On 10.04.22 04:47, g...@hoffmann-hochfrequenz.de wrote:
Am 2022-04-09 20:35, schrieb Lux, Jim:
On 4/9/22 10:03 AM, use...@teply.info wrote:
On 09.04.22 15:31, Richard (Rick) Karlquist wrote:
I am seeing a lot of unsupported "theories" about what should be
done to make devices with low 1/f noise. It might be instructive
for everyone
to read Marv Keshner's PhD dissertation (Stanford) discussing 1/f
noise.
He looks at all kinds of theories and shows that there is no valid
cookbook for how to make low 1/f noise devices. It's the classic
non reproducible process. I remember an FCS
talk many years ago that NIST guru Fred Walls gave with some theory
on how to get low 1/f noise. Unlike his other papers which were
well received (and rightly so), this one was rapidly debunked.
I felt bad for Fred, getting out too far over his skills.
Thanks for the hint towards the thesis, I'll ask our library to fetch
a copy.
Recently I was discussing some measurement results with my colleagues
as we're trying to come up with a low noise JFET which can
successfully be integrated into a SiGe BiCMOS process, and quite
often we're also struggling to identify why exactly variant A has
significantly lower noise than variant B, or why a new approach does
not improve noise the way it was expected.
So from a manufacturing process design point of view, achieving low
1/f noise indeed is closer to sheer dumb luck than the proverbial
"more art than science" suggest.
This is very, very true. Some manufacturers get very low noise or very
low leakage (or both), essentially by being "lucky". From what I've
been told, there's no good models, nor predictions - so people share
"lore" of "if you get these 2Nxxxx FETs from the mfr in England,
they're really good" until they aren't. There isn't enough market
for these, so I suspect research money to "solve the problem" isn't
available.
Buy a life time supply while they are available. One reel will probably do.
Unfortunately, that's not always an option. Sometimes you only learn
that Part A is exceptionally good only when it isn't anymore. One of our
customers got bitten by that, relying on parts which exceeded specs
until they got transferred to another fab. Afterwards, the part still
met their specs, but didn't meet the customers requirements. Of course
the manufacturer put in some effort trying to make the device as good as
it was because it was a good customer, but there's only so much effort
you can justify for 100k parts a year. For small-value varicaps, where
you can dice easily 30k-50k pieces out of a single wafer, the customer
would happily have bought a full manufacturing lot had they known before
the fact.
Like all those microwave MMICs with low noise, they worry about 100
MHz and up (if not 1GHz), they certainly don't worry (or control) for
noise at 5 MHz, or where the 1/f knee is. So just because you got good
results with a batch of them, the next batch might not. It's not even
clear you could come up with a standardized test method, because the
noise depends on a lot of other factors (drain current, for instance).
> When it changes from lot to lot, then you have lost. You cannot catch
that on the wafer tester. No one can pay for the tester time.
A simple BJT or FET circuit is allotted a ms or so in total, maybe.
You cannot measure 1/f in the 100 Hz range in that time. The picture
of the FET amplifier I had 3 days ago took 35 minutes, per trace.
By far, most of the wall time is aquisition time for the lowest octaves.
It depends a bit on the needs. Whether we're talking about DC, analog,
RF or digital testers for example. But even for the most complex tests,
tester time is cheap compared to engineering time for test setup.
But of course you're right, as 1/f takes long, one will have to trade
test time versus lower frequency corner and sample count. Doing full
manufacturing screening (as in test every single manufactured device) is
prohibitively costly more or less independent of lower frequency corner
for all but the most demanding applications. Testing a dozen devices out
of a full wafer (with, say, 10 k devices per wafer) is manageable. Last
year I measured a few samples for 1/f down to 0.01 Hz. That's a matter
of starting the measurement on friday afternoon and then going home for
the weekend. Next sample on the next weekend ;-) There was no point in
starting the measurement before friday afternoon in any case as during
the week the environment was more noisy than the DUT...
Florian
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