RE: Monitoring Random ESD events

2003-07-09 Thread Pommerenke, David
Brent, Please contact Trek, they have a very nice product that measures and logs ESD events. It measures voltage (on contact) but it has ports for external sensors. The product has been designed for Hewlett Packard a few years ago. David Pommerenke From: brent.dew...@us.datex-ohmeda.com

RE: ESD Problem

2003-05-27 Thread Pommerenke, David
My hand is up. David Pommerenke From: Luke Turnbull [mailto:luke.turnb...@trw.com] Sent: Tuesday, May 27, 2003 8:23 AM To: emc-p...@ieee.org Subject: ESD Problem Would the gentleman who is on the 61000-4-2 committee please put his hand up? Thanks, Luke Turnbull This message is from

RE: HV relay

2003-05-15 Thread Pommerenke, David
Pommerenke University Missouri Rolla -Original Message- From: drcuthb...@micron.com [mailto:drcuthb...@micron.com] Sent: Wed 5/14/2003 5:38 PM To: Pommerenke, David; drcuthb...@micron.com; emc-p...@majordomo.ieee.org Cc: Subject: RE: HV

RE: HV relay

2003-05-14 Thread Pommerenke, David
Dear Dave, You are working on a difficult issue. Every HV relay will breakdown before the contacts touch. The reason is as follows: When the contacts come closer the surface field strength Increases. The field strength will increase so much, such that the field emission current reaches

Monotonic and Non-monotonic EUT response in ESD testing

2003-05-13 Thread Pommerenke, David
Dear Group, There has been a discussion in EMC-PSTC on EUT response to different ESD test voltage levels. Let me explain whay I understand about this problem: An EUT may respond monotonic: More stress, never reduces the EUT response. or An EUT may show a non-monotonic response: It fails at

RE: ESD gun verification

2003-05-09 Thread Pommerenke, David
, but the pulse is only 100 ns wide. So the requirements for the linearity of the mixer is very high. David Pommerenke From: Chris Maxwell [mailto:chris.maxw...@nettest.com] Sent: Friday, May 09, 2003 7:28 AM To: Pommerenke, David; John Woodgate; emc-p...@majordomo.ieee.org Subject: RE: ESD gun

RE: ESD gun verification

2003-05-08 Thread Pommerenke, David
in !emc-pstc that Pommerenke, David davi...@umr.edu wrote (in a5d66e6b6f478b48a3cef22aa4b9fca378e...@umr-mail1.umr.edu) about 'ESD gun verification' on Wed, 7 May 2003: Brain, Spelling! I like to repeat: For verification you do not need calibrated equipment or full bandwidth. The verification

ESD test standard - present CDV - justification for changes

2003-05-08 Thread Pommerenke, David
, May 06, 2003 12:02 AM To: Pommerenke, David; emcpost Subject: Re: current-sensing transducer photos David: Thank you for the Committee Draft Version of the new ESD Standard. The committee is to be commended for producing such a thoroughly researched document that aims at improving test

RE: ESD gun verification

2003-05-07 Thread Pommerenke, David
Brain, I like to repeat: For verification you do not need calibrated equipment or full bandwidth. The verification is just a method to increase trust in the calibration. If you use some homemade current target and a 500 MHz scope, you will get a pretty good picture of the waveform and detect

RE: ESD gun verification

2003-05-01 Thread Pommerenke, David
Dear John, It depends on what you want. But at first we need to discuss one issue of definition of verificaiton, calibration or all kinds of similar words. I define a calibration as a traceble measurement and a verification as a measurement that helps to establish confidence that some

RE: equipment question

2003-02-11 Thread Pommerenke, David
Dear Chet, Modeling the frequency response is not a totally trivial task. In general, there are two different design strategies: 1) Gauss-roll off This scopes have an approximately Gauss-roll off with frequency. As a Consequence the ratio of F_sample to F_bandwidth has to be at

RE: ESD Contact discharge fitted connector

2003-01-22 Thread Pommerenke, David
Kris, In my reading of the standard, and the next modificaiton will include that clearly, you need to test discharges to the shell of the USB connector, as there will not be a connector in there all the time. There is another strong arguemnt: The user might plug a charged (e.g. hand-held)

RE: Changes to IEEE emc-pstc web-based services

2003-01-01 Thread Pommerenke, David
Dear Group, My experience is that with WEB-based systems there will be significantly less participation. Posting of large documents, as people will not carefully think about file size, compression down-sampling etc will make it worse for people on dial-up connections. Discussions will be based

RE: ESD Testing Method

2002-12-03 Thread Pommerenke, David
Dear Alex McNeil, The intend of the standard is that each discharge is an individual event. This means: Electromagnetic consequence === All charges need to be drained before the next discharge is applied. You may use an Ionizer, a conductive brush, a ground wire etc. to

RE: Circuit pack ESD drain

2002-11-01 Thread Pommerenke, David
Dave, If you can give me the dimensions we can numerically calculate or analytically estimate the waveform. David Pommerenke -Original Message- From: David Heald [mailto:dhe...@tellium.com] Sent: Thursday, October 31, 2002 4:58 PM To: 'emc-p...@majordomo.ieee.org' Subject: Circuit

AW: An ESD question

2002-06-12 Thread Pommerenke, David
Dear Group, In dry conditions, not only the charging processes are enhancec, but the severity (less risetime, higher peak current) is enhanced in general. For both reasons, it is not uncommen to see ESD problems move around the world with the local seasons. Still, I would always try to debug

RE: IEC 61000-4-2 ESD 61000-4-5 Surge lower levels

2002-06-11 Thread Pommerenke, David
Dear Group, The physics of air discharge (= the reason for the variatins, the effect of humidity, speed of approach) is quite well explained in D. Pommerenke, 'ESD: Transient Fields, Arc Simulation and Rise Time Limit' , Journal of Electrostatics 1995 36 (1995), pp. 31 - 54 David Pommerenke

RE: IEC 61000-4-2 ESD 61000-4-5 Surge lower levels

2002-06-11 Thread Pommerenke, David
share that data with me if it is in contact mode and if the number of discharges at each level is large enough to obtain an acceptable confidence level. Regards David Pommerenke [Pommerenke, David] -Original Message- From: Scott Douglas [mailto:dougl...@naradnetworks.com

RE: IEC 61000-4-2 ESD 61000-4-5 Surge lower levels

2002-06-10 Thread Pommerenke, David
Dear Group, For most EUTs there is no need to do lower level testing in contact mode ESD. The time is better spend (meaning a better test results uncertainty is achieved) if the number of discharges is increased at the highest test level (hundreds is a good number). Although it is possible

RE: Suitable CDN for IEC61000-4-6 ethernet 10/100

2002-04-19 Thread Pommerenke, David
What you should take into account is the failure criteria for 61000-4-6 as seen by the EU: No degradation beyond manufactueres specification. Depending on the EUT just a few additional bit-errors at any of the tested frequencies may be a fail. It may not be sufficient to just look at loss of

RE: ESD Generator confidence test - Pelligrini Target

2002-02-26 Thread Pommerenke, David
Just one comment on the Pelligrini Target: We compared different Pelligrini Targets that were all made to the specifications. - Up to 1 GHz they perform reasonably close - Above 1 GHz large differences show up, although they are all made to the drawings. - All of them show resonances in

RE: ESD Generator confidence test

2002-02-25 Thread Pommerenke, David
Dear Group, There is a big misunderstanding about verification, calibration, daily check etc. I am member of IEC TC77B WG-9 (ESD). We discussed what we want the user to do and the present opinion is as follows (A new draft of the ESD standard will reflect this position): (1) Formal

RE: Using PCB traces as transient voltage suppressor

2002-02-20 Thread Pommerenke, David
Gabi, The topic of an air-discharge spark gap is a little bit more complicated. 1) The breakdown voltage in air for a homogeneous field is given by the Paschen-equations, providing that the breakdown is a gas discharge process, not an explosive surface process (happens at high

RE: ESD Simulator Evaluation

2001-12-04 Thread Pommerenke, David
Richard, There are two reasons for this: Physical reason === 1) When you are approaching with an ESD simulator there is a distance at which a spark MAY occur. This distance can be calculated ONLY for a homogenious field quite well, using Paschen's equation. In a homogeneous field

RE: Pre-amps

2001-11-16 Thread Pommerenke, David
Ken, The added uncertainty is exactly as large as if you have a piece of cable (assume too short to have relevant losses) inbetween. David Pommerenke -Original Message- From: Ken Javor [mailto:ken.ja...@emccompliance.com] Sent: Friday, November 16, 2001 12:05 PM To: Pommerenke, David

RE: Pre-amps

2001-11-15 Thread Pommerenke, David
On the amps: For emissions there are the following electrical criteria: - Noise figure expect about 4 dB for a broadband amp 30 MHz - 2 GHz. The noise figure is often larger at the lower frequencies if the amplifier goes up to many GHz. - Input SWR. This is important. Most broadband amps

RE: EMC test table construction plans

2001-11-02 Thread Pommerenke, David
that Pommerenke, David davi...@ece.umr.edu wrote (in 9da8d24b915bd1118911006094516eaf0ba31...@umr-mail02.cc.umr.edu) about 'EMC test table construction plans', on Thu, 1 Nov 2001: For emissions and immunity you should not use any wood in the table. It will significantly (+/-2 dB up to 1 GHz for emissions

RE: EMC test table construction plans

2001-11-01 Thread Pommerenke, David
Doug, For emissions and immunity you should not use any wood in the table. It will significantly (+/-2 dB up to 1 GHz for emissions , more above, +/-10 dB for immunity up to 1 GHz) change the test result. My experience has shown that Styrofoam is basicly the best material. There are a couple of

ESD simulators

2001-10-08 Thread Pommerenke, David
I like to compile a list of all commercially available ESD simualtors for system level tests to 61000-4-2: In my list I have: KeyTek Minizap KeyTek KeyTek 2000 Schaffner 435 Schaffner 432 EM-TestESD-30c EM-TestESD unit to universal tester UCS 500

RE: ESD Immunity Testing

2001-09-29 Thread Pommerenke, David
John, Quite true. But on the other side: If a softerror occurs in the field, it is very hard to determine what caused it. Thus, we probably do not know how many ESD-softerrors occur on consumer products in the field. But often there is 'No trouble found' on customer returns. This does not

RE: ESD Immunity Testing

2001-09-28 Thread Pommerenke, David
Richard, Presently, the IEC 61000-4-2 standard is being revised. The main aim of the revision is: Improve the repeatability of test results ! This includes a discussion on the number of discharges. But increasing them is meeting lots or resistance: People simply do not want to increase

RE: ESD Testing

2001-08-19 Thread Pommerenke, David
Dear Richard, Hewlett Packard tests to more than 15 kV. But please be aware: The severeness of an ESD tests does not always increase with the test voltage. Depending on the physical failure mechanism (energy, current, derivative, fields, E-field, H-field, etc.) it will go down with voltage for

radiated immunity 2 GHz

2001-08-08 Thread Pommerenke, David
I upgraded a chamber at hp and looked at: 1) How to pass the 16 point call up to 3 GHz 2) How to upgrade /change add absorbers 3) Which commercial antenna works best from 26 Mhz - 3 GHz 4) How much power is needed. 5) How well does the signal repeat. 6) Field probes 7) etc. The lab is