I think this is a lot like the fable about belling the cat (where the
mice decide it would be nice if the cat wore a bell, so it could not
sneak up on them).  All the mice agreed it was a great plan, until one
old spoil-sport asked who was going to bell the cat.  What I'm saying is
that while this is a good idea in principal, the devil is in the
details.  Consider the easiest portion of the task, controlling cable
radiation.  This is easily done up to 1 GHz with a current probe.  I
believe there may be some current probe models now with ranges above 1
GHz.  Regardless, at frequencies where the cable-under-test is
electrically long, the current probe must be slid up and down the entire
length of the cable to find a current maximum at each frequency.  In
order to have a meaningful limit, you would have to determine a
reasonable worst case cable radiation efficiency as a function of
frequency.

Emissions from enclosures follow the same physics but the application is
much more difficult.  Having measured and maximized surface currents,
how do you then apply a reasonable worst case model to estimate the
resultant electromagnetic field.  This will strongly be a function of
EUT enclosure geometry.  Unlike cable lays, there is no simple model for
how surface currents would launch an electromagnetic wave.

I join contributor [email protected] in wishing you good luck!
> -----Original Message-----
> From: Lou Gnecco [SMTP:[email protected]]
> Sent: Thursday, June 17, 1999 7:24 AM
> To:   [email protected]
> Subject:      Re: NEAR/ FAR FIELD CORRELATION ISSUES
> 
> 
> Arun:
>         I heartily agree  with everything you said. Well done!
> 
>         It will not be easy to sell this idea to the emc world.
> When the standards are vague, acane and constantly-changing, and when
> it is
> unnecessarily expensive to set up and perform a test, this constitutes
> what
> is known in business as a "Barrier To Entry" that is, a way to
> artificially
> limit competition. Test laboratories (like us, for example) can charge
> more
> money when there are barriers to entry.  
>         People who make special instruments and antennas for EMC
> testing
> (like us) would lose out if there were fewer barriers to entry. Also
> people
> who install & test shielded rooms, etc. There are substantial
> entrenched
> interests whose rice bowls would be threatened if emc became something
> anyone could do. 
> 
>         I personally believe that the process can and should be
> simplified. 
> It would help the manufacturers, who are the ones that really drive
> the
> economy. 
> It would specially help small manufacturers. 
> 
>         Like us.
> 
> Lou 
> 
> 
> At 11:18 AM 6/17/99 +1000, you wrote:
> >
> >
> >Greetings and Salutations! I was wondering if this could be mailed
> out via
> >the epc-pstc channels. 
> >
> >I want to know if anyone is doing any work in "near/ far field
> correlation
> >to commercial EMC standard limits" area and possibly correspond with
> them
> >with a view to exchanging notes.
> >
> >Brief Follows:
> >
> >Brief:
> >
> >"Application of Near Field and possibly Surface probe techniques in
> >Evaluating Emissions from source equipment and
> correlating/quantifying this
> >data to an OATS, LISN, Absorbing Clamp etc based measurement.."
> >
> >Details:
> >
> >We assume that the current EMC compliance regime around the world has
> >quantified limits of compliance to which if every source equipment
> adheres
> >to, then it has a reasonable chance of performing as intended in a
> real life
> >situation, noting that the immunity threshold test levels are much
> more
> >stringent than EM emission limits.
> >
> >Current EMC measurements are very cumbersome, require large expense
> in
> >setting up and maintaining (calibrating) OATS, LISNS, Absorbing
> Clamps,
> >Ferrite tiled lined semi- anechoics etc. Despite this expense, the
> >measurement uncertainities are still of the order of 6 to 10dB
> (inherent).
> >
> >Every newly released EMC standard by IEC CISPR or CENELEC has
> potentially
> >new transducers and new headaches from point of view of sourcing and
> >maintenance, calibration.  EMC today is where Safety was 10 years
> ago. I am
> >of the opinion that EMC testing should be simplified and reasonably
> >accessible to all end users.
> >
> >Continued progress and urban development has led to increasing levels
> of
> >broad and narrowband noise to the extent that ambient profiles
> sometimes
> >swamp out the limits; this has led to most test houses in the EU to
> opt for
> >GTEMS or semi-anechoics (referred to as "alternative all weather test
> >sites") at considerable expense. 
> >
> >Current techniques such as emission E Field prescanning in shielded
> rooms
> >prior to OATS based testing with biconilog antennae have the
> drawbacks of
> >"peaking" the emissions and reflections/standing waves.
> >
> >Hence: 
> >
> >I propose to develop near or surface probe H (inverse of E)  field
> >techniques which actually senses the emission profiles and correlate
> them to
> >an Absorber clamp, or OATS or LISN (Common mode fix) or whatever.
> Cables,
> >panels, slots etc could be "sniffed" with a Loop and if it is
> possible to
> >correlate this near or induction field data to compliance limits then
> it
> >becomes very easy for individuals and organisations to do
> precertification.
> >Transducers could be simple and light weight, rugged, and physically
> defined
> >so that minimal calibration is required. EMI receivers will still
> need
> >calibration.
> >
> >With these techniques, you measure actually what comes off the source
> and
> >not the "peak" value of the bounced and direct rays within say the
> Fresnel
> >ellipse, or move the Absorbing clamp up and down the rail and peak
> the
> >field.
> >
> >Conducted emissions could be scanned by common mode techniques and
> radiated
> >emissions by  surface or near scans. 
> >
> >Currently, these techniques are used only qualitatively for
> precompliance at
> >board levels and more work needs to be done to bring them of age and
> >reliability. (Am I right?)
> >
> >What I am proposing has a corollary with the bulk current or damped
> sinusoid
> >(NEMP- Nuclear EM Pulsing) or lightning injection techniques (CS 114,
> 115
> >and 116 of 462D). With these methods, it was possible to achieve
> identical
> >or several orders of magnitudes higher levels of RF injection power
> at a
> >fraction of the cost of say an RS03 OR RS05(at least for the bulk
> cable
> >loom!). What resulted was a cheap, powerful and a more repeatable
> test. 
> >
> >
> >
> >Arun Kaore
> >EMC Engineer
> >
> >ADI Limited 
> >Systems Group
> >Test & Evaluation Centre
> >Forrester Road, St Marys, NSW 2760
> >P O Box: 315, St Marys NSW 1790
> >
> >Tel: 61 2 9673 8375
> >Fax: 61 2 9673 8321
> >Email: [email protected]
> >
> >
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> >
> >
> 
> 
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