intrumental broadening of 2D detector
Wing Fai Lai
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the error bars of lattice parameters using GSAS
Peng, Jin
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TOPAS full axial model
Łukasz Kruszewski
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BGMN 5 available
Joerg Bergmann
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origin
Olga Smirnova
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alternative to Brown method
Olga Smirnova
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standard
Olga Smirnova
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spectra
Olga Smirnova
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D8 axis control board
Martin
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diffraction patterns or spectra
amartin
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The 5th Reynolds Cup
Stephen Hillier
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Find-it
Davide levy
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Preferred orientation question
Ross H Colman
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Negative Biso / absorption in TOPAS.
Jacco van de Streek
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What is a good sequence for refinement of (U,V,W) of a multiphase sample ?
Huy LE-QUOC
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Location of Hugo Rietveld ?
Alan Hewat
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request of an example of 14mm or 14/mmm structure
alortiz
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Thickness measurement
Francois Goutenoire
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Lachlan Cranswick
Swainson, Ian - NRC
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FPSchool-2010: Annual School on Advanced Neutron Diffraction Data Treatment using the FULLPROF suite
FPSchool - 2010
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International Summer School on "Diffraction at the Nanoscale"
Norberto Masciocchi
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Too many reflections in Fullprof
amartin
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New DISCUS release and workshop ..
Thomas E. Proffen
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calcul of a vector indices
Mª Teresa Calvet
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Comparison of powder patterns recorded at different wavelengths
Franz Werner
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Problem with the refinement of spinel structures
muhammad ali
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RIET: Acta E editorial on fraudulently submitted crystal structures
Lachlan Cranswick
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Request for JCPDS Number
Suresh kk
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happy new year 2010
joy mukherjee
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Request of CIfs of PDF-47-1448 & PDF-71-0044 (copper selenide)
Dr. STEPHEN SIN-YIN, CHUI
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Diffraction at the Nanoscale School 2010
Radovan Cerny
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accessing rawfile headers with TOPAS
Ross Williams
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Instrumental parameters file
Deka, U. (Upakul Deka)
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References on quantitative phase analysis using GSAS
Dr. STEPHEN SIN-YIN, CHUI
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Powder Diffraction & Rietveld Refinement School 2010: deadline reminder
EVANS I.
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real and imaginary dispersion corrections for elements using Co K-alpha radiation
prasunsc
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Automated slits for Panalytical MPD
Russ Field
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Rietveld refinement in TOPAS with parallel beam geometry
Patrick Price
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How to calculate "Occupation number" in FullProf
Huy LE-QUOC
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how to export data in Topas
alortiz
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fractional occupancy and composition within GSAS
Irvin Telepeni
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Problems with SEQGSAS
Caroline CURFS
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site occupancy
deepti kothari
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Unsubscribing
Ross H Colman
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stop mailing
S VENKATESH
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Configuration of PANalytical X'pert Pro
Alexandra Seclaman
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Fwd: post-doc position available
Vincent Favre-Nicolin