In message <9CDAF73DC0CB442B85AB1E465A56B716@MmPc21>, dated Thu, 6 Nov 2008, Piotr Galka <[email protected]> writes:
>I plan to produce the electronic education system. >If I have the PCB with single transistor amplifier (or some OpAmp >circuit) to allow pupil to measure it I have to make all pins >accessible at least to allow for connecting the scope probe. I think I >cannot protect each pin against ESD because my protection elements will >certainly disturb the measurement results making them different from >theory - for me unacceptable from education point of view. In the early days of the old Directive, it was considered that educational products did not have to be tested but that Article 4 applied: if interference occurred it must be prevented. I don't see anything about this in a quick scan of the current Directive or its guidelines, but I think it should be obvious that educational products have to be treated as a special case. Maybe they are not 'apparatus' as defined in the Directive, as they are not 'finished appliances'. -- OOO - Own Opinions Only. Try www.jmwa.demon.co.uk and www.isce.org.uk Either we are causing global warming, in which case we may be able to stop it, or natural variation is causing it, and we probably can't stop it. You choose! John Woodgate, J M Woodgate and Associates, Rayleigh, Essex UK - This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. Website: http://www.ieee-pses.org/ To post a message to the list, send your e-mail to [email protected] Instructions: http://listserv.ieee.org/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas [email protected] Mike Cantwell [email protected] For policy questions, send mail to: Jim Bacher: [email protected] David Heald: [email protected] All emc-pstc postings are archived and searchable on the web at: http://www.ieeecommunities.org/emc-pstc
