Re: ESD - time between successive discharges

2001-08-08 Thread Ralph Cameron

John:

I thought I had lost your original statement about CE not having a bearing
on Quality. I would agree also. The statement was made, as I recall, in some
article in Compliance Engineering.  Not that UL is a quality mark or RU or
FCC 15 etc.   Quality is highly dependant on how your marketing people
perceive it and refers to appearance, dependability, reputation, need
fulfillment and a host of things thought to benefit the cutomer - from the
manufacturer's view.

On the other hand a CE mark is a rating of performance and how many
consumers even know about it?  I ask every computer salesman I have occasion
to meet the meaning of CE and I have yet to find one who knows. After I
explain it to him, he agrees that some generic immunity is a good thing.

If you look at all the components and larger computer peripherls now bearing
a CE mark, it must be cost effective to include it.

I suppress consumer equipment that suffers from no immunity with a simple
non intrusive method and suggest to the same consumer to be aware and next
time look for a product with the CE mark.   I yet to encounter a problem
with a CE marked product ( modems, video cards, displays, CD players, and
even boom boxes) that could never hack it in today's RF environment.

CE is a consumer benefit because it guarnatees a minimum level of immunity
With all these domestic wireless devices , it makes prudent engineering
sense. Designed in is the only way to go. I don't want to do this forever.

Ralph Cameron
EMC Consulting and Suppression of Consumer Electronics.
(after sale)

- Original Message -
From: John Woodgate j...@jmwa.demon.co.uk
To: emc-p...@majordomo.ieee.org
Sent: Tuesday, August 07, 2001 4:34 PM
Subject: Re: ESD - time between successive discharges



 95fbd8b0830ed511b7720002a51363f1319...@exw-ks.ks.lsil.com, Ehler, Kyle
 keh...@lsil.com inimitably wrote:
 
 No John, I'm not referring to you. (or anyone else in particular) I
dont
 know you well enough -yet..lol
 I'm just spaking on how we do the job of ensuring that our products
meet the
 standards.

 I only pick up typos when they are amusing (like, 'We then repeated the
 tests for completemess.'), or could create confusion.
 
 We take this work very seriously and I agree with you that the CE
mark is
 not a quality mark,

 Good; my comment was directed to those who might think it is.

 I agree with most of the rest of your comments.
 --
 Regards, John Woodgate, OOO - Own Opinions Only.
http://www.jmwa.demon.co.uk
 This message and its contents are not confidential, privileged or
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 by law. Access is only authorised by the intended recipient - this means
YOU!
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 yesterday at the latest.

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Re: ESD - time between successive discharges

2001-08-08 Thread John Woodgate

95fbd8b0830ed511b7720002a51363f1319...@exw-ks.ks.lsil.com, Ehler, Kyle
keh...@lsil.com inimitably wrote:

No John, I'm not referring to you. (or anyone else in particular)  I dont 
know you well enough -yet..lol 
I'm just spaking on how we do the job of ensuring that our products meet 
 the 
standards. 

I only pick up typos when they are amusing (like, 'We then repeated the
tests for completemess.'), or could create confusion.

We take this work very seriously and I agree with you that the CE mark is 
not a quality mark, 

Good; my comment was directed to those who might think it is.

I agree with most of the rest of your comments.
-- 
Regards, John Woodgate, OOO - Own Opinions Only. http://www.jmwa.demon.co..uk 
This message and its contents are not confidential, privileged or protected 
by law. Access is only authorised by the intended recipient - this means YOU! 
The contents may be disclosed to, or used by, anyone and stored or copied in
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RE: ESD - time between successive discharges

2001-08-07 Thread Ehler, Kyle
No John, I'm not referring to you. (or anyone else in particular)  I dont
know you well enough -yet..lol
I'm just spaking on how we do the job of ensuring that our products meet the
standards.

We take this work very seriously and I agree with you that the CE mark is
not a quality mark, but in our case it nearly becomes one when the
customer's expectation of our products is to meet (or exceed) the presently
applied Directives.  We back the CE mark with a detailed test report.  In a
number of cases, the customer performs follow up testing.  On rare
occasions, the customer is followup testing to more stringent or severe
levels and this is where agressive adherence to the Directives, along with
painfully acquired margins, pays off in spades.  On very rare occasions a
test lab challenges our data, in which case we re-examine and submit or
challenge, depending on the issue.

I'm a second party and cannot take direct credit for the lab's work, but I
can say that I advocate doing the right thing.  Even when it creates a great
deal of discomfort for our engineers and reasonably increases our costs.  As
a result, our engineers have at best a rancorous respect for our tiny
department.

I need to state that our lab is a combined EMC and Safety lab.  That it is
part of LSI Logic Storage Systems Division, that we are not independent of
the company, and that we do no external testing or contracting.

Also, what I say here are merely my opinions and are not necessarily those
of LSI.
standard disclaimer

Take Care,

Kyle Ehler  KCOIQE
mailto:kyle.eh...@lsil.com 
Product Safety Engineer / EMC Specialist
LSI Logic Storage Systems Division
3718 N. Rock Road
U.S.A.  Wichita, Kansas  67226
Ph. 316 636 8657
Fax 316 636 8321



-Original Message-
From: John Woodgate [mailto:j...@jmwa.demon.co.uk]
Sent: Tuesday, August 07, 2001 1:37 AM
To: emc-p...@majordomo.ieee.org
Subject: Re: ESD - time between successive discharges



95fbd8b0830ed511b7720002a51363f1319...@exw-ks.ks.lsil.com, Ehler, Kyle
keh...@lsil.com inimitably wrote:
I suppose what I am alluring to 

You aren't alluring to me, sailor!(;-)

is debugging for quality, but then, isnt the
purpose of compliance testing to 'test to fail' rather than test to pass?

No, it isn't, if you mean 'compliance with EU Directives'. To suggest
that it is creates an open invitation to militant test-houses to go
looking for trouble, and you can be pretty sure that some of them are
ingenious enough to find it in every case.

[snip]

For example, as an OEM (to a few of you out there) and direct mfr. we want
to be as thorough as possible because we want to make a quality product and
when we put CE on it, we mean it. 

The CE mark is absolutely NOT to be regarded as a quality mark. Thus
spake the European Commission itself.

You are welcome to institute whatever product-quality verification
programs you wish, but please keep their consideration separate from
issues concerning compliance with EU Directives.
-- 
Regards, John Woodgate, OOO - Own Opinions Only. http://www.jmwa.demon.co.uk

This message and its contents are not confidential, privileged or protected 
by law. Access is only authorised by the intended recipient - this means
YOU! 
The contents may be disclosed to, or used by, anyone and stored or copied in
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yesterday at the latest.

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Re: ESD - time between successive discharges

2001-08-07 Thread John Woodgate

95fbd8b0830ed511b7720002a51363f1319...@exw-ks.ks.lsil.com, Ehler, Kyle
keh...@lsil.com inimitably wrote:
I suppose what I am alluring to 

You aren't alluring to me, sailor!(;-)

is debugging for quality, but then, isnt the
purpose of compliance testing to 'test to fail' rather than test to pass?

No, it isn't, if you mean 'compliance with EU Directives'. To suggest
that it is creates an open invitation to militant test-houses to go
looking for trouble, and you can be pretty sure that some of them are
ingenious enough to find it in every case.

[snip]

For example, as an OEM (to a few of you out there) and direct mfr. we want
to be as thorough as possible because we want to make a quality product and
when we put CE on it, we mean it. 

The CE mark is absolutely NOT to be regarded as a quality mark. Thus
spake the European Commission itself.

You are welcome to institute whatever product-quality verification
programs you wish, but please keep their consideration separate from
issues concerning compliance with EU Directives.
-- 
Regards, John Woodgate, OOO - Own Opinions Only. http://www.jmwa.demon.co.uk 
This message and its contents are not confidential, privileged or protected 
by law. Access is only authorised by the intended recipient - this means YOU! 
The contents may be disclosed to, or used by, anyone and stored or copied in
any medium. If you are not the intended recipient, please advise the sender 
yesterday at the latest.

---
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RE: ESD - time between successive discharges

2001-08-06 Thread Ehler, Kyle


I've been following this thread about ESD testing and the PPS debate.
I would like to inject my point of view on the subject.

So far most of what I have read addresses the need for speed.
This is great for the test lab/house; to be able to slam through the process
in a quest to get it done quick for the sake of process throughput, but for
the purpose of determining if an EUT is immune to a pulse stimuli with
respect to possible entry points, I remain skeptical.

I suppose what I am alluring to is debugging for quality, but then, isnt the
purpose of compliance testing to 'test to fail' rather than test to pass?
This may depend on the lab itself.  With the PPS issue, I submit that from
at least the quality point of view it may depend on the type of product you
are testing and the functional test program that the EUT is operating.

For example, as an OEM (to a few of you out there) and direct mfr. we want
to be as thorough as possible because we want to make a quality product and
when we put CE on it, we mean it.  We do not want our customer to find a
problem with our products during their followup testing (not everyone
retests a CE marked product).  To ensure quality, we test our cabinet
products for a full day or two in the ESD lab (much more if it fails).  Many
times we have student interns who do this, but sometimes our experienced lab
techs do the job.  Nevertheless, ESD testing (particularly on our disk
arrays) is done very slowly because a rack mount version EUT can be loaded
with up to 154 disk drives ranging in capacity from 9 to 180Gb while using a
transfer block size ranging from 512 bytes to 256Kb.  The result is massive
overhead to response.

The exercise program for a device such as this (we call it smash/hammer)
performs a chained series of write/read/verify operations.  The tasking
packets may be buffered through a storage attached network (SAN) director
and thus the operations can be lengthy and/or latent in the outcome
reporting in the error daemon.  The only way for our test personnel to
determine if a failure has occurred is to monitor the screen of the EUT's
host pc to visually verify no errors have occured before proceeding to the
next zap.  This can take seconds to minutes after a stimuli is applied.
If such ESD testing were performed too rapidly, the operator can overlook a
failure, and its location.  There may be dozens of stimuli injection points
to be tested and thus the relative location on the EUT where the failure
event occurred can be overlooked.

Fortunately, the standard has provision for variety..

Thank-You,

Kyle Ehler  KCOIQE
mailto:kyle.eh...@lsil.com 
Assistant Design Engineer
LSI Logic Corporation
3718 N. Rock Road
U.S.A.  Wichita, Kansas  67226
Ph. 316 636 8657
Fax 316 636 8321



RE: ESD - time between successive discharges

2001-08-06 Thread Morse, Earl

Our rule is 1 second per discharge, 10 discharges, both polarities, per
discharge point.  Of course the test personnel also strafe the unit at 20
pulses/second in order to detect any vulnerability that may need to be
exploited. 

-Original Message-
From: Cortland Richmond [mailto:72146@compuserve.com]
Sent: Saturday, August 04, 2001 8:40 PM
To: ieee pstc list
Subject: Re: ESD - time between successive discharges



This has come up everywhere I've worked. In order to adequately test for
vulnerability, logically, one has to apply a discharge during each of the
operating conditions an equipment might take. Given the number of different
logical states a microprocessor-controlled EUT might use, this could take
forever! From the standpoint of doing a conscientious test, it would be
desirable to test MORE often than once per second.

But because the real-world ESD event is an isolated one, repeated
discharges are not a realistic test. Also, many devices incorporate
built-in ESD protection using protective parts of limited dissipation, and
it is possible testing TOO often will destroy the protection circuit. Once
per second turns out to be a compromise, and one which may be followed
without being too persnickety. 

What about a longer interval? Sure -- provided we test all of the logic
states that might be latched up by the discharge! Ten discharges per point,
plus and minus, at each of the voltage levels prescribed, will probably
turn up enough of them to pin down a susceptible device no matter WHAT the
interval is. One hour? Well, if you can afford to do thirty hours of test,
you can do three points at ONE voltage level. One minute? Still takes a
long time. And let's face it; this is mind-numbing work. So one second
seems to ME to be just about right. Let the poor tech -- or the poor
engineer! -- take a break once in a while!

I'll add that there may be failure modes that take longer than one second
to show up. You want to do the test in such a way that the tester can note
and adjust to this; I once tested something that had a 30 second delay
before a failure showed up. This can't be helped, and, in this particular
case, one second is far too often.

Cortland Richmond

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Re: ESD - time between successive discharges

2001-08-05 Thread Cortland Richmond

This has come up everywhere I've worked. In order to adequately test for
vulnerability, logically, one has to apply a discharge during each of the
operating conditions an equipment might take. Given the number of different
logical states a microprocessor-controlled EUT might use, this could take
forever! From the standpoint of doing a conscientious test, it would be
desirable to test MORE often than once per second.

But because the real-world ESD event is an isolated one, repeated
discharges are not a realistic test. Also, many devices incorporate
built-in ESD protection using protective parts of limited dissipation, and
it is possible testing TOO often will destroy the protection circuit. Once
per second turns out to be a compromise, and one which may be followed
without being too persnickety. 

What about a longer interval? Sure -- provided we test all of the logic
states that might be latched up by the discharge! Ten discharges per point,
plus and minus, at each of the voltage levels prescribed, will probably
turn up enough of them to pin down a susceptible device no matter WHAT the
interval is. One hour? Well, if you can afford to do thirty hours of test,
you can do three points at ONE voltage level. One minute? Still takes a
long time. And let's face it; this is mind-numbing work. So one second
seems to ME to be just about right. Let the poor tech -- or the poor
engineer! -- take a break once in a while!

I'll add that there may be failure modes that take longer than one second
to show up. You want to do the test in such a way that the tester can note
and adjust to this; I once tested something that had a 30 second delay
before a failure showed up. This can't be helped, and, in this particular
case, one second is far too often.

Cortland Richmond

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Re: ESD - time between successive discharges

2001-08-03 Thread David Heald

Greetings,
Let me add something to Joe's position (which I agree with entirely)
based upon my experience at a former job.  Some products with no ground
or not so great grounds will need time (one sec or sometimes more)
between discharges to ensure that there is no build up of charge on the
system.  Not only does charge buildup reduce the effect of same polarity
discharges, but just think of the discharge level when a unit with a few
kV of charge suddenly gets hit with a -XkV event after the polarity
change.  The effective net discharge is way over the spec and can often
cause perceived failures. 
  For the case of no ground (say a handheld battery powered device), a
high impedance drain should be used to remove the charge.  Ever pick up
a handheld device charged to around 8kV?

Best regards
Dave Heald

Joe Finlayson wrote:
 
 Amund,
 
 My experience has been that the labs would prefer to perform the ESD
 tests at a rate of 1 pulse/second (pps) for the sake of efficiency.  If the
 product passes then it was completed in the least amount of time and
 everyone's happy.  If the product fails at 1 pps, then you are allowed to
 decrease the pulse rate until the product passes.  If it still fails at
 lower rates (say 0.1 pps - one ESD event every 10 seconds), then you
 probably have problems.  I've had products fail at 1 pps and pass at 0.5
 pps.  It took longer to run the test, but it passed and met the requirements
 of the standard(s).  My interpretation of the requirements is that there is
 no maximum limit between ESD discharges.
 
 Thx,
 
 Joe
 
 -Original Message-
 From: am...@westin.org [mailto:am...@westin.org]
 Sent: Wednesday, August 01, 2001 4:07 PM
 To: emc-p...@majordomo.ieee.org
 Subject: ESD - time between successive discharges
 
 Dear members,
 
 From IEC61000-4-2 and several EN-product standards, they specify the time
 between successive discharges to be at least 1 second.
 
 But what is the maximum time between each pulse ? I can not see that it is
 stated in any standards. I guess the test labs use 1 pulse pr second.
 
 I feel that the pulse rate can have influences on the EUT performance, so 1
 second compared to 3-5 seconds might be the difference between PASS and
 FAIL.
 
 Any suggestions ?
 
 Best regards
 Amund Westin
 Oslo, Norway
 
 --
 Get your firstname@lastname email for FREE at http://Nameplanet.com/?su
 
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Re: ESD - time between successive discharges

2001-08-03 Thread John Woodgate

6bd67ffb937fd411a04f00d0b74fe878026ee...@xrose06.rose.hp.com, HALL,KEN
(HP-Roseville,ex1) ken_h...@hp.com inimitably wrote:
We believe that the probability of identifying an ESD susceptible product is
increased dramatically when subjecting the product to continuous discharges.

What you mean is that the result depends on the repetition rate, which
is not specified in the standard, so that the test results are not
repeatable?
-- 
Regards, John Woodgate, OOO - Own Opinions Only. http://www.jmwa.demon.co.uk 
This message and its contents are not confidential, privileged or protected 
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RE: ESD - time between successive discharges

2001-08-02 Thread Hans Mellberg

If the product contains mechanical devices such as disk, floppy, DVD etc and 
has s/w
that has operation cycle times in the neighborhood of 1s or so then the 0.1 to 
10 s
may have very different results at different points in that timing range.


--- Gary McInturff gary.mcintu...@worldwidepackets.com wrote:
 
   ESD susceptibility has a couple of components. Simplistically,
 don't let it happen or try to direct the energy where you want it, and does
 the event happen at just the right (wrong?) time. Just as a critical gate is
 changing states for example. Given the relative rate that modern processors
 are running 800 Mhz - 1 Ghz, I don't know that increasing the discharge rate
 from a second to 20 or even 50 times a second really increases your ability
 to capture one of these states. Having said that, I don't really have a
 quarrel with increasing the rates for investigative purposes, I have done it
 myself.   However, I think you should keep in mind the heating of
 silicon junctions etc, from the rapid discharge rates. Even non-critical
 gates can be artificially damaged by rapid pulses. I can't think of a case
 when an ESD discharge (not lightning etc) naturally occurs at very high
 rates. I'd be interested in examples if it does occur. 
   Not a bad diagnostic tool but I wouldn't care to see higher rates
 implemented in standards. 
   Gary
   (You can't expect much for two cents these days)
 
 -Original Message-
 From: HALL,KEN (HP-Roseville,ex1) [mailto:ken_h...@hp.com]
 Sent: Thursday, August 02, 2001 7:53 AM
 To: 'Michael Hopkins'; am...@westin.org; emc-p...@majordomo.ieee.org
 Cc: AGUILAR,LONNIE (HP-Roseville,ex1); 'Pommerenke, David'
 Subject: RE: ESD - time between successive discharges
 
 
 
 Hello all,
 
 If I remember correctly the one shot/second was to allow older simulators
 time to recharge.
 
 We believe that the probability of identifying an ESD susceptible product is
 increased dramatically when subjecting the product to continuous discharges.
 
 
 Ken Hall 
 
 Lonnie please file.
 
 Thanks,
 
 Ken 
 
 
 
 -Original Message-
 From: Michael Hopkins [mailto:mhopk...@thermokeytek.com]
 Sent: Thursday, August 02, 2001 3:48 AM
 To: am...@westin.org; emc-p...@majordomo.ieee.org
 Subject: Re: ESD - time between successive discharges
 
 
 
 Seems to me the time between discharges is the same as the time between
 pulses (I believe that was the intent). I don't have the standard in front
 of me, but I think the max rate was 1/second, which means you could go
 slower. In most tests I've seen, the several discharges at one point are run
 at the 1/second rate, but then there could be several seconds or more
 between the discharges at that point and the discharges at the next point.
 At least one company actually runs tests at much higher discharge rates and
 with many more shots/point than IEC recommends (the new draft of ANSI C63.16
 goes to 50 shots/per point).
 
 Michael Hopkins
 Thermo KeyTek
 
 - Original Message -
 From: am...@westin.org
 To: emc-p...@majordomo.ieee.org
 Sent: Wednesday, August 01, 2001 4:06 PM
 Subject: ESD - time between successive discharges
 
 
 
  Dear members,
 
  From IEC61000-4-2 and several EN-product standards, they specify the time
  between successive discharges to be at least 1 second.
 
  But what is the maximum time between each pulse ? I can not see that it is
  stated in any standards. I guess the test labs use 1 pulse pr second.
 
  I feel that the pulse rate can have influences on the EUT performance, so
 1
  second compared to 3-5 seconds might be the difference between PASS and
 FAIL.
 
  Any suggestions ?
 
  Best regards
  Amund Westin
  Oslo, Norway
 
  --
  Get your firstname@lastname email for FREE at http://Nameplanet.com/?su
 
  ---
  This message is from the IEEE EMC Society Product Safety
  Technical Committee emc-pstc discussion list.
 
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  http://www.rcic.com/  click on Virtual Conference Hall,
 
 
 
 ---
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 Technical Committee emc-pstc discussion list.
 
 Visit our web site at:  http://www.ewh.ieee.org/soc/emcs/pstc/
 
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RE: ESD - time between successive discharges

2001-08-02 Thread Gary McInturff

ESD susceptibility has a couple of components. Simplistically,
don't let it happen or try to direct the energy where you want it, and does
the event happen at just the right (wrong?) time. Just as a critical gate is
changing states for example. Given the relative rate that modern processors
are running 800 Mhz - 1 Ghz, I don't know that increasing the discharge rate
from a second to 20 or even 50 times a second really increases your ability
to capture one of these states. Having said that, I don't really have a
quarrel with increasing the rates for investigative purposes, I have done it
myself. However, I think you should keep in mind the heating of
silicon junctions etc, from the rapid discharge rates. Even non-critical
gates can be artificially damaged by rapid pulses. I can't think of a case
when an ESD discharge (not lightning etc) naturally occurs at very high
rates. I'd be interested in examples if it does occur. 
Not a bad diagnostic tool but I wouldn't care to see higher rates
implemented in standards.   
Gary
(You can't expect much for two cents these days)

-Original Message-
From: HALL,KEN (HP-Roseville,ex1) [mailto:ken_h...@hp.com]
Sent: Thursday, August 02, 2001 7:53 AM
To: 'Michael Hopkins'; am...@westin.org; emc-p...@majordomo.ieee.org
Cc: AGUILAR,LONNIE (HP-Roseville,ex1); 'Pommerenke, David'
Subject: RE: ESD - time between successive discharges



Hello all,

If I remember correctly the one shot/second was to allow older simulators
time to recharge.

We believe that the probability of identifying an ESD susceptible product is
increased dramatically when subjecting the product to continuous discharges.


Ken Hall 

Lonnie please file.

Thanks,

Ken 



-Original Message-
From: Michael Hopkins [mailto:mhopk...@thermokeytek.com]
Sent: Thursday, August 02, 2001 3:48 AM
To: am...@westin.org; emc-p...@majordomo.ieee.org
Subject: Re: ESD - time between successive discharges



Seems to me the time between discharges is the same as the time between
pulses (I believe that was the intent). I don't have the standard in front
of me, but I think the max rate was 1/second, which means you could go
slower. In most tests I've seen, the several discharges at one point are run
at the 1/second rate, but then there could be several seconds or more
between the discharges at that point and the discharges at the next point.
At least one company actually runs tests at much higher discharge rates and
with many more shots/point than IEC recommends (the new draft of ANSI C63.16
goes to 50 shots/per point).

Michael Hopkins
Thermo KeyTek

- Original Message -
From: am...@westin.org
To: emc-p...@majordomo.ieee.org
Sent: Wednesday, August 01, 2001 4:06 PM
Subject: ESD - time between successive discharges



 Dear members,

 From IEC61000-4-2 and several EN-product standards, they specify the time
 between successive discharges to be at least 1 second.

 But what is the maximum time between each pulse ? I can not see that it is
 stated in any standards. I guess the test labs use 1 pulse pr second.

 I feel that the pulse rate can have influences on the EUT performance, so
1
 second compared to 3-5 seconds might be the difference between PASS and
FAIL.

 Any suggestions ?

 Best regards
 Amund Westin
 Oslo, Norway

 --
 Get your firstname@lastname email for FREE at http://Nameplanet.com/?su

 ---
 This message is from the IEEE EMC Society Product Safety
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 All emc-pstc postings are archived and searchable on the web at:
 http://www.rcic.com/  click on Virtual Conference Hall,



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RE: ESD - time between successive discharges

2001-08-02 Thread Joe Finlayson

Amund,

My experience has been that the labs would prefer to perform the ESD
tests at a rate of 1 pulse/second (pps) for the sake of efficiency.  If the
product passes then it was completed in the least amount of time and
everyone's happy.  If the product fails at 1 pps, then you are allowed to
decrease the pulse rate until the product passes.  If it still fails at
lower rates (say 0.1 pps - one ESD event every 10 seconds), then you
probably have problems.  I've had products fail at 1 pps and pass at 0.5
pps.  It took longer to run the test, but it passed and met the requirements
of the standard(s).  My interpretation of the requirements is that there is
no maximum limit between ESD discharges.

Thx,


Joe

-Original Message-
From: am...@westin.org [mailto:am...@westin.org]
Sent: Wednesday, August 01, 2001 4:07 PM
To: emc-p...@majordomo.ieee.org
Subject: ESD - time between successive discharges



Dear members,

From IEC61000-4-2 and several EN-product standards, they specify the time 
between successive discharges to be at least 1 second.

But what is the maximum time between each pulse ? I can not see that it is 
stated in any standards. I guess the test labs use 1 pulse pr second.

I feel that the pulse rate can have influences on the EUT performance, so 1 
second compared to 3-5 seconds might be the difference between PASS and
FAIL.

Any suggestions ?

Best regards
Amund Westin
Oslo, Norway

-- 
Get your firstname@lastname email for FREE at http://Nameplanet.com/?su

---
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RE: ESD - time between successive discharges

2001-08-02 Thread Jim Conrad

Just to give you an idea of how we handled this in 60601-1-2, we said: The
time between discharges shall have an initial value of 1 s. Longer time
between discharges may be required in order to be able to distinguish
between a response caused by a single discharge and a response caused by a
number of discharges.
That is, each discharge should be evaluated independently.  The time between
them must be considered based the type of equipment being tested.  Hope this
helps and is WG13's implementation of this problem.

Jim
-Original Message-
From: owner-emc-p...@majordomo.ieee.org
[mailto:owner-emc-p...@majordomo.ieee.org]On Behalf Of Michael Hopkins
Sent: Thursday, August 02, 2001 6:48 AM
To: am...@westin.org; emc-p...@majordomo.ieee.org
Subject: Re: ESD - time between successive discharges


Seems to me the time between discharges is the same as the time between
pulses (I believe that was the intent). I don't have the standard in front
of me, but I think the max rate was 1/second, which means you could go
slower. In most tests I've seen, the several discharges at one point are run
at the 1/second rate, but then there could be several seconds or more
between the discharges at that point and the discharges at the next point.
At least one company actually runs tests at much higher discharge rates and
with many more shots/point than IEC recommends (the new draft of ANSI C63.16
goes to 50 shots/per point).

Michael Hopkins
Thermo KeyTek

- Original Message -
From: am...@westin.org
To: emc-p...@majordomo.ieee.org
Sent: Wednesday, August 01, 2001 4:06 PM
Subject: ESD - time between successive discharges



 Dear members,

 From IEC61000-4-2 and several EN-product standards, they specify the time
 between successive discharges to be at least 1 second.

 But what is the maximum time between each pulse ? I can not see that it is
 stated in any standards. I guess the test labs use 1 pulse pr second.

 I feel that the pulse rate can have influences on the EUT performance, so
1
 second compared to 3-5 seconds might be the difference between PASS and
FAIL.

 Any suggestions ?

 Best regards
 Amund Westin
 Oslo, Norway

 --
 Get your firstname@lastname email for FREE at http://Nameplanet.com/?su

 ---
 This message is from the IEEE EMC Society Product Safety
 Technical Committee emc-pstc discussion list.

 Visit our web site at:  http://www.ewh.ieee.org/soc/emcs/pstc/

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 http://www.rcic.com/  click on Virtual Conference Hall,



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RE: ESD - time between successive discharges

2001-08-02 Thread HALL,KEN (HP-Roseville,ex1)

Hello all,

If I remember correctly the one shot/second was to allow older simulators
time to recharge.

We believe that the probability of identifying an ESD susceptible product is
increased dramatically when subjecting the product to continuous discharges.


Ken Hall 

Lonnie please file.

Thanks,

Ken 



-Original Message-
From: Michael Hopkins [mailto:mhopk...@thermokeytek.com]
Sent: Thursday, August 02, 2001 3:48 AM
To: am...@westin.org; emc-p...@majordomo.ieee.org
Subject: Re: ESD - time between successive discharges



Seems to me the time between discharges is the same as the time between
pulses (I believe that was the intent). I don't have the standard in front
of me, but I think the max rate was 1/second, which means you could go
slower. In most tests I've seen, the several discharges at one point are run
at the 1/second rate, but then there could be several seconds or more
between the discharges at that point and the discharges at the next point.
At least one company actually runs tests at much higher discharge rates and
with many more shots/point than IEC recommends (the new draft of ANSI C63.16
goes to 50 shots/per point).

Michael Hopkins
Thermo KeyTek

- Original Message -
From: am...@westin.org
To: emc-p...@majordomo.ieee.org
Sent: Wednesday, August 01, 2001 4:06 PM
Subject: ESD - time between successive discharges



 Dear members,

 From IEC61000-4-2 and several EN-product standards, they specify the time
 between successive discharges to be at least 1 second.

 But what is the maximum time between each pulse ? I can not see that it is
 stated in any standards. I guess the test labs use 1 pulse pr second.

 I feel that the pulse rate can have influences on the EUT performance, so
1
 second compared to 3-5 seconds might be the difference between PASS and
FAIL.

 Any suggestions ?

 Best regards
 Amund Westin
 Oslo, Norway

 --
 Get your firstname@lastname email for FREE at http://Nameplanet.com/?su

 ---
 This message is from the IEEE EMC Society Product Safety
 Technical Committee emc-pstc discussion list.

 Visit our web site at:  http://www.ewh.ieee.org/soc/emcs/pstc/

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 http://www.rcic.com/  click on Virtual Conference Hall,



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Re: ESD - time between successive discharges

2001-08-02 Thread Michael Hopkins

Seems to me the time between discharges is the same as the time between
pulses (I believe that was the intent). I don't have the standard in front
of me, but I think the max rate was 1/second, which means you could go
slower. In most tests I've seen, the several discharges at one point are run
at the 1/second rate, but then there could be several seconds or more
between the discharges at that point and the discharges at the next point.
At least one company actually runs tests at much higher discharge rates and
with many more shots/point than IEC recommends (the new draft of ANSI C63.16
goes to 50 shots/per point).

Michael Hopkins
Thermo KeyTek

- Original Message -
From: am...@westin.org
To: emc-p...@majordomo.ieee.org
Sent: Wednesday, August 01, 2001 4:06 PM
Subject: ESD - time between successive discharges



 Dear members,

 From IEC61000-4-2 and several EN-product standards, they specify the time
 between successive discharges to be at least 1 second.

 But what is the maximum time between each pulse ? I can not see that it is
 stated in any standards. I guess the test labs use 1 pulse pr second.

 I feel that the pulse rate can have influences on the EUT performance, so
1
 second compared to 3-5 seconds might be the difference between PASS and
FAIL.

 Any suggestions ?

 Best regards
 Amund Westin
 Oslo, Norway

 --
 Get your firstname@lastname email for FREE at http://Nameplanet.com/?su

 ---
 This message is from the IEEE EMC Society Product Safety
 Technical Committee emc-pstc discussion list.

 Visit our web site at:  http://www.ewh.ieee.org/soc/emcs/pstc/

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 All emc-pstc postings are archived and searchable on the web at:
 http://www.rcic.com/  click on Virtual Conference Hall,



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ESD - time between successive discharges

2001-08-01 Thread amund

Dear members,

From IEC61000-4-2 and several EN-product standards, they specify the time 
between successive discharges to be at least 1 second.

But what is the maximum time between each pulse ? I can not see that it is 
stated in any standards. I guess the test labs use 1 pulse pr second.

I feel that the pulse rate can have influences on the EUT performance, so 1 
second compared to 3-5 seconds might be the difference between PASS and FAIL.

Any suggestions ?

Best regards
Amund Westin
Oslo, Norway

-- 
Get your firstname@lastname email for FREE at http://Nameplanet.com/?su

---
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