Hi

Unfortunately, the most common approach is to simply say "it's a wide band 
loop, no need to check it ...."

Bob


On Feb 6, 2010, at 3:30 PM, Bruce Griffiths wrote:

> To a first approximation injection locking alters the loop parameters so its 
> important to measure the actual PLL characteristics with the loop closed and 
> not just use the PLL parameters inferred from the OCXO EFC transfer function 
> etc.
> 
> The noise of the OCXO used as a VCXO will limit the noise floor.
> An ADEV noise floor of 1E-13 isnt likely when using an HP10811A as the VCXO 
> for example.
> 
> Bruce
> 
> Bob Camp wrote:
>> Hi
>> 
>> It's possible / likely to injection lock with the tight loop approach and 
>> get data that's much better than reality. A lot depends on the specific 
>> oscillators under test and the buffers (if any) between the oscillators and 
>> mixer.
>> 
>> If your OCVCXO has a tuning slope of 0.1 ppm / volt then a part in 10^14 is 
>> going to be at the 100 of nanovolts level. Certainly not impossible, but it 
>> does present it's own set of issues. Lab gear to do it is available, but not 
>> all that common. DC offsets and their temperature coefficients along with 
>> thermocouple effects could make things exciting.
>> 
>> There is no perfect way to do any of this, only a lot of compromises here or 
>> there. Each approach has stuff you need to watch out for.
>> 
>> Bob
>> 
>> --------------------------------------------------
>> From: "WarrenS" <[email protected]>
>> Sent: Saturday, February 06, 2010 2:19 PM
>> To: "Discussion of precise time and frequency measurement" 
>> <[email protected]>
>> Subject: Re: [time-nuts] ADEV vs MDEV
>> 
>>> 
>>> Peat said:
>>>> I would appreciate any comments or observations on the topic of apparatus 
>>>> with demonstrated stability measurements.
>>>> My motivation is to discover the SIMPLEST scheme for making stability 
>>>> measurements at the 1E-13 in 1s  performance level.
>>> 
>>> 
>>> If you accept that the measurement is going to limited by the Reference Osc,
>>> for Low COST and SIMPLE, with the ability to measure ADEVs at that level,
>>> Can't beat a simple analog version of  NIST's "Tight Phase-Lock Loop Method 
>>> of measuring Freq stability".
>>> http://tf.nist.gov/phase/Properties/one.htm#oneone    Fig 1.7
>>> 
>>> 
>>> By replacing the "Voltage to freq converter, Freq counter & Printer with a 
>>> Radio shack type PC data logging DVM,
>>> It can be up and running from scratch in under an Hr, with no high end test 
>>> equipment needed.
>>> If you want performance that exceeds the best of most DMTD at low Tau it 
>>> takes a little more work
>>> and a higher speed oversampling ADC data logger and a good offset voltage.
>>> 
>>> I must add this is not a popular solution (Or a general Purpose one) but
>>> IF  you know analog and have a GOOD osc with EFC to use for the reference,
>>> as far as I've been able to determine it is the BEST SIMPLE answer that 
>>> allows High performance.
>>> Limited by My HP10811 Ref OSC, I'm getting better than 1e-12 in 0.1 sec (at 
>>> 30 Hz Bandwidth)
>>> 
>>> Basic modified NIST Block Diag attached:
>>> The NIST paper sums it up quite nicely:
>>> 'It is not difficult to achieve a sensitivity of a part in e14 per Hz 
>>> resolution
>>> so one has excellent precision capabilities with this system.'
>>> 
>>> This does not address your other question of ADEV vs MDEV,
>>> What I've described is just a simple way to get the Low cost, GOOD Raw data.
>>> What you then do with that Data is a different subject.
>>> 
>>> You can run the raw data thru one of the many ADEV programs out there, 
>>> 'Plotter' being my choice.
>>> 
>>> 
>>> Have fun
>>> ws
>>> 
>>> *************
>>> 
>>> [time-nuts] ADEV vs MDEV
>>> Pete Rawson peterawson at earthlink.net
>>> Sat Feb 6 03:59:18 UTC 2010
>>> 
>>> Efforts are underway to develop a low cost DMTD apparatus with
>>> demonstrated stability measurements of 1E-13 in 1s. It seems that
>>> existing TI counters can reach this goal in 10s. (using MDEV estimate
>>> or 100+s. using ADEV estimate). The question is; does the MDEV tool
>>> provide an appropriate measure of stability in this time range, or is
>>> the ADEV estimate a more correct answer?
>>> 
>>> The TI performance I'm referring to is the 20-25 ps, single shot TI,
>>> typical for theHP5370A/B, the SR620 or the CNT81/91. I have data
>>> from my CNT81showing MDEV < 1E-13 in 10s. and I believe the
>>> other counters behave similarly.
>>> 
>>> I would appreciate any comments or observations on this topic.
>>> My motivation is to discover the simplest scheme for making
>>> stability measurements at this performance level; this is NOT
>>> even close to the state-of-the-art, but can still be useful.
>>> 
>>> Pete Rawson
>>> 
>>> 
>> 
>> 
>> 
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>> 
>> 
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> 
> 
> 
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