Re: [PSES] What is a Test Plan?

2013-10-11 Thread Conway, Patrick
Tony –
If “Test Plan” is re: EMC, then in some cases
there are requirements for content.

Try this search result (2 pages) for some examples:
http://www.everyspec.com/DATA-ITEM-DESC-DIDs/DI-EMCS/

//
Patrick
pcon...@ball.commailto:pcon...@ball.com
303.533.7165
303.408.9904 (cell)
Westminster, CO 80021

From: Anthony Thomson [mailto:ton...@europe.com]
Sent: Thursday, October 10, 2013 8:56 AM
To: EMC-PSTC@LISTSERV.IEEE.ORG
Subject: [PSES] What is a Test Plan?

What is a Test Plan? What should a Test Plan contain?

My questions are intentionally vague and I ask this Group in the context of the 
interests of this group.

Thanks in advance for your input,
Tony.


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[PSES] user's group ??

2013-01-11 Thread Conway, Patrick
We are considering new automation tools for some of our MIL-STD-461 and
DO-160 tests.

I am hoping that there are user's groups or forums for some of the more
popular software packages.

 

Does anyone know of, or belong to, forums for TILE!, EMC Automation
(TDK), RadiMotion (DARE!!), EMITest (CKC), or any other?  

 

Thanks in advance.

//

Patrick Conway

pcon...@ball.com

303.533.7165

Wetmoor WMR1

Westminster, CO 80021

 




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Re: [PSES] Light Bulb provokquium

2012-08-24 Thread Conway, Patrick
q the industry wouldn't have ... if the ban hadn't been introduced q

...so, industry didn't build that, the gov't did?

(weak attempt at election year humor)

//
Patrick 

-Original Message-
From: John Woodgate [mailto:j...@jmwa.demon.co.uk] 
Sent: Friday, August 24, 2012 9:25 AM
To: EMC-PSTC@LISTSERV.IEEE.ORG
Subject: Re: [PSES] Light Bulb provokquium

In message 
CAByvTVPDdQ343GbF8=AxXZSgajd7cvH1Q=P2zp98Q+QHAD-=c...@mail.gmail.com, 
dated Fri, 24 Aug 2012, Doug Powell doug...@gmail.com writes:

Make the alternative bulbs economically competitive and dump the 
legislation.

Chicken and egg; the industry wouldn't have spend a lot of RD $$$ on 
CFLs and LED lamps if the ban hadn't been introduced. Prices are coming 
down, but not equal yet.
-- 
OOO - Own Opinions Only. Try www.jmwa.demon.co.uk and www.isce.org.uk
Instead of saying that the government is doing too little, too late or
too
much, too early, say they've got is exactly right, thus throwing them
into
total confusion.
John Woodgate, J M Woodgate and Associates, Rayleigh, Essex UK

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Re: [PSES] Smart Batteries

2012-08-23 Thread Conway, Patrick
Another difference is tested  vs. qualified.

 

In the MIL world the emc testing of a stand-alone smart-battery *may be*
used for qualification, depending on the procurement.

In the commercial world the emc testing of a stand-alone smart-battery
*cannot be* used for qualification, due to the lack of intrinsic
function.

 

//

Patrick 

 

From: Ken Javor [mailto:ken.ja...@emccompliance.com] 
Sent: Thursday, August 23, 2012 11:02 AM
To: EMC-PSTC@LISTSERV.IEEE.ORG
Subject: Re: [PSES] Smart Batteries

 

The difference is that in the case of stand-alone batteries, they are
qualified without connection to the equipment in which they are meant
to be used... .  Instead, they are connected to a generic load
representative of in situ current draw, and a fixed potential charging
source with fixed low output resistance.
  
Ken Javor
Phone: (256) 650-5261





From: Bill Owsley wdows...@yahoo.com
Reply-To: Bill Owsley wdows...@yahoo.com
Date: Thu, 23 Aug 2012 09:51:30 -0700 (PDT)
To: Ken Javor ken.ja...@emccompliance.com, emc-p...@ieee.org
emc-p...@ieee.org
Subject: Re: Smart Batteries

It must be in the syntax, but it seems these two just agreed on the
subject.

  
 
 
  



 From: Ken Javor ken.ja...@emccompliance.com
 To: emc-p...@ieee.org 
 Sent: Thursday, August 23, 2012 12:34 PM
 Subject: Re: Smart Batteries
  
 
Re: Smart Batteries 
That is simply not true in the general case.  What about a 28 Vdc
battery that backs up the essential bus on an aircraft? What about a
MANPACK battery that is discharged while being worn, and connected to a
mains or generated-powered charger after the mission is over.

In the commercial world, what about a battery designed to be used in an
UPS? I have purchased several replacement batteries designed to replace
the OEM battery in same.
  
Ken Javor
Phone: (256) 650-5261





From: Cortland Richmond k...@earthlink.net
Reply-To: k...@earthlink.net
Date: Thu, 23 Aug 2012 11:58:15 -0400
To: emc-p...@ieee.org
Subject: Re: Smart Batteries

   
Smart batteries are electronic subassemblies that don't work properly
outside of the equipment in which they are meant to be used and must be
tested in it.
 
 Cortland Richmond
 
 On 8/22/2012 1243, rehel...@mmm.com wrote:
 
 

Can someone tell me if there are any EMC standards for the so-called
smart batteries? These are batteries that communication with the
charger or EUT for charge rates, time left, overheating, etc. 
 
 Thanks,
 Bob Heller
 St. Paul, MN 55107-1208
 Tel: 651-778-6336
 Fax: 651-778-6252
 


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Re: [PSES] Smart Batteries

2012-08-23 Thread Conway, Patrick
q It was like testing fuses q

Exactly!  Most smart-batteries have non-resettable fuses designed to be tripped 
by over-temp.  Originally thought to protect the chemistry from reaching 
ignition temps.  But as Ed found, also a very good one-time RF detector!

//
Patrick 

-Original Message-
From: Ed Price [mailto:edpr...@cox.net] 
Sent: Thursday, August 23, 2012 1:21 PM
To: EMC-PSTC@LISTSERV.IEEE.ORG
Subject: Re: [PSES] Smart Batteries

At my previous employer, we began using smart batteries around 6 years
ago. These batteries were mounted into a soldier-worn fabric harness, and
were the power source for both the optical detectors  signal processing
equipment, plus the pulsed 20 Watt peak RF data transceiver. Batteries were
charged in a shop environment, then plugged into the soldier harnesses and
used in the operational environment for a few days (either before the
training scenario ended or a fresh battery was installed). Thus, MIL-STD-461
dictated testing in two environments; the stringent operational environment
(imagine a squad hopping on a helicopter, with all transceivers chirping
away and subject to the airborne RF environment) and the much less stringent
charging environment (imagine the corner of a storage shed, with a few dozen
batteries sitting in charging trays).

The first time I encountered these batteries, I didn't realize that they had
built-in microprocessors that never turned off. In addition to the normal
user noise problems, I now had what had always been considered to be a
passive device contributing its own EMC problems.

One interesting thing was that these smart batteries had a rather
long-period, short duration mode in which the battery brains would call for
a capacity test that created a quick noise burst. Another problem was that
the battery manufacturers were (initially) very EMC naive; no shielding,
long internal sensor leads that acted like little antennas and fed directly
into microprocessor inputs, apparently no history of ever doing any previous
component-level EMC investigation.

So these batteries had emission and immunity problems all by themselves, and
we had to adopt several less-than perfect fixes in order to use them. We
went through powerline filtering, discrete harness pouch shields, wrapping
foil around the batteries, and even to conductive fabric harness pouches.

And then, after we got happy with our fixes, we suddenly began having many
field failures, dead batteries everywhere! It seems that we had changed
battery vendors, and the new vendor had an internal design that was an
extremely good RF detector. Batteries could be killed with only a few V/M
(you could get 10 V/M from a cell phone at 6-foot separation, and anyway,
461 defined a 50 V/M requirement)! Investigation revealed that the batteries
were also very position and polarization sensitive; they might survive 50
V/M from the front, but roll them 90 degrees and expose the back, and the
microprocessor goes to silicon heaven in microseconds. The culprit turned
out to be the wiring for inter-cell temperature sensors; these fed the RF
directly into the microprocessor. During the course of one investigation, I
was directed to expose 25 batteries to varying positional and RF level
exposures; not one battery was alive by the time I was up to 20 V/M. It was
like testing fuses. We got that problem under control by going back to the
old vendor, and fortunately, since the batteries were designed to be easily
replaceable, there was no major field-fix problem. 

Since that was over 5 years ago, I would hope that smart battery vendors
would have become much more familiar with RF techniques and have hardened
their designs to withstand the commercial and military environments. OK,
this turned into a war story, but the lesson is that a smart battery now has
every EMC vulnerability itself, and has to be tested in every operational
and support mode associated with your product.


Ed Price
El Cajon, CA
USA
 

-Original Message-
From: Brian Oconnell [mailto:oconne...@tamuracorp.com] 
Sent: Wednesday, August 22, 2012 1:47 PM
To: EMC-PSTC@LISTSERV.IEEE.ORG
Subject: Re: [PSES] Smart Batteries

Ken,

For MS461, did you test the batteries as a seperate item, or as part of a
charger or the end-use unit?

Brian

-Original Message-
From: emc-p...@ieee.org [mailto:emc-p...@ieee.org]On Behalf Of Ken Javor
Sent: Wednesday, August 22, 2012 10:55 AM
To: emc-p...@ieee.org
Subject: Re: Smart Batteries

Not what you personally are looking for, but in the military world
MIL-STD-461 applies to such batteries just as to any other item that
contains electronics.  I have tested them and found them susceptible, albeit
at field intensities much higher than required in the commercial world.

Ken Javor
Phone: (256) 650-5261



From: rehel...@mmm.com
Date: Wed, 22 Aug 2012 11:43:03 -0500
To: emc-p...@ieee.org
Subject: Smart Batteries

Can someone tell me if there are any EMC standards for the so-called smart
batteries? These 

Re: [PSES] Safety cost and ESD

2012-04-25 Thread Conway, Patrick
 Opinions whether this is a 'respectable' test technique? 

In my opinion, your technique legitimate.  I observe that the entire
world of ESD testing is centered around a defined stimulus of current
and voltage.  Any time a zap deviates from this then it is not part of
a test.  

This has two effects on testing of a floating apparatus.  The first
effect is with the second ZAP.  Without a bleed of charge the second ZAP
no longer conforms.  It is no longer a X kV ZAP.  The display on the
ESD gun reads X volts, which is between ESD gun tip and ground.  But
since the apparatus is no longer @ ground potential, the X voltage
reading is invalid.  And the same is true for the third, fourth, etc.  

The second effect is the one discussed in this thread- where the bleed
happens with a strap.  The wave shape of current during that event is
undefined.  Any response from the apparatus during the bleed event is
not part of the test and cannot be considered in the pass/fail criteria.


My opinion only...
//
Patrick 

-Original Message-
From: Brian Oconnell [mailto:oconne...@tamuracorp.com] 
Sent: Tuesday, April 24, 2012 6:05 PM
To: EMC-PSTC@LISTSERV.IEEE.ORG
Subject: Re: [PSES] Safety cost and ESD

For automotive stuff (ISO10605), I have to be careful about bleeding
charge
after each iteration because test level = 25kV. I use a 470k Resistor
attached in series with a short braid that is screwed into the ref
plane,
and touch the UUT. The strap is used for discharge only and is not
attached
during testing.  I have seen the commercial CISPR25 labs do similar.

I have not seen the discharge create additional problems - perhaps I
have
just been lucky. Opinions whether this is a 'respectable' test
technique?

Brian

-Original Message-
From: emc-p...@ieee.org [mailto:emc-p...@ieee.org]On Behalf Of Conway,
Patrick
Sent: Tuesday, April 24, 2012 3:53 PM
To: McInturff, Gary; EMC-PSTC@LISTSERV.IEEE.ORG
Subject: RE: [PSES] Safety cost and ESD

This is a classic test problem.  I've seen this several times.  For this
setup, there is no place for the charge to dissipate between zaps.  So,
how
to discharge between zaps?  The easy answer  is to briefly connect a
strap
from apparatus to ground.  But that casues lots of problems, including
false
failures.
 
The reason?  The discharge created when using a zero Ohm strap is
uncontrolled.  If you remove the bleed resistor, then the discharge is
not
bleeding slowly, it becomes another form of an ESD discharge.  The
problem
is that the waveform will not be representative of the human-body-model.

 
Designers of ESD equipment go to a lof trouble designing those ESD guns.
They must conform to an exact waveshape.  But the zero-Ohm ground strap
has
none of the circuit elements to shape the curve.  So there is a
likelyhood
of a faster rise time, more ringing, etc.  All things that no longer
represent the HBM.If ths waveshape causes upset in the appratus it
cannot be considered a failure since the waveform is not HBM.
 
Check with your customer on how they are testing.  If the appratus
survives
the zap from the gun, but is upset when they discharge with the strap,
then
you have the asnwer.  The easy solution for Test is to place the bleed
resistor back into the discharge strap and see if the appratus survives.

 
The zero Ohm ground strap is not a real-world HBM scenario, and
certainly
not in conformance with EN61000-4-2 or any of the HBM standards.  On the
other hand, if your product is not subject to HBM, or your product needs
testing to a user-scenario that includes a strap discharge, then that is
a
perfectly good test.
 
//
Patrick
 

 
Different question about ESD.
 
I have a component we tested on the normal 55024 directed ESD table for
a
table top mounted device. Worked fine, problem is that the customer
places
this on a large metallic roll around pedestal on rubber wheels. When
they
send it to a lab and test it this way there is a problem. I don't have
the
pedestal so I'm trying to simulate with my table and removing the 1 mohm
bleeder resistor. Between discharges to the table, I ground a braided
strap
attached to the table top to my reference plane below. I get very
similar
results then. What should the braid really look like - should it just be
a
short, should it have some bleed resistance in it. I chose none since
the
discharge is going to be people touching the pedestal or other furniture
that is grounded. 
 
What does the standard say about  the VCP and HCP?
 
Gary McInturff
Reliability/Compliance Engineer  

 
//
Patrick 
 
From: McInturff, Gary [mailto:gary.mcintu...@esterline.com] 
Sent: Monday, April 23, 2012 12:37 PM
To: EMC-PSTC@LISTSERV.IEEE.ORG
Subject: [PSES] Safety cost and ESD
 
Given the implementation differences between US/Canada(?) and EU on the
medical 60601-1 standards. EU the June, US June 2013. How are folks
handling
new products being introduced now or in the very near future? Just got a
quote back

Re: [PSES] Safety cost and ESD

2012-04-25 Thread Conway, Patrick
I do have one story from the trenches, involving a laptop, ESD and
non-standard testing.  

...back in the day, at a previous company...  

we had a customer complaint about a mysterious lockup.  There is a
side-story about sales, management, pressure, schedule, cost and all
that noise.  But sparing that, the lockup could only be duplicated by
floating the laptop and discharging to the MODEM connector several
times.  No bleed-off between zaps.  Eventually a secondary discharge was
heard inside the laptop.  

Apparently the MODEM circuit has some floating circuits due to TELCO
hi-pot requirements.  The circuit did fine under TELCO testing, which I
recall went to 3kV.  But if the stored charge in the MODEM circuit got
to about 7 kV, then there was a secondary arc to another circuit and
havoc ensued.

It was an interesting lesson for me about the (negative)virtues of
isolated circuits inside an apparatus.  As far as I know, this type of
test was never adopted by any standards body, but it became a regular
part of my internal engineering testing.  


//
Patrick 


-Original Message-
From: Brian Oconnell [mailto:oconne...@tamuracorp.com] 
Sent: Tuesday, April 24, 2012 6:05 PM
To: EMC-PSTC@LISTSERV.IEEE.ORG
Subject: Re: [PSES] Safety cost and ESD

For automotive stuff (ISO10605), I have to be careful about bleeding
charge
after each iteration because test level = 25kV. I use a 470k Resistor
attached in series with a short braid that is screwed into the ref
plane,
and touch the UUT. The strap is used for discharge only and is not
attached
during testing.  I have seen the commercial CISPR25 labs do similar.

I have not seen the discharge create additional problems - perhaps I
have
just been lucky. Opinions whether this is a 'respectable' test
technique?

Brian

-Original Message-
From: emc-p...@ieee.org [mailto:emc-p...@ieee.org]On Behalf Of Conway,
Patrick
Sent: Tuesday, April 24, 2012 3:53 PM
To: McInturff, Gary; EMC-PSTC@LISTSERV.IEEE.ORG
Subject: RE: [PSES] Safety cost and ESD

This is a classic test problem.  I've seen this several times.  For this
setup, there is no place for the charge to dissipate between zaps.  So,
how
to discharge between zaps?  The easy answer  is to briefly connect a
strap
from apparatus to ground.  But that casues lots of problems, including
false
failures.
 
The reason?  The discharge created when using a zero Ohm strap is
uncontrolled.  If you remove the bleed resistor, then the discharge is
not
bleeding slowly, it becomes another form of an ESD discharge.  The
problem
is that the waveform will not be representative of the human-body-model.

 
Designers of ESD equipment go to a lof trouble designing those ESD guns.
They must conform to an exact waveshape.  But the zero-Ohm ground strap
has
none of the circuit elements to shape the curve.  So there is a
likelyhood
of a faster rise time, more ringing, etc.  All things that no longer
represent the HBM.If ths waveshape causes upset in the appratus it
cannot be considered a failure since the waveform is not HBM.
 
Check with your customer on how they are testing.  If the appratus
survives
the zap from the gun, but is upset when they discharge with the strap,
then
you have the asnwer.  The easy solution for Test is to place the bleed
resistor back into the discharge strap and see if the appratus survives.

 
The zero Ohm ground strap is not a real-world HBM scenario, and
certainly
not in conformance with EN61000-4-2 or any of the HBM standards.  On the
other hand, if your product is not subject to HBM, or your product needs
testing to a user-scenario that includes a strap discharge, then that is
a
perfectly good test.
 
//
Patrick
 

 
Different question about ESD.
 
I have a component we tested on the normal 55024 directed ESD table for
a
table top mounted device. Worked fine, problem is that the customer
places
this on a large metallic roll around pedestal on rubber wheels. When
they
send it to a lab and test it this way there is a problem. I don't have
the
pedestal so I'm trying to simulate with my table and removing the 1 mohm
bleeder resistor. Between discharges to the table, I ground a braided
strap
attached to the table top to my reference plane below. I get very
similar
results then. What should the braid really look like - should it just be
a
short, should it have some bleed resistance in it. I chose none since
the
discharge is going to be people touching the pedestal or other furniture
that is grounded. 
 
What does the standard say about  the VCP and HCP?
 
Gary McInturff
Reliability/Compliance Engineer  

 
//
Patrick 
 
From: McInturff, Gary [mailto:gary.mcintu...@esterline.com] 
Sent: Monday, April 23, 2012 12:37 PM
To: EMC-PSTC@LISTSERV.IEEE.ORG
Subject: [PSES] Safety cost and ESD
 
Given the implementation differences between US/Canada(?) and EU on the
medical 60601-1 standards. EU the June, US June 2013. How are folks
handling
new products being introduced

Re: [PSES] Safety cost and ESD

2012-04-24 Thread Conway, Patrick
This is a classic test problem.  I've seen this several times.  For this
setup, there is no place for the charge to dissipate between zaps.  So,
how to discharge between zaps?  The easy answer  is to briefly connect a
strap from apparatus to ground.  But that casues lots of problems,
including false failures.

 

The reason?  The discharge created when using a zero Ohm strap is
uncontrolled.  If you remove the bleed resistor, then the discharge is
not bleeding slowly, it becomes another form of an ESD discharge.  The
problem is that the waveform will not be representative of the
human-body-model.  

 

Designers of ESD equipment go to a lof trouble designing those ESD guns.
They must conform to an exact waveshape.  But the zero-Ohm ground strap
has none of the circuit elements to shape the curve.  So there is a
likelyhood of a faster rise time, more ringing, etc.  All things that no
longer represent the HBM.If ths waveshape causes upset in the
appratus it cannot be considered a failure since the waveform is not
HBM.

 

Check with your customer on how they are testing.  If the appratus
survives the zap from the gun, but is upset when they discharge with the
strap, then you have the asnwer.  The easy solution for Test is to
place the bleed resistor back into the discharge strap and see if the
appratus survives.  

 

The zero Ohm ground strap is not a real-world HBM scenario, and
certainly not in conformance with EN61000-4-2 or any of the HBM
standards.  On the other hand, if your product is not subject to HBM, or
your product needs testing to a user-scenario that includes a strap
discharge, then that is a perfectly good test.

 

//

Patrick

 



 

Different question about ESD.

 

I have a component we tested on the normal 55024 directed ESD table for
a table top mounted device. Worked fine, problem is that the customer
places this on a large metallic roll around pedestal on rubber wheels.
When they send it to a lab and test it this way there is a problem. I
don't have the pedestal so I'm trying to simulate with my table and
removing the 1 mohm bleeder resistor. Between discharges to the table, I
ground a braided strap attached to the table top to my reference plane
below. I get very similar results then. What should the braid really
look like - should it just be a short, should it have some bleed
resistance in it. I chose none since the discharge is going to be people
touching the pedestal or other furniture that is grounded. 

 

What does the standard say about  the VCP and HCP?

 

 

Gary McInturff

Reliability/Compliance Engineer

 

 

 

 

 

 

 

 

 

//

Patrick 

 

From: McInturff, Gary [mailto:gary.mcintu...@esterline.com] 
Sent: Monday, April 23, 2012 12:37 PM
To: EMC-PSTC@LISTSERV.IEEE.ORG
Subject: [PSES] Safety cost and ESD

 

Given the implementation differences between US/Canada(?) and EU on the
medical 60601-1 standards. EU the June, US June 2013. How are folks
handling new products being introduced now or in the very near future?
Just got a quote back and the US certifier wants to charge me twice once
for the 2nd edition and then to transition to the 3rd edition. I anyone
else running aground on this. Seems like this should be happening on
both sides of the pond - since a CB report to 3rd edition would run into
the second edition enforcement in the US (and maybe Canada - I don't
know their implementation date).

 

To be fair - I get good service once I get past the sticker shock and
don't have any complaints from that standpoint. In fact I enjoy the
engineering staff I work with.

 

Different question about ESD.

 

I have a component we tested on the normal 55024 directed ESD table for
a table top mounted device. Worked fine, problem is that the customer
places this on a large metallic roll around pedestal on rubber wheels.
When they send it to a lab and test it this way there is a problem. I
don't have the pedestal so I'm trying to simulate with my table and
removing the 1 mohm bleeder resistor. Between discharges to the table, I
ground a braided strap attached to the table top to my reference plane
below. I get very similar results then. What should the braid really
look like - should it just be a short, should it have some bleed
resistance in it. I chose none since the discharge is going to be people
touching the pedestal or other furniture that is grounded. 

 

What does the standard say about  the VCP and HCP?

 

 

Gary McInturff

Reliability/Compliance Engineer

 

 

 

 

Esterline Interface Technologies

Featuring

ADVANCED INPUT, MEMTRON, and LRE MEDICAL products

 

600 W. Wilbur Avenue

Coeur d'Alene, ID  83815-9496

Office:208-635-8306

Cell:  509 868 2279

Toll Free: 800-444-5923 X 1238

gary.mcintu...@esterline.com mailto:brian.s...@esterline.com 

 

 

www.esterline.com/interfacetechnologies
http://www.esterline.com/advancedinput 

 

Technology, Innovation, Performance...

 

 

-

RE: Mobile Phones in EMC Labs

2008-12-09 Thread Conway, Patrick R (bNB Houston)
That comment makes me think of the interference possibility from different TX
waveforms.

 

 I am curious- has anyone seen correlation between 

levels or quantity of interference

vs

the two phone types:  CDMA and GSM ?

 

 

In a non-lab environment, the actual interference from GSM is orders of
magnitude larger than CDMA.  

But what about in the lab environment?  

 

 

 

Best Regards,

Patrick.

p.con...@hp.com

281-514-2259

 

From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of Bob Richards
Sent: Tuesday, December 09, 2008 3:46 PM
To: ieee
Subject: RE: Mobile Phones in EMC Labs

 

Similar problem in our lab. The signal path between the cell tower and the
cell phone is so weak that the output from the cell phone is near max (my cell
phone battery drains pretty quickly as a result) which makes it easier for the
analyzer to pick it up.  Better quality cables have helped, but I always turn
off my cell phone when making radiated scans. I've never seen a problem with
any other tests.

 

Bob Richards, NCT.



--- On Tue, 12/9/08, Bill Owsley wdows...@yahoo.com wrote:

 

We used to pick up the cell phones, but then we fixed the cables and
connectors and now no more problems.  We routinely use cell phones while
testing and they are good indication when something is broken.

.

 

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RE: Microwave Oven Interference with 2.4Ghz Wireless LAN

2008-10-06 Thread Conway, Patrick R (Houston)
...circling back to an old thread:

What would happen if we placed 8 access points in a circle around some popcorn?
YouTube here we come!



Best Regards,

Patrick.
p.con...@hp.com



From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of Brian O'Connell
Sent: Monday, October 06, 2008 4:00 PM
To: emc-p...@ieee.org
Subject: RE: Microwave Oven Interference with 2.4Ghz Wireless LAN

Recently we added two new food blasters to the lunch room and noted that some 
office areas no longer had reliable network connect.

Installed some isolation transformers between building mains and the food 
blasters - no more complaints from the sales/accounting dweebs, or whatever 
they do. Also noted that some of the power to the lunch room does not have a 
separate ground wire - uses the metal conduit, which probably does not help 
much.

As for the specific ID of these iso transformers, hmmm... we no longer make 
this particular model.

But I am going to upgrade my tin-foil hat, as I very much suspect that the 
space aliens are using the 2.4GHz carrier to link our brains to the NSA 
computers...

luck,
Brian


From: emc-p...@ieee.org [mailto:emc-p...@ieee.org]On Behalf Of 
don_borow...@selinc.com
Sent: Monday, October 06, 2008 1:27 PM
To: emc-p...@ieee.org
Cc: brian_ku...@lecotc.com
Subject: Re: Microwave Oven Interference with 2.4Ghz Wireless LAN

Except for rebuilding the break rooms with foil-lined dry wall, metal flooring, 
screened windows, filtered power, waveguide-beyond-cutoff ventilation grills, 
and RF tight doors, I don't know there is much for a solution.

I was told that in one major Boeing plant, communications as 2.4 GHz is all but 
impossible -- there are microwave ovens scattered around the various break 
rooms running off of all three phases of the electrical power
(120/208 volts Y); and due to variety of manufacturers, generating RF during 
both polarities of each phase. In other words, continuous
2.4 GHz
RF.

Except for specialize industrial units, I don't think you will find microwave 
ovens running at any other frequency.

Don Borowski
Schweitzer Engineering Labs
Pullman, WA, USA




 Kunde, Brian
 brian_kunde@leco
 tc.com
To
 Sent by:  emc-pstc
emc-p...@ieee.org
 emc-p...@ieee.org
cc


Subject
 10/06/2008 01:02  Microwave Oven
Interference with
 PM2.4Ghz Wireless LAN










I have just received and interesting call from our IT guys in our production 
facility. They have installed a 2.4Ghz wireless LAN system in our production 
and stock room areas, which is a huge area, and which includes 13 Access Points 
and a couple dozen wireless devices such as bar code readers, computers, and 
printers.

They discovered that they are having a major interference problem which they 
have narrowed down to the Microwave Ovens in the two break areas.
Evidently, Microwave Ovens run at 2.45Ghz.

It would be very difficult to remove the ovens or to move the break areas.

Have any of you experts have experience with this issue?  Any suggestions?  Are 
new ovens better then older ones? Are the microwave ovens that run at a 
different frequency? Would it help to try and shield the ovens better?  Please 
help.

The Other Brian



LECO Corporation Notice:  This communication may contain confidential 
information intended for the named recipient(s) only. If you received this by 
mistake, please destroy it and notify us of the error.  Thank you.

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This message is from the IEEE 

RE: FM Modulator Information

2008-08-13 Thread Conway, Patrick R (Houston)
A family member forwarded the below email.
(I'm pleasantly surprised that they remember my field of work !)

Does anyone on this list subscribe to XM?
It would be interesting to know the details of the interference problem.



Best Regards,

Patrick Conway, NCE.
Hewlett-Packard Co.
p.con...@hp.com
281.514.2259
281-514.5473(fax)

~~


From: XM Radio [mailto:xmra...@xmradio.chtah.com]
Sent: Wednesday, August 13, 2008 9:11 AM
To:
Subject: FM Modulator Information


Dear XM Subscriber,

The FCC has notified XM that some of our older receiver models (generally, 
those purchased before August, 2006) may not operate in the manner required by 
the FCC and may cause interference to nearby FM radio users depending on how 
the XM radio is installed or used.

The receiver models include the Roady2(r), SKYFi2(r), MyFi(r), Airware(r), Tao, 
RoadyXT(r), Xpress(tm), Sportscaster, XR9-XCX9, Jensen JXR9, inno(r), 
Helix(tm), and Nexus(r). Please note this notice does not apply to you if your 
new car came installed with an XM receiver.

If you do have one or more of the receivers mentioned above and use it with the 
wireless FM option or you have had the receiver professionally installed, then 
we have several options available at no cost to you to alleviate this possible 
interference. Please visit our website at www.xmradio.com/fmmodinfo 
http://email.xmradio.com/a/hBIoukKB7RzePB7SVYU$Ka5GK0m/xm4  or call us 
toll-free at 866-410-0096 to choose one of the following three options:

Option A:
We will send you ferrite beads to attach to your XM antenna and power adaptor 
cables. (Ferrite beads are typically placed on the end of data cables to reduce 
interference.)

Option B:
We will send you a replacement cassette adapter to use with your XM radio. Only 
choose this option if your car radio has a cassette player.

Option C:
If your car does not have a cassette player, we will provide you with ferrite 
beads and an installation kit, with hardware, to use in connection with a 
professional installation of your radio along with a coupon redeemable at no 
charge for professional installation.

Please visit the following website, www.xmradio.com/fmmodinfo 
http://email.xmradio.com/a/hBIoukKB7RzePB7SVYU$Ka5GK0m/xm4  for more 
information and to select your option. If you do not have access to the 
Internet, you may call 866-410-0096 for information on how to alleviate this 
possible interference. To help expedite your order, please have your 8-digit 
Radio ID (found on Channel 0 of your XM radio) and your FCC ID (found on the 
back, the bottom, or under the battery of your XM radio), available when you 
start this process.

Thank you for your attention to this matter.

Best Regards,
XM Management

Note - If you are using your XM radio's FM modulator to send the XM signal to a 
home or car stereo, your radio will work best if you use an unused FM 
frequency. Go to www.radio-locator.com/cgi-bin/vacant 
http://email.xmradio.com/a/hBIoukKB7RzePB7SVYU$Ka5GK0m/xm5  to find the best 
FM frequencies to use in your area.



Please do not reply to this email. This is a service email from XM Satellite 
Radio. Please note that you may receive service email in accordance with your 
XM Satellite Radio Customer Agreement, whether or not you elect to receive 
promotional email.

XM Satellite Radio Inc., 1500 Eckington Place NE, Washington, D.C. 20002. 
Copyright 2008 XM Satellite Radio. All rights reserved.

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FW: EE Contract Opportunity

2008-08-13 Thread Conway, Patrick R (Houston)
Posting this as a favor to an outsider.
This is not connected to me or my employer.
Please contact the recruiter directly using the info at the bottom of the page.
 

Best Regards, 

Patrick. 
p.con...@hp.com 

 




From: Jennifer Bingham [mailto:jbing...@americancontractgroup.com] 
Sent: Wednesday, August 13, 2008 1:39 PM
To: p.con...@ieee.org
Subject: EE Contract Opportunity 



 ... wanted to let you know about a 6 month + E.E. (EMI) position in the
Chicago, IL area. Our client is looking for a U.S. citizen with a BSEE.
Following is a description of the job. Please contact me if you’re
interested and available. An updated version of your resume would be much
appreciated!

 

Description:

“Under the general supervision of the Director of Electrical Engineering and
the Project Engineer, this lead electrical engineer will have responsibility
for design and test work relating to system level electrical architecture,
power, thermal, shock, vibration, and EMI design for our next generation and
current products. The candidate must be able to work effectively as part of a
team that designs electrical and electro-electrical systems and work with
other engineers. Good communication skills are required to interact
effectively as part of a technical team, integrating mechanical, software, and
electrical designs.”

 

More specifically, this is what they’re looking for:

 

* BSEE

* 10-15 years related experience, at least 5 on DoD or equivalent
government contracts

* Ability to develop and support electrical and electronic concepts
from design through production

* Capability to conduct product design analysis and verification  

* Experience with Military Specifications and Standards

* Strong verbal and written communication skills

*US Citizen able to obtain DoD security clearance

 

 

Jenn Bingham 

American Contract Group

591 North Ave ,Suite 4, 2nd Floor

Wakefield MA, 01880

Toll Free Phone 877-723-9087 Ext 308

Phone 781-245-9000

Fax 781-245-9009

 

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RE: EMC in the news: RFID Medical

2008-06-27 Thread Conway, Patrick R (Houston)
 
This is great information.  
Thank you for providing some details.  
 
The comment: had an 868-MHz reader (2-4 W).   is informative.  It
indicates that the RFID was not the only transmitter in the proximity of the
medical EUT.  This RFID reader adds another parameter that requires control
and investigation during the test.  
 
continuing the list of possibilities:
 
f)  is it possible that the RFID tag has much less effect than that of the
RFID reader?
Would be informative to find out if the RFID reader, in the absence of the
tags themselves, can duplicate any of the EUT problems.

 

Best Regards, 

Patrick. 
p.con...@hp.com 

 




From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of Dean Gerard
(Medical Physics)
Sent: Friday, June 27, 2008 11:48 AM
To: emc-p...@ieee.org
Subject: FW: EMC in the news: RFID  Medical






Just nominal power outputs and separation distances between interfering and
susceptible equipment. 

Output info given is - 
 The passive RFID system selected for this study (OBID, Feig Electronic,
Weilburg, Germany) had an 868-MHz reader (2-4 W). The active RFID system

(Eureka RFID, Avonwood, England) had a 125-kHz reader (68_10E-3 µT at 1m)
that forces tags to transmit in its proximity. The active RFID tag had an
operational frequency of 868 MHz at 2 µW

Interference effects were provoked at separation distances ranging from 5 -
600cm, depending upon equipment affected. 



Ged Dean 
Nottingham University Hospitals NHS Trust 

 

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[SPAM] RE: EMC in the news: RFID Medical

2008-06-26 Thread Conway, Patrick R (Houston)
Gert-
You mention one possible reason for the test results is that the EUT's
have immunity deficits.
I agree, that is one possibility.  
 
here are a few other possibilities:   
(BTW- not affiliated in any way with medical devices nor with, all
comments OOO )
 
 
b)Could it be a systemic testing error?
Was a shield room used?   
Were the ambients controlled and eliminated?
Were the devices connected to a patient simulator?
Did the test engineer have his personal GSM phone OFF?  etc. 
(...crazier things have happened.)
 
 
c)Maybe the EUT are old.
Through outdated design specs perhaps RFID proximity was not a
consideration during their design.
And yet, in today's hospitals, the two types of devices may be in
close proximity.
If this is the case then the study has done a great service to the
community by uncovering a problem that was unknown.
 
 
d)Maybe the EUT are old (not a repeat) 
Through many years of use perhaps once immune equipment has lost
some of their designed immunity?
Again- if this is the case this study may have uncovered a
previously unknown problem.
 

e)Is it possible for an RF ID device to overwhelm the immunity levels of
the EUT?
If a medical device is tested at 10 V/m and an RFID device TXout is in
the mW range- is it possible for a RFID mW transmitter to generate 10 V/m?
Perhaps.
For instance- since an RFID device operating at 125 kHz in not
transmitting in the classic sense, then there may be near-field resonant
effects that are not previously understood in the medical device immunity
requirements?
   
 
 
It seems that we, as professionals in this field, have the unique ability
to analyze these reports like no other community can.  I wonder if we will
find the answers to the large number of questions raised by the article.  
 
 
 
All comments OOO.

Best Regards, 

Patrick. 
p.con...@hp.com 

 



From: Gert Gremmen [mailto:administra...@ce-test.info] 
Sent: Thursday, June 26, 2008 2:57 AM
To: Conway, Patrick R (Houston); Rudd, Adam; emc-p...@ieee.org
Subject: RE: EMC in the news: RFID  Medical



The report was produced by TNO, a Dutch private organization

(http://www.tno.nl/content.cfm?context
marktencontent=markt_persberichtlaag1=189item_id=200806250026Taal=2)

 

and some results are available here:

 

http://www.amc.nl/?pid=5266

 

Manufacturers name and equipment type included.

 

Please note that the energy levels of RFID are in the milliwatt range,

so all problems are to be categorized as immunity deficits.

 

 

It is astonishing that the security of healthy persons (like car drivers) 

is taken much more seriously (by car manufacturers for example )

as the security  of people with bad health like in hospitals.

Most medical equipment is tested  at 10 V/meter or less.

where critical car parts must  be tested up to 200V/m.

 

Cars are to be sold at low prices (relatively) , medical equipment

at sky-high costs.  It seems that emc quality is the inverse of the

costs of equipment. Where much attention is given to

reliability and electrical safety of medical equipment,

emc is still  neglected. 

Note that this investigation was made in a Dutch

University Hospital;

On  European soil , where immunity requirements have been 

virtually law since 1996 

 

The lack of EMC care might be related to the fact that

medical accidents are easy to cover up, (more easy then car accidents)

and liability of medical staff is difficult to prove, let alone

the liability of a medical equipment manufacturer.

See the discussion on the Therac-25.

 

Gert Gremmen

 

 

 

 

 

 

 

Van: emc-p...@ieee.org [mailto:emc-p...@ieee.org] Namens Conway, Patrick R
(Houston)
Verzonden: Wednesday, June 25, 2008 4:08 PM
Aan: Rudd, Adam; emc-p...@ieee.org
Onderwerp: RE: EMC in the news: RFID  Medical

 

...and if you put four of them in a circle, you can pop corn.  :)

 

 

 

Best Regards, 

Patrick. 
p.con...@hp.com 

 

 



From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of Rudd, Adam
Sent: Wednesday, June 25, 2008 7:19 AM
To: emc-p...@ieee.org
Subject: EMC in the news: RFID  Medical

“The latest research, conducted at Vrije University in Amsterdam, tested the
effect of holding both passive and powered RFIDs close to 41 medical
devices, including ventilators, syringe pumps, dialysis machines and
pacemakers.

A total of 123 tests, three on each machine, were carried out, and 34 produced
an incident in which the RFID appeared to have an effect - 24 of which were
deemed either significant or hazardous.

In some tests, RFIDs either switched off or changed the settings on mechanical
ventilators, completely stopped the working of syringe pumps, caused external
pacemakers to malfunction, and halted dialysis machines.

The device did

RE: EMC in the news: RFID Medical

2008-06-25 Thread Conway, Patrick R (Houston)
...and if you put four of them in a circle, you can pop corn.  :)
 
 
 
Best Regards, 

Patrick. 
p.con...@hp.com 

 



From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of Rudd, Adam
Sent: Wednesday, June 25, 2008 7:19 AM
To: emc-p...@ieee.org
Subject: EMC in the news: RFID  Medical



“The latest research, conducted at Vrije University in Amsterdam, tested the
effect of holding both passive and powered RFIDs close to 41 medical
devices, including ventilators, syringe pumps, dialysis machines and
pacemakers.

A total of 123 tests, three on each machine, were carried out, and 34 produced
an incident in which the RFID appeared to have an effect - 24 of which were
deemed either significant or hazardous.

In some tests, RFIDs either switched off or changed the settings on mechanical
ventilators, completely stopped the working of syringe pumps, caused external
pacemakers to malfunction, and halted dialysis machines.

The device did not have to be held right up to the machine to make this happen
- some hazardous incidents happened when the RFID was more than 10 inches
away.”

--http://news.bbc.co.uk/2/hi/health/7471008.stm
http://news.bbc.co.uk/2/hi/health/7471008.stm 

Best Regards,

Adam Rudd

Electrical Engineer (EMC)

NCR Corporation, RHSS

Duluth, GA

(770) 495-2825

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RE: Proposed EuP directive?

2008-06-12 Thread Conway, Patrick R (Houston)
Kristiaan, 
Thank you.  
 
 
And thanks to all list members that replied.
 

Best Regards, 

Patrick. 
p.con...@hp.com 

 



From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of Carpentier
Kristiaan
Sent: Wednesday, June 11, 2008 4:52 PM
To: lauren_cr...@amat.com; Conway, Patrick R (Houston)
Cc: emc-p...@ieee.org
Subject: RE: Proposed EuP directive?



2 major Implementation measures are under discussion:

- External Power Supplies (EPS).

The EPS IM measure is a Vertical IM  Product specific. Limits are actually
taken over from Energy star V2.

Implementation expected from H2 2009.

- Off  Standby mode losses.

The latter is a Horizontal Implementation measure affecting a broad range of
products, including ITE equipment; it requires that products go automatically
in Standby or Off mode with limits down to 1 or 2 Watt  even lower values a
few years later.

Implementation expected from H2 2009.

 

These requirements are legal requirements and will have to listed on the EU
DoC of the product.

 

Best regards,

 

Kris Carpentier

Regulatory  Approvals



From: emc-p...@ieee.org [mailto:emc-p...@ieee.org] On Behalf Of
lauren_cr...@amat.com
Sent: woensdag 11 juni 2008 23:13
To: Conway, Patrick R (Houston)
Cc: emc-p...@ieee.org
Subject: Re: Proposed EuP directive?

 


Check out http://ec.europa.eu/enterprise/eco_design/index_en.htm 

The EuP (Energy Using Products) directive has been out for a while and already
has three product sectors in scope (ballasts, refrigerators,and water
heaters).  There have been recent consultation efforts and proposals to expand
the list of products that fall under EuP (which happens to be a CE marking
directive). 

Regards, 

Lauren Crane (Mr.)
Product Regulatory Analyst
Corporate Product EHS Lead
Applied Materials Inc.
Austin, TX 512 272-6540 [#922 26540]

-External Use-

Save paper and trees!  Please consider the environment before printing this
e-mail. 



 




Conway, Patrick R (Houston) p.con...@hp.com 
Sent by: emc-p...@ieee.org 

06/11/2008 11:32 AM 

To

emc-p...@ieee.org emc-p...@ieee.org 

cc

 

Subject

Proposed EuP directive?

 

 

 

 

 

  




  
List-members. 
  
I hear there are some proposed regulations for future mandate of power
usage in the EU. 
  
Does anyone have any pointers to the proposed or draft regulations? 
  
Thanks in advance. 
  
  
  
Best Regards, 
  
Patrick Conway, NCE. 
  
Hewlett-Packard Co. 
p.con...@hp.com 
  
281.514.2259 
281-514.5473(fax) 
  
  
-  This
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Proposed EuP directive?

2008-06-11 Thread Conway, Patrick R (Houston)
 
List-members.
 
I hear there are some proposed regulations for future mandate of power
usage in the EU.
 
Does anyone have any pointers to the proposed or draft regulations?
 
Thanks in advance.
 
 
 
Best Regards,
 
Patrick Conway, NCE.
 
Hewlett-Packard Co.
p.con...@hp.com
 
281.514.2259
281-514.5473(fax)
 
 
-  This
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RE: Ferrite clamps

2002-11-25 Thread Conway, Patrick R

Gherry-
Thanks for the response.  I was very interested in knowing what the
responses were at the committee level to those basic questions.  From your
report it seems the basics of non-interference were brought up but other
factors weighed heavier in the argument.


If I worked for a test lab or for a test equipment manufacturer I
think I'd be happy about the adoption of A1:2000.  But since I work for
neither of those I'm still not sure how this helps my employer get
non-interfering product to market.


But, as you say- these points are no longer important.  The DOW
approaches.  So- now I have to go buy some clamps.



Anyone know where I can get some of these magic clamps?
Anyone started using these in their testing yet?


Best Regards,

Patrick Conway  NCE
StorageTek
EMC Advisory Engineer
303.661.6391
303.661.6717 (FAX)



-Original Message-
From: Pettit, Ghery [mailto:ghery.pet...@intel.com]
Sent: Friday, November 22, 2002 6:05 PM
To: Conway, Patrick R; Pettit, Ghery; 'emc-p...@majordomo.ieee.org'
Subject: RE: Ferrite clamps


Patrick,

You make a number of valid points.  They are, however, mute.  A1:2000 to
CISPR 22:1997 was published in 2000 and is being adopted around the world.
As a result, if regulatory bodies do not adopt it, we get to perform
radiated emissions tests twice on products, which will have a substantial
cost impact on the ITE industry.

The whole purpose of the clamps is to improve repeatability between labs.
The impact on the measured emissions levels was pointed out during the
discussions within CISPR SC G with no effect.  We're stuck with them, for
better or worse.  We need the FCC to allow them to reduce duplicate testing.
The FCC is well aware of the dual testing that their not approving the
clamps will cause.  I have personally pointed that out to them in meetings.
We'll see what happens.

Ghery


-Original Message-
From: Conway, Patrick R [mailto:conw...@louisville.stortek.com]
Sent: Thursday, November 21, 2002 1:12 PM
To: 'Pettit, Ghery'; 'emc-p...@majordomo.ieee.org'
Subject: RE: Ferrite clamps


Gherry-
It will be interesting to see if ITI are successful with the FCC on
this topic.  The ferrite clamp devices seem to be counter productive to the
original intent of the laws.  

I may be *way* off base here but I'll explain:


Point #1- It seems to me that the original intent behind the Part 15
Unintentional Radiator requirements was to protect licensed operators from
the noise generated by digital devices.  The original limits and test
methods were widely scrutinized over the years.  They have also been updated
and adjusted as necessary.  As Jim Bacher pointed out in an earlier email on
this thread, the limits and methods have been shown to protect those
licensed services from interference.  So- I'm sure the FCC will be asking:
if it isn't broke, why fix it (my words, not theirs!!).  


Point #2- Since data exists showing that the clamps *decrease*
emissions during a test, couldn't the use of a clamp let a product into the
market that could potential *cause* interference? (it isn't broke- but this
change may break it)


Point #3- For as long as I can remember, if a ferrite bead is put on
a cable during testing then that *exact* cable with that *exact* ferrite
bead has to be delivered to the customer along with the product.  How does
the floor mounted ferrite get an exception to this?




I can understand the motivation of a lab owner wanting to have
agreeable measurements with another lab.  It's good business for him to say
he can agree with any one else.  However- if the foundation for the rules is
to decrease interference problems then aren't we (the compliance community)
a little off-base on this one ?


Maybe I'm missing some important details here.  Someone correct me
if I'm wrong...



Best Regards,

Patrick Conway  NCE

EMC Advisory Engineer
303.661.6391
303.661.6717 (FAX)



-Original Message-
From: Pettit, Ghery [mailto:ghery.pet...@intel.com]
Sent: Wednesday, November 20, 2002 5:30 PM
To: Conway, Patrick R; Pettit, Ghery; 'emc-p...@majordomo.ieee.org'
Subject: RE: Ferrite clamps



Patrick,

The whole reason for A1:2000 to CISPR 22:1997 was to improve repeatability
between labs.  I agree with your concern about it causing double testing for
radiated emissions from 30 MHz to 1000 MHz until all regulatory bodies
accept the ferrite clamps.  Not a good thing.  I am working through an
industry association (ITI) to get the FCC to accept them.  I've been working
on this for 2 years.  Nothing so far, other than some work in ANSI C63 that
might result in the clamps being added to C63.4, maybe in 2004.

Ghery Pettit
Intel


-Original Message-
From: Conway, Patrick R [mailto:conw...@louisville.stortek.com]
Sent: Tuesday, November 19, 2002 11:42 AM
To: 'Pettit, Ghery'; 'emc-p...@majordomo.ieee.org'
Subject: RE: 


Hello Ghery-

Thank

[no subject]

2002-11-22 Thread Conway, Patrick R



All-

 I'd like to know if there are any opinions about...


 It is my understanding the CISPR 22 A1:2000 will require the
use of ferrite clamps during RE tests of table-top equipment.

Has anyone started using these devices during their testing?
Has anyone seen a difference in their test results with the
use of these devices?



Best Regards,

Patrick Conway  NCE
StorageTek
EMC Advisory Engineer
303.661.6391
303.661.6717 (FAX)






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RE: Ferrite clamps

2002-11-21 Thread Conway, Patrick R

Gherry-
It will be interesting to see if ITI are successful with the FCC on
this topic.  The ferrite clamp devices seem to be counter productive to the
original intent of the laws.  

I may be *way* off base here but I'll explain:


Point #1- It seems to me that the original intent behind the Part 15
Unintentional Radiator requirements was to protect licensed operators from
the noise generated by digital devices.  The original limits and test
methods were widely scrutinized over the years.  They have also been updated
and adjusted as necessary.  As Jim Bacher pointed out in an earlier email on
this thread, the limits and methods have been shown to protect those
licensed services from interference.  So- I'm sure the FCC will be asking:
if it isn't broke, why fix it (my words, not theirs!!).  


Point #2- Since data exists showing that the clamps *decrease*
emissions during a test, couldn't the use of a clamp let a product into the
market that could potential *cause* interference? (it isn't broke- but this
change may break it)


Point #3- For as long as I can remember, if a ferrite bead is put on
a cable during testing then that *exact* cable with that *exact* ferrite
bead has to be delivered to the customer along with the product.  How does
the floor mounted ferrite get an exception to this?




I can understand the motivation of a lab owner wanting to have
agreeable measurements with another lab.  It's good business for him to say
he can agree with any one else.  However- if the foundation for the rules is
to decrease interference problems then aren't we (the compliance community)
a little off-base on this one ?


Maybe I'm missing some important details here.  Someone correct me
if I'm wrong...



Best Regards,

Patrick Conway  NCE

EMC Advisory Engineer
303.661.6391
303.661.6717 (FAX)



-Original Message-
From: Pettit, Ghery [mailto:ghery.pet...@intel.com]
Sent: Wednesday, November 20, 2002 5:30 PM
To: Conway, Patrick R; Pettit, Ghery; 'emc-p...@majordomo.ieee.org'
Subject: RE: Ferrite clamps



Patrick,

The whole reason for A1:2000 to CISPR 22:1997 was to improve repeatability
between labs.  I agree with your concern about it causing double testing for
radiated emissions from 30 MHz to 1000 MHz until all regulatory bodies
accept the ferrite clamps.  Not a good thing.  I am working through an
industry association (ITI) to get the FCC to accept them.  I've been working
on this for 2 years.  Nothing so far, other than some work in ANSI C63 that
might result in the clamps being added to C63.4, maybe in 2004.

Ghery Pettit
Intel


-Original Message-
From: Conway, Patrick R [mailto:conw...@louisville.stortek.com]
Sent: Tuesday, November 19, 2002 11:42 AM
To: 'Pettit, Ghery'; 'emc-p...@majordomo.ieee.org'
Subject: RE: 


Hello Ghery-

Thank you for the information.

To be honest, I'm not all that familiar with the CISPR voting
process but I do recognize that any election with a 1 vote margin must be a
bit contentious.  Unless of course you live in Florida where every vote
counts AT LEAST once.  There wasn't any hanging chad during that CISPR
vote, was there?


But- back to A1:2000:  The data you report indicates that the
emission profile will change with the addition of the ferrite clamps.  This
is bothersome for (at least) three reasons- 

1st: if the ferrite clamp reduces the emissions from a frequency or
two then I can achieve compliance but a customer may experience an
interference problem due to the fact that they do not install the ferrite
clamp at their facility.

2nd:  if the ferrite clamp increases emissions from a frequency then
a product that now achieves compliance may have to be redesigned in order to
pass after the DOW.  

3rd:  since the FCC doesn't presently allow the use of the ferrite
clamps then I have to test each product one more time- this adds cost and
time delay- especially if a failure arises due to this test.



This could be a major headache for people who deliver product to
market in Europe.


Can anyone tell us the driving reason behind this regulation?  Was
it to increase repeatability at test sites?  Was it to reduce the number of
interference complaints from ITE installations? 



Best Regards,

Patrick Conway  NCE
StorageTek
EMC Advisory Engineer
303.661.6391
303.661.6717 (FAX)



-Original Message-
From: Pettit, Ghery [mailto:ghery.pet...@intel.com]
Sent: Monday, November 18, 2002 10:09 PM
To: Conway, Patrick R; 'emc-p...@majordomo.ieee.org'
Subject: RE: 


Patrick,

I performed some A/B comparison measurements several years ago when this was
still working its way through CISPR to aid in the determination of the US
vote.  I found that some emissions go down (some by a bunch) and others may
go up when you add the clamps.  You will need to re-test products for Europe
as you can't predict what the change will by just

RE:

2002-11-19 Thread Conway, Patrick R

Hello Ghery-

Thank you for the information.

To be honest, I'm not all that familiar with the CISPR voting
process but I do recognize that any election with a 1 vote margin must be a
bit contentious.  Unless of course you live in Florida where every vote
counts AT LEAST once.  There wasn't any hanging chad during that CISPR
vote, was there?


But- back to A1:2000:  The data you report indicates that the
emission profile will change with the addition of the ferrite clamps.  This
is bothersome for (at least) three reasons- 

1st: if the ferrite clamp reduces the emissions from a frequency or
two then I can achieve compliance but a customer may experience an
interference problem due to the fact that they do not install the ferrite
clamp at their facility.

2nd:  if the ferrite clamp increases emissions from a frequency then
a product that now achieves compliance may have to be redesigned in order to
pass after the DOW.  

3rd:  since the FCC doesn't presently allow the use of the ferrite
clamps then I have to test each product one more time- this adds cost and
time delay- especially if a failure arises due to this test.



This could be a major headache for people who deliver product to
market in Europe.


Can anyone tell us the driving reason behind this regulation?  Was
it to increase repeatability at test sites?  Was it to reduce the number of
interference complaints from ITE installations? 



Best Regards,

Patrick Conway  NCE
StorageTek
EMC Advisory Engineer
303.661.6391
303.661.6717 (FAX)



-Original Message-
From: Pettit, Ghery [mailto:ghery.pet...@intel.com]
Sent: Monday, November 18, 2002 10:09 PM
To: Conway, Patrick R; 'emc-p...@majordomo.ieee.org'
Subject: RE: 


Patrick,

I performed some A/B comparison measurements several years ago when this was
still working its way through CISPR to aid in the determination of the US
vote.  I found that some emissions go down (some by a bunch) and others may
go up when you add the clamps.  You will need to re-test products for Europe
as you can't predict what the change will by just by inspection.

BTW, this amendment to CISPR 22 passed by 1 vote.  The US voted no as the
clamps were not adequately defined in the proposal.

Ghery Pettit
Intel


-Original Message-
From: Conway, Patrick R [mailto:conw...@louisville.stortek.com]
Sent: Monday, November 18, 2002 2:53 PM
To: 'emc-p...@majordomo.ieee.org'
Subject: 




All-

 I'd like to know if there are any opinions about...


 It is my understanding the CISPR 22 A1:2000 will require the
use of ferrite clamps during RE tests of table-top equipment.

Has anyone started using these devices during their testing?
Has anyone seen a difference in their test results with the
use of these devices?



Best Regards,

Patrick Conway  NCE
StorageTek
EMC Advisory Engineer
303.661.6391
303.661.6717 (FAX)






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---
This message is from the IEEE EMC Society Product Safety
Technical Committee emc-pstc discussion list.

Visit our web site at:  http://www.ewh.ieee.org/soc/emcs/pstc/

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 majord...@ieee.org
with the single line:
 unsubscribe emc-pstc

For help, send mail to the list administrators:
 Ron Pickard:  emc-p...@hypercom.com
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For policy questions, send mail to:
 Richard Nute:   ri...@ieee.org
 Jim Bacher: j.bac...@ieee.org

All emc-pstc postings are archived and searchable on the web at:
http://ieeepstc.mindcruiser.com/
Click on browse and then emc-pstc mailing list