From: <[email protected]> > > If emission at (a) and (b) are same then DUT is not the cause, else DUT is > the cause. Can't we conclude this way. Finding a quite laptop or hub seem > to be almost impossible. > If that way of concluding would be OK than also testing DUT without laptop would be OK (without don't means not connected with laptop).
The idea behind testing together is that these devices will work together so the whole set should be EMC, but in my opinion that idea is only the source of a lot of problems. I believe if all devices were tested separately the number of observed problems during using them in sets will grow by zero, zero, nothing. Piotr Galka - This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. To post a message to the list, send your e-mail to <[email protected]> All emc-pstc postings are archived and searchable on the web at: http://www.ieeecommunities.org/emc-pstc Graphics (in well-used formats), large files, etc. can be posted to that URL. Website: http://www.ieee-pses.org/ Instructions: http://listserv.ieee.org/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas <[email protected]> Mike Cantwell <[email protected]> For policy questions, send mail to: Jim Bacher: <[email protected]> David Heald: <[email protected]>
