Julian,

In its last issue (March 2000) EOS Magazine has a good explanation on how
matrix metering is working. Even knowing how it works, you're not aware of
*which*  pattern is the algorithm choosing at a given moment. To know that,
you should use an external spot meter, take readings of several points
inside each segment of the matrix, average them and then compare with the
patters of applied exposure compensation.

Matrix works in many cases and I'm happy with it. For those moments when it
doesn't I preffer to switch to partial metering.

Now to go back to my question: is ETTL also linked with the chosen metering
mode?? (Matrix, Partial and Center Weighted)?

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