smartctl 5.39 2009-12-09 r2995 [FreeBSD 7.2-STABLE amd64] (local build)
Copyright (C) 2002-9 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HD502HJ
Serial Number: S20BJ90S807431
Firmware Version: 1AJ100E4
User Capacity: 500,107,862,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 6
Local Time is: Wed Feb 3 18:23:38 2010 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (4860) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 81) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always
- 340
2 Throughput_Performance 0x0026 056 056 000 Old_age Always
- 4432
3 Spin_Up_Time 0x0023 082 081 025 Pre-fail Always
- 5649
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always
- 11
5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always
- 0
7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always
- 0
8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline
- 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always
- 669
10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always
- 0
11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always
- 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always
- 13
191 G-Sense_Error_Rate 0x0022 252 252 000 Old_age Always
- 0
192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always
- 0
194 Temperature_Celsius 0x0002 064 064 000 Old_age Always
- 23 (Lifetime Min/Max 18/25)
195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always
- 0
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always
- 0
197 Current_Pending_Sector 0x0032 252 100 000 Old_age Always
- 0
198 Offline_Uncorrectable 0x0030 252 100 000 Old_age Offline
- 0
199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always
- 0
200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always
- 65
223 Load_Retry_Count 0x0032 252 252 000 Old_age Always
- 0
225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always
- 13
SMART Error Log Version: 1
ATA Error Count: 248 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 248 occurred at disk power-on lifetime: 622 hours (25 days + 22 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 24 7b a2 ef e1 Error: UNC 36 sectors at LBA = 0x01efa27b = 32481915
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 70 2f a2 ef e1 02 00:22:53.113 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.111 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.109 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.102 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.099 READ DMA
Error 247 occurred at disk power-on lifetime: 622 hours (25 days + 22 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 24 7b a2 ef e1 Error: UNC 36 sectors at LBA = 0x01efa27b = 32481915
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 70 2f a2 ef e1 02 00:22:53.111 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.109 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.102 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.099 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.097 READ DMA
Error 246 occurred at disk power-on lifetime: 622 hours (25 days + 22 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 24 7b a2 ef e1 Error: UNC 36 sectors at LBA = 0x01efa27b = 32481915
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 70 2f a2 ef e1 02 00:22:53.109 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.102 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.099 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.097 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.086 READ DMA
Error 245 occurred at disk power-on lifetime: 622 hours (25 days + 22 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 24 7b a2 ef e1 Error: UNC 36 sectors at LBA = 0x01efa27b = 32481915
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 70 2f a2 ef e1 02 00:22:53.102 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.099 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.097 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.086 READ DMA
c8 00 08 bf a0 ef e1 02 00:22:53.086 READ DMA
Error 244 occurred at disk power-on lifetime: 622 hours (25 days + 22 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 24 7b a2 ef e1 Error: UNC 36 sectors at LBA = 0x01efa27b = 32481915
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 70 2f a2 ef e1 02 00:22:53.099 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.097 READ DMA
c8 00 70 2f a2 ef e1 02 00:22:53.086 READ DMA
c8 00 08 bf a0 ef e1 02 00:22:53.086 READ DMA
c8 00 20 bf 32 e4 e1 02 00:22:53.075 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Extended offline Completed without error 00% 648 -
# 2 Short offline Completed without error 00% 647 -
# 3 Short offline Completed: read failure 90% 627
32481915
Note: selective self-test log revision number (0) not 1 implies that no
selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been
run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Completed [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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