On Thursday, April 23, 2020 at 3:10:36 PM UTC-7, gregebert wrote:
> I'm absolutely certain the MJE die is physically larger. For one thing, 
it must conduct more thermal energy to the case.

I am inclined to agree, but if it were me, I would be willing to invest 
$1.08 and a half hour in the experiment.


> Another tip-off is the difference in DC current-gain, and that in-turn 
accounts for part of the 1000x difference in leakage 
> current.  I believe leakage current is directly proportional to the area 
of the base (my device physics textbook is at work,
> and I'm at home recalling a class I took in 1983...); the actual 
leakage-current density is an exponential equation based
> on all sorts of properties of the silicon.

All other things being equal, I would expect leakage to be roughly 
proportional to the chip are, which would not account for the 1000X.  Also, 
some specs in the data sheet are very loose, like guaranteed maximum 
leakage.  If the base and emitter are both diffused, I would expect these 
variations to swamp out the area.  How do they get the HV capability?  If 
it is an epi base layer, there would be variations due to the quality of 
the epitaxy that could affect the leakage.  That is a long way of saying 
that you might be right, but I don't know.


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