Re: mated connector resistance test on the cheap

2006-12-11 Thread emc-p...@ieee.org
Gary, Forgot to mention another, less mentioned, failure mode - INTERMITTENT CONNECTION That's where the connection fails completely OPEN and then repairs itself. Static measurements rarely catch this one. But, data transmission will see it. Or, like for me, burglar alarm indications saw

Re: mated connector resistance test on the cheap

2006-12-11 Thread emc-p...@ieee.org
Be sure to include 'unfriendly' atmosphere. We found that most push button switches go south here from the slightly corrosive atmosphere, more so from any wear they ever see. You have no idear how many useless instruments are around here now. -Robert - On Mon, 11 Dec 2006 12:51:19 -0800

Re: mated connector resistance test on the cheap

2006-12-11 Thread emc-p...@ieee.org
You don't say but it sounds as if the connector involved is rf. If rf performance is what you are after, what you really want is a TDR to look at the discontinuity the connection provides over time, or more accurately as a function of the number of mate/demate cycles. From: McInturff Gary

mated connector resistance test on the cheap

2006-12-11 Thread emc-p...@ieee.org
I am trying to look at measuring connector/connector resistance through a lifetime of insertion/removal cycles – far more than what the connector specification addresses. Anybody have a suggestion for the test gear. I would prefer to run it at signaling speed, but think I’m going to have to just

Re: Laboratory Equipment vs. Machinery Directive

2006-12-11 Thread emc-p...@ieee.org
In message 2441d1063d04bc419b1d21396ed3d518101a8...@sanexch03.cahapps.net, dated Mon, 11 Dec 2006, Knudsen, Patricia J. patricia.j.knud...@cardinal.com writes Rather than read the standards you might want to review the machinery directive to see whether your equipment qualifies as a machine or

RE: dated or undated reference to EN standards

2006-12-11 Thread emc-p...@ieee.org
Tom and everyone The purpose of Annex ZA in parallel-voted CENELEC standards is to control the way in which referenced documents are applied. Parallel-voted EN standards are based on IEC or CISPR standards and may, or may not, differ from the international version. Differences are called

Re: Laboratory Equipment vs. Machinery Directive

2006-12-11 Thread emc-p...@ieee.org
Jeff, We have all of these on the shelf. What do you want to know? Nick. P.S. EN 292-1, -2 has now been superseded by EN ISO 12100-1, -2 At 09:39 -0800 11/12/06, jeff collins wrote: Content-Type: text/html X-MIME-Autoconverted: from 8bit to quoted-printable by engine.ieee.org id

RE: FCC Rules interpretation - Help requested.

2006-12-11 Thread emc-p...@ieee.org
Charles, If I understand your question correctly: Look at 15.31 paragraphs b), h) and i) a) 3) References ANSI C63.4 for the test procedure which specifies testing with all applicable components/accessories h) indicates that composites are tested as a system i) indicates that accessories will

RE: Laboratory Equipment vs. Machinery Directive

2006-12-11 Thread emc-p...@ieee.org
Rather than read the standards you might want to review the machinery directive to see whether your equipment qualifies as a machine or not. http://ec.europa.eu/enterprise/mechan_equipment/machinery/welcdir.htm Regards, Patty Knudsen Cardinal Health, Inc. Clinical Technologies and

FCC Rules interpretation - Help requested.

2006-12-11 Thread emc-p...@ieee.org
Hello, I have a question on the system testing requirements for devices that are Verified under the FCC authorization rules and marketed as a system. Can someone point me to the relevant FCC rules? I have looked and looked and cannot seem to find it. Best Regards Charles Grasso Compliance

dated or undated reference to EN standards

2006-12-11 Thread emc-p...@ieee.org
Hello, I'm slightly confused with (apparently dated) reference to EN standards which corresponds to undated reference to IEC standards. In Annex ZA (list of normative references) of EN standards, years are sometimes written for EN standards which corresponds to undated IEC standards, with a