Dear colleagues,
Is there anybody who has experience with describing peak shapes
using the fundamental parameters approach for a typical X'pert-pro
diffractometer setup with an X'celerator detector (fixed incident
slits, 0.02 rad sollers, no monochromator)?
Thanks in advance, Arie
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A. van der Lee
Institut Europ�en des Membranes (UMR 5635)
Universit� de Montpellier II - cc 047
Place E. Bataillon
34095 Montpellier Cedex 5
FRANCE
visiting address: 300 Av. Prof. E. Jeanbrau
t�l.: 00-33-(0)4.67.14.91.35
FAX.: 00-33-(0)4.67.14.91.19
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