Arie,

Bob Cheary developed the required description/equations for the use of a psd. But I don't know that they have been implemented in any of the available FPA codes, except perhaps Topas in launch mode.

Alan???  Are you listening?

Regards,

Jim

At 06:48 AM 5/2/2005, you wrote:
Dear colleagues,

Is there anybody who has experience with describing peak shapes
using the fundamental parameters approach for a typical X'pert-pro
diffractometer setup with an X'celerator detector (fixed incident
slits, 0.02 rad sollers, no monochromator)?

Thanks in advance, Arie

*******************************************
A. van der Lee
Institut Europ�en des Membranes (UMR 5635)
Universit� de Montpellier II - cc 047
Place E. Bataillon
34095 Montpellier Cedex 5
FRANCE

visiting address: 300 Av. Prof. E. Jeanbrau

t�l.: 00-33-(0)4.67.14.91.35
FAX.: 00-33-(0)4.67.14.91.19
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James P. Cline [EMAIL PROTECTED]
Ceramics Division Voice (301) 975 5793
National Institute of Standards and Technology FAX (301) 975 5334
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