ASTM has Manual 20(see ASTM. http://www.ASTM.org )
Richard Haynes
609 497-4584
-Original Message-
From: Mel Pedersen mpeder...@midcom-inc.com
To: 'david_ster...@ademco.com' david_ster...@ademco.com; emc-p...@ieee.org
emc-p...@ieee.org; eric.henn...@us.abb.com eric.henn...@us.abb.com
List
HELLO,
THIS LIST IF GOOD BUT THE FREQUENCY IS LOW ABOUT 1K.
HOPE ALL YOUR APPLICATIONS ARE LOW FREQUENCY.
RICHARD HAYNES
-Original Message-
From: ajm...@us.ibm.com ajm...@us.ibm.com
To: emc-p...@ieee.org emc-p...@ieee.org
List-Post: emc-pstc@listserv.ieee.org
Date: Monday, May 01, 2000
)
Ni 50 Hz to 3GHz 3 to 27
(particle fillers)
Cu50 Hz to 3GHz1 to 10
(Metal)
There are several other systems that I have measured. May get to a
publication this year?
Richard Haynes
609-497-4584
P.S. This is a better technique than the Z technique
each other in the
same way. This series of experiments would isolate the effect of coins
hitting coins only. I think Doug Smith talked about these isolation type
experiments ar some point in time.
How about it somebody who has the equipment?
Richard Haynes
609-497-4584
-Original Message
are done for qualification ,
i.e. D.C. resistance across the interfaces, X/Au/Al. Another important face
would be is the system open to fretting and crevice corrosion and what
environments, i.e. Chloride-Au will not work.
Thanks
Richard Haynes
609-497-4584
-Original Message-
From: Cortland
available.
Be glad to help you on more specifics.
Richard Haynes
609-497-4584
-Original Message-
From: UMBDENSTOCK, DON umbdenst...@sensormatic.com
To: 'EMC-PSTC Discussion Group' emc-p...@ieee.org
List-Post: emc-pstc@listserv.ieee.org
Date: Monday, November 30, 1998 6:06 PM
Subject
Hello,
Try this on for size. The numbers that are measured with a network analyzer or
spectrum analyzer or other are related to a definition:
dB = Klog(Ratio)
so the numbers that stats should be applied to are the numbers in the log term
then the stat treated numbers can be put into dB form
welcome to
our e-mail group.
Thanks
Richard Haynes
609-497-4584
-Original Message-
From: Bailin Ma b...@namg.us.anritsu.com
To: emc-p...@ieee.org emc-p...@ieee.org;
knigh...@exchange.sandiegoca.ncr.com knigh...@exchange.sandiegoca.ncr.com;
nludvig...@emtengineering.com nludvig
) electrical
testing of materials: shielded room, and others.
Please contact:
Richard Haynes
609-497-4584
Ron,
Thanks for the note. I also think such information should be shared. Word of
mouth or e-mail is sometimes the best way because along with the seminar
information comes an evaluation and can save time and money.
Thanks again even if the management disagrees.
Richard Haynes
-Original
for FR-4, FR-5 and
other materials.
Talk to you later.
Richard Haynes
. All is all a dimensional analysis must yield a dimensionless
number in the exp(E or H or F).
Thanks
Richard Haynes
-Original Message-
From: Douglas Mckean dmck...@corp.auspex.com
To: Richard Haynes vale...@pluto.njcc.com
Cc: Parker, Thomas P (Paul) tppar...@lucent.com;
accelerated-stress
-Original Message-
From: Richard Haynes vale...@pluto.njcc.com
To: Parker, Thomas P (Paul) tppar...@lucent.com
Cc: accelerated-stress-testing
accelerated-stress-test...@majordomo.ieee.org; emc-pstc
emc-p...@ieee.org
List-Post: emc-pstc@listserv.ieee.org
Date: Tuesday, July 28, 1998 3:18
Paul,
Thank you for your suggestion. I hope these comments will be useful.
Richard Haynes
Applications of the Arrhenius type equation include chemical and
electrochemical reactions and many other systems such as bipolar and MOS
infant mortality. Both temperature and voltage are accelerating
Paul,
Thank you for your suggestion. I hope these comments will be useful.
Richard Haynes
Applications of the Arrhenius type equation include chemical and
electrochemical reactions and many other systems such as bipolar and MOS
infant mortality. Both temperature and voltage are accelerating
Doug,
What distribution did you use for the calculation. This may be a major
assumption and the AF can vary by several times?
Richard Haynes
-Original Message-
From: Douglas Mckean dmck...@corp.auspex.com
To: 'emc-p...@ieee.org' emc-p...@ieee.org
List-Post: emc-pstc@listserv.ieee.org
Date
Greetigs,
Many of our group have indicated an interest in Accelerated Stress Testing.
The IEEE com. TC-7 is again giving the following Technical Meeting.
Hope to see you there.
Richard Haynes
-Original Message-
From: Mantz, Joe joe.ma...@attws.com
To: 'accelerated-stress-test
Tony,
A good place to start is the mail list
accelerated-stress-test...@majordomo.ieee.org and the home page of IEEE Co,
Tc7 that hold the annual conference on AST http://www.cpmt.org/tc/tc7.html .
I will be giving the tutoral on Accelerated Stress Test for Corrosion
Failure. Let me know if I can
Shelly,
Sorry for the slight mistake on Wayne's home page:
http://www.equipment-reliability.com or
consulta...@equipment-reliability.com
I would like to know how it goes.
Richard Haynes
-Original Message-
From: Richard Haynes vale...@pluto.njcc.com
To: emc-p...@majordomo.ieee.org emc-p
Shelly,
You might want to check out Wayne Tustin's Equipment Reliability Goup at
http://www.equipment-ment reliability. com
Richard Haynes
Greetings Wayne
-Original Message-
From: SRZIMMER srzim...@aol.com
To: emc-p...@majordomo.ieee.org emc-p...@majordomo.ieee.org
List-Post: emc-pstc
Shelly,
Do we know the most probable failure mode. We might get this information
from the supplier of the PS.
Richard Haynes
P.S. I have included a copy of this e-mail to one of the leading experts in
the Field of Accelerated Testing: Tony Chan at ATT Bell Labs.
-Original Message-
From
, beyond the break thur
point, and the oxiding environment is small otherwise we lmight have to do
something like the connector industry.
Thanks again for that enjoyable and interesting conversation.
Richard Haynes
of the magnetic probes, circular vs square, can be seen in
ITEM, p. 128, 1996.
If it will be heplful to any of our group I will supply what is necessary.
Needless to say as, with others, there is much more than I could type up in
this short amount of time.
Thanks
Richard Haynes
609-497-4584
P.S
To encourage activity in IEEE local chapters I have decided to make an offering
of my courses at reduced cost to those who are active or will become active
soon.
Please pass this information to all.
Richard Haynes is offering two courses at the NMi USA Inc in Tinton Falls(near
Freehold), NJ
-Original Message-
From: Richard Haynes vale...@pluto.njcc.com
To: emc-p...@ieee.org emc-p...@ieee.org; t...@world.std.com
t...@world.std.com; e-saf...@dorado.crpht.lu e-saf...@dorado.crpht.lu
Cc: Michael J Azar mja...@emc-turntech.com; Tom Tortoriello
tomtort...@aol.com
EMC/EMI/ESD Issues Related to Corrosion and MaterialsReliability
Greetings,
Presentations on the above named subject matter are scheduled for
various times through this year in California, New Jersey, Mass. and Ga.
If interested in details, please contact by private e-mail to:
NJ:
-Original Message-
From: Richard Haynes vale...@pluto.njcc.com
To: emc-p...@ieee.org emc-p...@ieee.org; t...@world.std.com
t...@world.std.com; e-saf...@dorado.crpht.lu e-saf...@dorado.crpht.lu
Cc: Michael J Azar mja...@emc-turntech.com; Tom Tortoriello
tomtort...@aol.com
Greetings,
Presentations on the above named subject matter are scheduled for various times
through this year in California, New Jersey, Mass. and Ga. If interested in
details, please contact by private e-mail to:
NJ: Thomas Tortoriello, 732-842-8900, nmius...@aol.com
March 10 12, May
hope to meet you and share experiences.
Richard Haynes
, 609-497-4792 Fax and/or
http://www.cpmt.org/tc/tc7.html.
Richard Haynes
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