Re: Rietveld: U,V,W

Hi, Self Citation: NIST Standard Reference Materials for Characterization of Instrument Performance Industrial Applications of X-ray Diffraction Ed by F. H. Chung D. K. Smith, pp 903-917. A pdf is available; email to request. In this I outline how I use SRM 660 (it was 660 in 2000, then

Re: % Crystallinity

Hi all, Please prepare for a shameless plug for the newly certified NIST SRM 676a: In order to measure amorphous content (via non-PDF diffraction methods) one needs two things: 1) An unbiased diffraction method for measurement of phase abundance (laughter please) and 2) A standard of known phase

Opportunity at NIST

Hi all, We have a newly created position for an individual to work with us on the certification of NIST Standard Reference Materials for powder and thin film diffraction and reflectometry methods. The desired background is one with theoretical leanings and competence in programing and data

Re: Sources of standard reference materials

Hi all, We expect to have SRMs 640d 660b available by no later then November 2008. SRM 676a will available in a ~month. I regret the difficulty that is being caused by this lapse; we are taking measures to prevent them from recurring. Regards, Jim At 09:50 PM 11/15/2007, you wrote: Hi

Re: SRM676a

Hi All, David, SRM 676a will be available this fall. It is of similar microstructure to SRM 676 and is certified with respect to phase purity. It is, however, at 99%, of much higher purity than SRM 676. Regards, Jim At 02:48 PM 8/21/2007, you wrote: Hi All, I'm looking for a source

Re: RIET: NIST Si 640c cell axis as a function of temperature?

Hi, The temperature issue is one that I have been made to suffer on numerous occasions. My operation was moved to the new NIST Advanced Measurement Laboratory that, among other things, features temperature control, in May of 2004. The parallel beam diffractometer, from which future

Re: fundamental parameters approach X'celerator

Arie, Bob Cheary developed the required description/equations for the use of a psd. But I don't know that they have been implemented in any of the available FPA codes, except perhaps Topas in launch mode. Alan??? Are you listening? Regards, Jim At 06:48 AM 5/2/2005, you wrote: Dear

Re: fundamental parameters approach X'celerator

Indeed... A situation not without some complications. Jim At 08:00 AM 5/2/2005, you wrote: Alan??? Are you listening? Bruker providing help to analyze Panalytical data ?-). Armel James P. Cline [EMAIL PROTECTED] Ceramics Division Voice (301)

Re: fundamental parameters approach X'celerator

Laurel, At 09:13 AM 5/2/2005, you wrote: Hi, Alan Coelho helped us get our instrument parameter file set up for Topas Academic. We use an X'celerator detector with cobalt radiation (no monochromator) for most of our work. Here is an example file: xdd test.dat CoKa7_Holzer(0.001)

Re: fundamental parameters approach X'celerator

Arie, Yes; Bruker has an interest in this matter. Jim At 09:37 AM 5/2/2005, you wrote: Bruker's Vantex detector is rather similar to PanAnalytical's X'celerator detector from a fundamental parameters point of view, not? Maybe I should have formulated my question differently Is there anybody who

Re: request

Research Fellow, S.N.Bose.National Centre for Basic Sciences, Block-JD, Sector-3, Salt Lake, Kolkata, Pin: 700 098. Phone no: 033 23355705/6/7/8 Extn: 404, 104, 301. +++ -- Original Message --- From: Jim Cline [EMAIL PROTECTED

Re: Size Strain in GSAS

Hi, In response to some of this post: There was a move by a bunch of us in the ICDD to hold a profile fitting round robin ( which I think would by quite useful ). But it died when we realized the prodigious level of resources that would be required to make sense of the rather large matrix of data

RE: Size Strain [ In GSAS ??? ]

Hi all, Well, I thought I'd weigh in on this with a discussion of an aforementioned SRM project: We are in the final stages of preparing an SRM for determination of crystallite size from line profile analysis. Through the course of his PhD work and NIST postdoctoral position, Nick Armstrong

Re: Size Strain In GSAS

Hi, Nick Armstrong has advised me he will in non-email-land for a week or so. I'm sure he'll resume this discussion when he returns... Jim At 03:45 PM 3/28/2005 +0400, you wrote: Hi, So, to resume your statements, by using Bayesian/Max.Entr. we can distinguish between two distributions that can

Re: Size Strain In GSAS

Hi, I wrote an article [ that appeared in Dean Smith's book ] some time back that describes how to use SRM 660a, LaB6, and the TCH function of GSAS for characterization of the IPF, and then refine the only the microstructure specific terms for an estimation of the size and strain in subsequent

Re: request

Hi all, Its getting to the point that 75% of the posts on this list are requests for structures and articles??? Inappropriate. Jim At 11:33 AM 3/23/2005 +0530, you wrote: Dear all, Can anyone please send me the following article. snip James P. Cline [EMAIL PROTECTED]

RE: Enquiry of XRD standard materials (fwd)

Hi, At 02:09 PM 12/7/2004 +, you wrote: Dear Stephen, I have prepared XPD-standard Y2O3 by firing Y2O3 (99.999) from Aldrich at 1200 ºC for 72 hs. (as done in 41-1105 PDF card). I would also like to ask the other list members if anyone has calibrated the size-strain broadening of Y2O3

Re: back loading

Hi, At 08:38 AM 9/10/2004 +0200, you wrote: Hello Andreas, When I met Jim Cline at the Denver Conference he spoke about a fluid to drop into a (possibly backloaded) powder sample in order to make it solid. I will not put Jim's e-mail address on the Rietveld list but am quite sure he

Re: Quantitive analysis

Hi all, This is to say that I'm am nearly finished with the re-certification of SRM 676 for amorphous content. The revised certificate, offering a discussion as to the certification method, will be on the NIST website shortly, after the review process is completed. The certified phase purity

Re: Quantitive analysis

Process and Environmental Technology Building M12 National Research Council Canada 1200 Montreal Road Ottawa ON K1A 0R6 CANADA Tel: (613) 998 8462 Fax: (613) 991 2384 Email: mailto:[EMAIL PROTECTED] ICPET WWW: http://icpet-itpce.nrc-cnrc.gc.ca -Original Message- From: Jim Cline

Re: LaAlO3 structure

Joerg, At 07:07 AM 3/7/01 +, you wrote: snip We have done some investigations on the old line standard LaB6 SRM660, it contains some minor phases (sum 5%), one was LaAlO3. The new standard SRM660a is clean and has some other advantages, too. Now, we favour SRM660a over Y2O3. This is a

Re: SRMs 640c 660a

At 04:42 PM 9/29/00 +0200, you wrote: Jim wrote: The hydrostatic stress level is inversely proportional to the radius of curvature of the particles. Therefore, the Exactly, how did you determine the trend? Have you measured the cell parameters for different granulometries? This view of the

SRMs 640c 660a

Hi all, This is to indicate that NIST SRMs 640c, silicon powder, and 660a, lanthanum hexaboride powder, are available from the NIST SRM Program sales office. These SRMs are certified with respect to lattice parameter at the part-per-million level. Considerable effort has been expended to

Re: mirror vs. Ge monochromator.

Hi, At 08:46 AM 7/7/00 +0100, Joe Hriljac wrote: When we faced the same decision (well, only one machine, UK oil money does snip I agree with Joe: I have a D500 with a Ge monochromator and a PSD. I don't like the metal wire PSD as much as the quartz wire one as it imparts noise to the data

RE: Si lattice parameter

Hi, At 05:26 PM 4/17/00 +0200, you wrote: Dear All, I would like to add the following question concerning the standard Si powder. Is there someone who has information on the grain size of the 640b Si material ? snip The mean particle size of SRM 640b, via laser scattering, is 7.3 microns.

Re: Kalpha2

Hi, At 07:31 PM 4/1/00 +0200, you wrote: I'm looking forward for many discussions! Yep! I have some naive questions : I would like to hear exactly what is on my powder pattern: - Kalpha3 - tube tails or both ?? The paper by G. H"olzer et al. (Phys. Rev. A 56 (1997) pp.

Re: Kalpha2

Hi, Verification of tube tails with a single crystal experiment has been obtained: I called Keith Bowen of Bede on this thread as I thought he would be interested in this matter and I know he is knowledgeable on electron beam focusing. [See the Bede web site and look for Microsource.] He pointed

Re: Kalpha2

Hi, At 04:07 PM 3/28/00 +0100, you wrote: Hi all, On Tue, 28 Mar 2000 16:13:11 +0200, Armel Le Bail wrote: I have a related question about the so-called Kalpha3. Trying to take account of it, I only obtain some slight increase in the Rp and Rwp, though the fit seems to have improved, at first

Re: Kalpha2

Hello, At 09:20 PM 3/28/00 +0200, you wrote: On the point of view of theory, can the tube-tails and Kalpha3 satellite explanations be reconciled ? No tube-tails theory in the most recent X-ray powder Diffractometry book from Jenkins and Snyder, only Kalpha1, 2, 3, 4, 5, 6. Don't think so;

Re: Kalpha2

Hello II, At 09:20 PM 3/28/00 +0200, you wrote: On the point of view of theory, can the tube-tails and Kalpha3 satellite explanations be reconciled ? No tube-tails theory in the most recent X-ray powder Diffractometry book from Jenkins and Snyder, only Kalpha1, 2, 3, 4, 5, 6. I went back to the

Re: GSAS profile coefficients

Hi, At 12:27 PM 11/9/98 +1100, you wrote: At 05:24 PM 03-11-98 -0500, you wrote: At 08:26 PM 11/2/98 EST, you wrote: Hi, My questions pertain to refining the profile coefficients. What order do snip1 Thanks MIZ Dear MIZ, The question sounds